IP Library Granted Patent US 11,562,951
Granted Patent B2
US 11,562,951 · App. 16/983,012 · Granted Jan 24, 2023

Organic interposer and method for manufacturing organic interposer

Inventors: Kazuyuki Mitsukura (Tokyo, JP); Masaya Toba (Tokyo, JP); Yoshinori Ejiri (Tokyo, JP); Kazuhiko Kurafuchi (Tokyo, JP)
Assignee: SHOWA DENKO MATERIALS CO., LTD.
H01L23/49822H01L21/4857H01L23/12H01L23/145H01L23/32H01L23/49866H01L23/49894H01L23/5383H01L23/5384H01L23/5386H01L23/5389H01L25/0652H01L2225/06506H01L2225/06548H01L2225/06572H05K1/09
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Quick Facts
Patent No.
US 11,562,951
App. No.
16/983,012
Granted
Jan 24, 2023
Kind
B2
Abstract

An organic interposer includes: a first organic insulating layer including a groove; a first metal wire located in the groove; a barrier metal material covering the first metal wire; and a second metal wire located above the first metal wire, wherein the barrier metal material includes: a first barrier metal film interposed between the first metal wire and an inner surface of the groove; and a second barrier metal film located on the first metal wire, and wherein the second metal wire is in contact with both of the first barrier metal film and the second barrier metal film.

Claims (46)

1. An organic interposer comprising:

a first organic insulating layer including a groove;

a first metal wire located in the groove;

a barrier metal material covering the first metal wire; and

a second metal wire located above the first metal wire,

wherein the barrier metal material includes:

a first barrier metal film interposed between the first metal wire and an inner surface of the groove; and

a second barrier metal film located on the first metal wire, and

wherein the second metal wire is directly in contact with both of the first barrier metal film and the second barrier metal film.

2. The organic interposer according to claim 1 , further comprising a second organic insulating layer laminated to the first organic insulating layer,

wherein the first metal wire is separated from both the first organic insulating layer and the second organic insulating layer by the barrier metal material.

3. The organic interposer according to claim 1 , wherein the first barrier metal film includes at least one of titanium, nickel, palladium, chromium, tantalum, tungsten, and gold.

4. The organic interposer according to claim 1 , wherein the second barrier metal film is a nickel film, and wherein nickel included in the nickel film is 80 mass % or more.

5. The organic interposer according to claim 1 , wherein the second barrier metal film is a palladium film.

6. The organic interposer according to claim 1 , wherein a thickness of the second barrier metal film is 0.001 μm or more and 1 μm or less.

7. The organic interposer according to claim 1 , wherein a surface roughness of a surface made by an upper surface of the first organic insulating layer and an upper surface of the second barrier metal film is 0.01 μm or more and 1 μm or less.

8. The organic interposer according to claim 1 , wherein a thickness of the first organic insulating layer is 1 μm or more and 10 μm or less.

9. The organic interposer according to claim 1 , wherein at least one of the first metal wire, the second metal wire, the first barrier metal film and the second barrier metal film has a multi-layer structure.

10. An organic interposer comprising:

an organic insulating laminate including a first organic insulating layer with a first groove and a second organic insulating layer with a second groove;

a first metal wire located in the first groove;

a barrier metal material covering the first metal wire; and

a second metal wire located above the first metal wire and in the second groove,

wherein the barrier metal material includes:

a first barrier metal film interposed between the first metal wire and an inner surface of the first groove; and

a second barrier metal film located on the first metal wire and in the second groove,

wherein the second metal wire is directly in contact with both of the first barrier metal film and the second barrier metal film,

wherein the first metal wire is separated from both the first organic insulating layer and the second organic insulating layer by the barrier metal material, and

wherein a whole of the second metal wire is located above an upper surface of the first metal wire.

11. The organic interposer according to claim 10 , wherein the first barrier metal film includes at least one of titanium, nickel, palladium, chromium, tantalum, tungsten, and gold.

12. The organic interposer according to claim 10 , wherein the second barrier metal film is a nickel film, and wherein nickel included in the nickel film is 80 mass % or more.

13. The organic interposer according to claim 10 , wherein the second barrier metal film is a palladium film.

14. The organic interposer according to claim 10 , wherein a thickness of the second barrier metal film is 0.001 μm or more and 1 μm or less.

15. The organic interposer according to claim 10 , wherein a surface roughness of a surface made by an upper surface of the first organic insulating layer and an upper surface of the second barrier metal film is 0.01 μm or more and 1 μm or less.

16. The organic interposer according to claim 10 , wherein a thickness of the first organic insulating layer is 1 μm or more and 10 μm or less.

17. The organic interposer according to claim 10 , wherein at least one of the first metal wire, the second metal wire, the first barrier metal film and the second barrier metal film has a multi-layer structure.

18. A method for manufacturing an organic interposer, the method comprising:

forming a groove in a first organic insulating layer;

forming a first barrier metal film on the first organic insulating layer, wherein forming the first barrier metal film on the first organic insulating layer comprises covering an inner surface of the groove and an upper surface of the first organic insulating layer;

forming a wiring layer on the first barrier metal film in such a way as to embed the groove;

thinning the wiring layer in such a way as to remain a part of the first barrier metal film on the inner surface of the groove and a part of the wiring layer embedded in the groove;

forming a second barrier metal film in such a way as to cover the part of the wiring layer in the groove;

forming a second organic insulating layer on the first organic insulating layer and on the second barrier metal film; and

forming a metal wire in an opening of the second organic insulating layer, the metal wire being directly in contact with both of the first barrier metal film and the second barrier metal film.

19. The method according to claim 18 , wherein thinning the wiring layer comprises removing an another part of the first barrier metal film located on the upper surface of the first organic insulating layer to expose the upper surface of the first organic insulating layer.

20. The method according to claim 18 , wherein thinning the wiring layer comprises removing an another part of the first barrier metal film located on the upper surface of the first organic insulating layer and a part of the first organic insulating layer.

Assignments (5)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CHANGE OF NAME Recorded Mar 3, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 062946/0125 →
CHANGE OF NAME Recorded Mar 2, 2023
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062917/0865 →
CHANGE OF NAME Recorded Sep 20, 2022
From: HITACHI CHEMICAL COMPANY, LTD.
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 062862/0373 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2022
From: MITSUKURA, KAZUYUKI; TOBA, MASAYA; EJIRI, YOSHINORI; KURAFUCHI, KAZUHIKO
To: HITACHI CHEMICAL COMPANY, LTD.
Reel/Frame 061123/0617 →