IP Library Granted Patent US 11,289,471
Granted Patent B2
US 11,289,471 · App. 17/001,009 · Granted Mar 29, 2022

Electrostatic discharge device

Inventors: You Li (South Burlington, VT); Alain F. Loiseau (Williston, VT); Souvick Mitra (Essex Junction, VT); Tsung-Che Tsai (New York, NY); Robert J. Gauthier, Jr. (Williston, VT); Meng Miao (Williston, VT)
Assignee: GLOBALFOUNDRIES U.S. INC.
H01L27/0259H01L27/0248H01L27/0251H01L27/0623H01L27/0886H01L27/0924H01L29/0684H01L29/73H01L29/785
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,289,471
App. No.
17/001,009
Granted
Mar 29, 2022
Kind
B2
Abstract

The present disclosure relates to semiconductor structures and, more particularly, to an electrostatic discharge (ESD) device and methods of manufacture. The structure (ESD device) includes: a trigger collector region having fin structures of a first dopant type, a collector region having fin structures in a well of a second dopant type and further including a lateral ballasting resistance; an emitter region having a well of the second dopant type and fin structures of the first dopant type; and a base region having a well and fin structures of the second dopant type.

Claims (30)

1. A structure comprising:

a trigger collector region comprising fin structures of a first dopant type;

a collector region comprising fin structures in a well of the first dopant type;

a lateral ballasting resistance at the trigger collector region which comprises the collector region and the well of the first dopant type;

an emitter region comprising a well of a second dopant type and fin structures of the first dopant type; and

a base region comprising a well and fin structures of the second dopant type.

2. The structure of claim 1 , wherein the lateral ballasting resistance is provided in a directly adjacent and contacting the collector region and comprises the well of the first dopant type.

3. The structure of claim 2 , wherein the well of the first dopant type of the lateral ballasting resistance comprises a N-well and remaining portions of the trigger collector region comprise a P-well.

4. The structure of claim 3 , wherein the fins of the first dopant type over the N-well comprise collector fin structures.

5. The structure of claim 4 , wherein the fin structures of the first dopant type comprise n+ dopant.

6. The structure of claim 5 , wherein the emitter region and the base region are provided in P-well regions, the fin structures in the emitter region are n+ doped fins and the fin structures in the base region are p+ doped fins.

7. The structure of claim 1 , further comprising shallow trench isolation regions which separate the emitter region from the collector region and the emitter region from the base region.

8. The structure of claim 1 , wherein the first dopant type is p+ dopant and the second dopant type is n+ dopant type.

9. The structure of claim 1 , further comprising shallow trench isolation regions which separate the emitter region from the collector region and the emitter region from the base region.

10. A structure comprising a fin based bipolar electrostatic discharge (ESD) device comprising a trigger collector region having a first well of a first dopant type, and a collector region having a second well of a second dopant type, and with fins of the second dopant type over the first well and the second well.

11. The structure of claim 10 , wherein the first dopant type is a p-dopant type and the second dopant type is an n-dopant type.

12. The structure of claim 11 , wherein the first well of the p-dopant type and the second well of the n-dopant type are directly contacting.

13. The structure of claim 11 , further comprising shallow trench isolation structures separating a base region from an emitter region and the collector region from the emitter region.

14. The structure of claim 10 , wherein the first dopant type is a n-dopant type and the second dopant type is p-dopant type.

15. The structure of claim 10 , wherein the second well of the second dopant type and the fins of the second dopant type are a ballast resistance region.

16. The structure of claim 15 , wherein ballast resistance region is a lateral ballast resistance region.

17. A structure comprising:

a trigger collector region comprising a P-well with n-type fin structures over the P-well;

a collector region directly adjacent to the trigger collector region, the collector region comprising a N-well with n-type fin structures over the N-well;

an emitter region comprising the P-well with n-type fin structures over the P-well;

a base region comprising the P-well with n-type fin structures over the P-well; and

shallow trench isolation regions separating the collector region from the emitter region and the base region from the emitter region.

18. The structure of claim 17 , wherein the N-well with the n-type fin structures of the collector region are a lateral ballasting resistance region.

19. The structure of claim 17 , wherein the P-well of the trigger collector region and the N-well of the collector region are in direct contact.

20. The structure of claim 17 , wherein the collector region is between the trigger collector region and the emitter region.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2020
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 054633/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2020
From: LI, YOU; LOISEAU, ALAIN F.; MITRA, SOUVICK; TSAI, TSUNG-CHE; GAUTHIER, ROBERT J., JR.; MIAO, MENG
To: GLOBALFOUNDRIES INC.
Reel/Frame 053577/0579 →
Continuity (1)
Related Publication 20220059523A1 · Feb 24, 2022