Apparatus for the automated assembly of a probe head
An apparatus for the automated assembly of a probe head for testing electronic devices integrated on a semiconductor wafer, includes a support adapted to support at least two parallel guides, which are provided with a plurality of respective guides holes, and at least one holding means adapted to hold a contact probe to be housed in the guides holes, of the guides. Suitably, the support is a movable support adapted to be moved according to a preset trajectory between a first position, wherein the contact probe is held by the holding means at a predetermined position outside the guides holes, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guides holes that are substantially concentric to each other.
1. An apparatus for an automated assembly of a probe head for testing electronic devices, the apparatus comprising:
a support configured to support at least two parallel guides, which are provided with a plurality of respective guide holes;
at least one holding means configured to hold a contact probe to be housed in the guide holes, wherein the support is a movable support configured to be moved according to a preset trajectory between a first position, wherein the contact probe is held at a predetermined position outside the guide holes by the holding means, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guide holes that are substantially concentric to each other;
actuators of the support; and
a central unit connected to the actuators, the preset trajectory being calculated in the central unit according to a profile of the contact probe, the central unit being adapted to transform the profile into control instructions which are sent to the actuators of the support.
2. The apparatus according to claim 1 , further comprising a first vision system connected to the central unit, the first vision system configured to capture images of the contact probe held by the at least one holding means at the predetermined position, the profile of the contact probe being calculated from the images acquired by the first vision system.
3. The apparatus according to claim 2 , wherein the first vision system comprises at least one pair of high-resolution cameras being provided at the support, the cameras forming a stereoscopic vision system for a formation of images of the contact probe.
4. The apparatus according to claim 1 , wherein the support is a hexapod having six degrees of freedom of movement adjusted by the actuators.
5. The apparatus according to claim 1 , wherein the at least one holding means of the contact probe is a terminal element of a mechanical arm that is configured to move between the support and a storage element, the storage element being configured to contain a plurality of contact probes.
6. The apparatus according to claim 5 , wherein the mechanical arm comprises a first end portion including a first holding means, and a second end portion including a second holding means, wherein one of the first or second holding means is configured to hold a contact probe at the predetermined position and the other holding means is configured to simultaneously pick-up a contact probe from the storage element.
7. The apparatus according to claim 5 , further comprising a second vision system which captures images of the contact probes housed in the storage element, the central unit being configured to perform a first evaluation of the profile of the contact probes in the storage element based on the images captured by the second vision system, so as to perform a preliminary discard of the contact probes.
8. The apparatus according to claim 1 , wherein the at least one holding means comprises at least one pair of end-effectors extending from a body of the at least one holding means, as well as at least one first force sensor which is integrated in the body and is configured to measure a holding intensity of the contact probe exerted by the at least one pair of end-effectors, the apparatus further comprising a feedback system configured to adjust the holding intensity of the contact probe exerted by the at least one pair of end-effectors.
9. The apparatus according to claim 1 , wherein the at least one holding means comprises at least one second force sensor configured to measure a force exerted by the contact probe onto the at least two parallel guides during the movement of the support.
10. The apparatus according to claim 1 , further comprising at least one further vision system configured to assess which guide hole of the plurality of respective guide holes the contact probe emerges from.
11. An apparatus for an automated assembly of a probe head for testing electronic devices, the apparatus comprising:
a support configured to support at least two parallel guides, which are provided with a plurality of respective guide holes;
at least one holding means configured to hold a contact probe to be housed in the guide holes, wherein the support is a movable support configured to be moved according to a preset trajectory between a first position, wherein the contact probe is held at a predetermined position outside the guide holes by the holding means, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guide holes that are substantially concentric to each other;
actuators of the support; and
a central unit connected to the actuators, the preset trajectory being calculated in the central unit according to a profile of the contact probe, the central unit being adapted to transform the profile into control instructions which are sent to the actuators of the support;
wherein the at least one holding means comprises at least one pair of end-effectors extending from a body of the at least one holding means, as well as at least one first force sensor which is integrated in the body and is configured to measure a holding intensity of the contact probe exerted by the at least one pair of end-effectors, the apparatus further comprising a feedback system configured to adjust the holding intensity of the contact probe exerted by the at least one pair of end-effectors.
12. The apparatus according to claim 11 , further comprising a first vision system connected to the central unit, the first vision system configured to capture images of the contact probe held by the at least one holding means at the predetermined position, the profile of the contact probe being calculated from the images acquired by the first vision system.
13. The apparatus according to claim 12 , wherein the first vision system comprises at least one pair of high-resolution cameras being provided at the support, the cameras forming a stereoscopic vision system for a formation of images of the contact probe.