Enhanced sensor cleaning validation

1. A device, the device comprising processing circuitry coupled to storage, the processing circuitry configured to:

determine a baseline performance measurement associated with a clean performance baseline of a sensor;

actuate a cleaning mechanism to remove at least a portion of an obstruction deposited on the sensor;

determine a first post-clean performance measurement associated with the sensor; and

determine a degradation measurement between the baseline performance measurement and the first post-clean performance measurement, wherein the degradation measurement indicates an effectiveness of the cleaning mechanism,

wherein the degradation measurement is a ratio between the baseline performance measurement and the first post-clean performance measurement, and wherein the ratio is determined by dividing the first post-clean performance measurement by the baseline performance measurement.

2. The device of claim 1 , wherein the clean performance baseline of the sensor is a state of the sensor without the obstruction.

3. The device of claim 1 , wherein the obstruction is at least one of mud, rain, bugs, or debris.

4. The device of claim 1 , wherein actuating the cleaning mechanism causes an application of fluid on the sensor, and causes an airflow configured to remove droplets of the fluid containing at least part of the obstruction from the sensor.

5. The device of claim 1 , wherein the obstruction is rain droplets, and wherein actuating the cleaning mechanism causes an application of an airflow that removes rain droplets at an airflow rate that exceeds a rain rate.

6. The device of claim 1 , wherein the degradation measurement is a first degradation measurement, and wherein the processing circuitry is further configured to:

determine a second post-clean performance measurement after a second obstruction is deposited on the sensor;

determine a second degradation measurement based on the baseline performance measurement and the second post-clean performance measurement; and

determine a mean value or a standard deviation based on the first degradation measurement and the second degradation measurement.

7. The device of claim 1 , wherein the processing circuitry is further configured to:

determine a mean value or a standard deviation of one or more ratio values determined between one or more baseline performance measurements and one or more post-clean performance measurements is below a validation threshold; and

determine that the cleaning mechanism is in a failed state.

8. The device of claim 1 , wherein the processing circuitry is further configured to:

determine a mean value or a standard deviation of one or more ratio values determined between one or more baseline performance measurements and one or more post-clean performance measurements is above a validation threshold; and

determine that the cleaning mechanism is in a pass state.

9. The device of claim 1 , wherein the processing circuitry is further configured to:

implement, based on the degradation measurement, a compensation mechanism when evaluating collected sensor data.

10. The device of claim 1 , wherein the baseline performance measurement and the first post-clean performance measurement comprise a measurement of an intensity of light reflected by an object and/or a measurement of attenuation of a signal strength.

11. A method comprising:

determining, by one or more processors, a baseline performance measurement associated with a clean performance baseline of a sensor;

actuating a cleaning mechanism to remove at least a portion of an obstruction deposited on the sensor;

determining a first post-clean performance measurement associated with the sensor; and

determining a degradation measurement between the baseline performance measurement and the first post-clean performance measurement, wherein the degradation measurement indicates an effectiveness of the cleaning mechanism,

wherein the degradation measurement is a ratio between the baseline performance measurement and the first post-clean performance measurement, and wherein the ratio is determined by dividing the first post-clean performance measurement by the baseline performance measurement.

12. The method of claim 11 , wherein the clean performance baseline of the sensor is a state of the sensor without the obstruction.

13. The method of claim 11 , wherein the obstruction is at least one of mud, rain, bugs, or debris.

14. The method of claim 11 , wherein actuating the cleaning mechanism causes an application of fluid on the sensor, and causes an airflow configured to remove droplets of the fluid containing at least part of the obstruction from the sensor.

15. The method of claim 11 , wherein the obstruction is rain droplets, and wherein actuating the cleaning mechanism causes an application of an airflow that removes rain droplets at an airflow rate that exceeds a rain rate.

16. The method of claim 11 , wherein the degradation measurement is a first degradation measurement, and further comprises:

determining a second post-clean performance measurement after a second obstruction is deposited on the sensor;

determining a second degradation measurement based on the baseline performance measurement and the second post-clean performance measurement; and

determining a mean value or a standard deviation based on the first degradation measurement and the second degradation measurement.

17. The method of claim 11 , further comprising:

determining a mean value or a standard deviation of one or more ratio values determined between one or more baseline performance measurements and one or more post-clean performance measurements is below a validation threshold; and

determining that the cleaning mechanism is in a failed state.

18. The method of claim 11 , further comprising:

determining a mean value or a standard deviation of one or more ratio values determined between one or more baseline performance measurements and one or more post-clean performance measurements is above a validation threshold; and

determining that the cleaning mechanism is in a pass state.

19. A non-transitory computer-readable medium storing computer-executable instructions which when executed by one or more processors result in performing operations comprising:

determining a baseline performance measurement associated with a clean performance baseline of a sensor;

actuating a cleaning mechanism to remove at least a portion of an obstruction deposited on the sensor;

determining a first post-clean performance measurement associated with the sensor; and

determining a degradation measurement between the baseline performance measurement and the first post-clean performance measurement, wherein the degradation measurement indicates an effectiveness of the cleaning mechanism,

wherein the degradation measurement is a ratio between the baseline performance measurement and the first post-clean performance measurement, and wherein the ratio is determined by dividing the first post-clean performance measurement by the baseline performance measurement.

20. The non-transitory computer-readable medium of claim 19 , wherein the clean performance baseline of the sensor is a state of the sensor without the obstruction.