Selectable wear life indicator based on data retention

1. A system comprising:

a memory device;

a processing device coupled to the memory device to:

select a data retention profile, including a predetermined length of time at a predetermined temperature at a future end of life of the memory device that data is retained at the memory device in an absence of a power supply for the memory device, from among a plurality of data retention profiles, including a plurality of lengths of time and a plurality of temperatures that are predetermined, corresponding to the memory device;

responsive to selecting the data retention profile, program a hardware component of the memory device to reduce performance of the memory device; and

adjust a wear life indicator based on the selected data retention profile.

2. The system of claim 1 , wherein the wear life indicator comprises a wear life gauge indicating a percentage of remaining useful life of the memory device based on the selected data retention profile.

3. The system of claim 1 , wherein the plurality of data retention profiles are associated with respective combinations of time and temperature values.

4. The system of claim 3 , wherein at least two of the plurality of data retention profiles are associated with a same temperature value.

5. The system of claim 1 , wherein the plurality of data retention profiles are predetermined based on a characterization of the system.

6. The system of claim 5 , wherein the system comprises a wear life component comprising instructions executable by the processing device to adjust the wear life indicator based on the selected data retention profile.

7. The system of claim 6 , wherein the wear life component comprises a data structure matching the predetermined data retention profiles to different respective program/erase cycle counts.

8. The system of claim 1 , wherein the processing device is configured to select the data retention profile responsive to a command received from the host.

9. The system of claim 8 , wherein the command is a vendor unique command provided using one of:

a serial advanced technology attachment (SATA) protocol;

a non-volatile memory express (NVMe) protocol;

a compute express link (CXL) protocol; or

a universal flash storage (UFS) protocol.

10. A method comprising:

receiving, at a memory sub-system, a selection of a data retention profile, including a predetermined length of time at a predetermined temperature at a future end of life of a memory device that data is retained at the memory device of the memory sub-system in an absence of a power supply of the memory device, from among a plurality of data retention profiles including a plurality of lengths of time and a plurality of temperatures that are predetermined;

responsive to receiving the selected data retention profile, programming a hardware component of the memory device to reduce performance of the memory device;

determining a wear life indicator corresponding to the selected data retention profile; and

providing, to a host, information corresponding to the wear life indicator.

11. The method of claim 10 , further comprising:

receiving a selection of a different data retention profile from among the plurality of data retention profiles;

adjusting the wear life indicator based on the different data retention profile; and

providing the adjusted wear life indicator to the host.

12. The method of claim 11 , wherein the adjusted wear life indicator provides a longer life of the memory sub-system than the wear life indicator.

13. The method of claim 10 , further comprising:

providing the wear life indicator to the host responsive to a request from the host; and

displaying the wear life indicator.

14. The method of claim 10 , further comprising receiving the selection of the data retention profile from among the plurality of data retention profiles wherein a quantity of the plurality of data retention profiles is fixed.

15. The method of claim 10 , further comprising determining that the wear life indicator is lower than a threshold.

16. The method of claim 15 , further comprising, responsive to determining that the wear life indicator is lower than the threshold, adjusting a wear life indicator based on a different data retention profile, wherein the adjusted wear life indicator is greater than the threshold.

17. A non-transitory computer readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to:

receive a selection of a particular data retention profile, including a predetermined length of time at a predetermined temperature at a future end of life of a device of a memory sub-system, that data is retained at the memory sub-system in an absence of a power supply of the memory sub-system, from among a plurality of selectable data retention profiles, including a plurality of lengths of time and a plurality of temperatures that are predetermined, stored on the memory sub-system;

responsive to selecting the particular data retention profile, program a hardware component of the memory sub-system to reduce performance of the memory sub-system;

determine a remaining life of the memory sub-system based on the selected data retention profile; and

provide an indication of the remaining life of the memory sub-system to a host;

wherein the particular data retention profile is selected based on a usage of the memory sub-system, and wherein the particular data retention profile is different than a rated data retention profile corresponding to the memory sub-system.

18. The non-transitory computer readable storage medium of claim 17 , wherein the selection of the particular data retention profile is received via a command from the host.

19. The non-transitory computer readable storage medium of claim 17 , wherein the rated data retention profile is a default data retention profile.

20. The non-transitory computer readable storage medium of claim 17 , wherein the memory sub-system comprises a solid state drive (SSD).