IP Library › Granted Patent US 11,378,598
Granted Patent B2
US 11,378,598 · App. 17/002,097 · Granted Jul 5, 2022

Semiconductor integrated circuit device and current detection circuit

Inventors: Tomohiro Ando (Kanagawa, JP); Kazuhiro Taguchi (Kanagawa, JP)
Assignees: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
G01R19/10H03F3/45475
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Quick Facts
Patent No.
US 11,378,598
App. No.
17/002,097
Granted
Jul 5, 2022
Kind
B2
Abstract

According to an embodiment, a semiconductor integrated circuit device has a first switching element that is connected between first and second nodes, a second switching element that is connected between the first node and a third node and outputs a current that is 1/K times as much as an output current of the first switching element, and an amplifier that controls, by a signal provided by amplifying a voltage difference between the third node and a fourth node, a conduction state of a third switching element that is connected between the fourth node and a fifth node.

Claims (44)

1. A semiconductor integrated circuit device, comprising:

a first switching element that is provided with a main current path that is connected between a first node and a second node, and outputs a first output current;

a second switching element that is provided with a main current path that is connected between the first node and a third node, and outputs a second output current that is one K-th times as much as the first output current (where K is any positive number that is greater than 1);

a third switching element that is provided with a main current path that is connected between a fourth node and a fifth node; and

a differential amplifier that outputs a signal provided by amplifying a voltage difference that is generated between the third node and the fourth node to control a conduction state of the third switching element.

2. The semiconductor integrated circuit device according to claim 1 , wherein the differential amplifier and the third switching element compose a negative feedback circuit that is operated in such a manner that voltages at the third node and the fourth node are equalized.

3. The semiconductor integrated circuit device according to claim 1 , comprising

a control circuit that controls on/off of the first and second switching elements in response to a voltage at the fifth node.

4. The semiconductor integrated circuit device according to claim 1 , wherein the first and second switching elements are composed of PMOS transistors.

5. The semiconductor integrated circuit device according to claim 1 , wherein the first and second switching elements are composed of NMOS transistors.

6. The semiconductor integrated circuit device according to claim 1 , wherein the first and second switching elements are composed of GaN transistors.

7. A current detection circuit, comprising:

a first switching element that is provided with a main current path that is connected between a first node and a second node, and outputs a first output current;

a second switching element that is provided with a main current path that is connected between the first node and a third node, and outputs a second output current that is one K-th times as much as the first output current (where K is any positive number that is greater than 1);

a third switching element that is provided with a main current path that is connected between a fourth node and a fifth node;

a differential amplifier that outputs a signal provided by amplifying a voltage difference that is generated between the third node and the fourth node to control a conduction state of the third switching element;

a first resistor that is provided with one end that is connected to the second and third nodes and another end where a first voltage is applied thereto; and

a second resistor that is provided with one end that is connected to the fourth node and another end where the first voltage is applied thereto,

wherein the second resistor is set at a resistance value that is K times as much as that of the first resistor.

8. The current detection circuit according to claim 7 , wherein the differential amplifier and the third switching element compose a negative feedback circuit that is operated in such a manner that voltages at the third node and the fourth node are equalized.

9. The current detection circuit according to claim 7 , comprising:

a fifth resistor that is provided with one end that is connected to the fifth node and another end where a second voltage is applied thereto; and

a control circuit that controls on/off of the first and second switching elements in response to a voltage at the fifth node.

10. The current detection circuit according to claim 7 , wherein the first and second switching elements are composed of PMOS transistors.

11. The current detection circuit according to claim 7 , wherein the first and second switching elements are composed of NMOS transistors.

12. The current detection circuit according to claim 7 , wherein the first node is connected to a load.

13. A current detection circuit, comprising:

a first switching element that is provided with a main current path that is connected between a first node and a second node, and outputs a first output current;

a second switching element that is provided with a main current path that is connected between the first node and a third node, and outputs a second output current that is one K-th times as much as the first output current (where K is any positive number that is greater than 1);

a third switching element that is provided with a main current path that is connected between a fourth node and a fifth node;

a differential amplifier that outputs a signal provided by amplifying a voltage difference that is generated between the third node and the fourth node to control a conduction state of the third switching element;

a connection means that connects the second node to a first power source terminal;

a third resistor that is provided with one end that is connected to the third node and another end where a voltage at the first power source terminal is applied thereto; and

a fourth resistor that is provided with one end that is connected to the fourth node and another end where a voltage at the first power source terminal is applied thereto,

wherein the third resistor and the fourth resistor are set at identical resistance values thereof.

14. The current detection circuit according to claim 13 , wherein the differential amplifier and the third switching element compose a negative feedback circuit that is operated in such a manner that voltages at the third node and the fourth node are equalized.

15. The current detection circuit according to claim 13 , wherein the third resistor and the fourth resistor are set at resistance values that are K times as much as that of the connection means.

16. The current detection circuit according to claim 13 , comprising:

a fifth resistor that is provided with one end that is connected to the fifth node and another end where a second voltage is applied thereto; and

a control circuit that controls on/off of the first and second switching elements in response to a voltage at the fifth node.

17. The current detection circuit according to claim 13 , wherein the first and second switching elements are composed of PMOS transistors.

18. The current detection circuit according to claim 13 , wherein the first and second switching elements are composed of NMOS transistors.

19. The current detection circuit according to claim 13 , wherein the connection means is composed of a printed wiring.

20. The current detection circuit according to claim 13 , wherein the first node is connected to a load.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2020
From: ANDO, TOMOHIRO; TAGUCHI, KAZUHIRO
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 054007/0497 →
Priority Claims (1)
JP JP2020-037780 · Mar 5, 2020 · national
Continuity (1)
Related Publication 20210278445A1 · Sep 9, 2021
Cited By (1)
US 12,416,937