Conductive atomic force microscopy system with enhanced sensitivity and methods of using such a system

1. A method, comprising:

measuring at least one electrical-related parameter of a doped semiconductor material by simultaneously:

irradiating at least a portion of an upper surface of the doped semiconductor material with radiation, thereby defining an irradiated portion of the doped semiconductor material;

urging a conductive tip of a cantilever beam probe into conductive contact with the upper surface of the irradiated portion of the doped semiconductor material; and

generating an electrical current that flows through the doped semiconductor material, through a measurement device that is operatively coupled to the cantilever beam probe and through the cantilever beam probe, wherein the measurement device measures the at least one electrical-related parameter of the doped semiconductor material, wherein the doped semiconductor material has a dopant concentration of at most approximately 1E 15 ions/cm 3 .

2. The method of claim 1 , wherein measuring the at least one electrical-related parameter of the doped semiconductor material comprises measuring one of a current flowing through the doped semiconductor material or a resistivity of the doped semiconductor material.

3. The method of claim 1 , wherein irradiating the at least a portion of an upper surface of the doped semiconductor material with radiation comprises irradiating at least a portion of an upper surface of the doped semiconductor material with radiation with an energy level per photon that falls, inclusively, within a range of 124 eV-124 keV.

4. The method of claim 1 , wherein irradiating the at least a portion of an upper surface of the doped semiconductor material comprises actuating a radiation source that is operatively coupled to at least one controller and wherein generating the electrical current comprises actuating a voltage supply source so as to generate a voltage across the doped semiconductor material, wherein the voltage supply source is operatively coupled to an electrode that is conductively coupled to the doped semiconductor material.

5. The method of claim 1 , wherein irradiating the at least a portion of an upper surface of the doped semiconductor material causes an increase in free charge carriers in the irradiated portion of the doped semiconductor material.

6. The method of claim 1 , further comprising providing relative movement between the doped semiconductor material and the conductive tip while measuring the at least one electrical-related parameter of the doped semiconductor material, wherein the doped semiconductor material has a general cylindrical configuration.

7. The method of claim 1 , wherein, prior to measuring the at least one electrical-related parameter of the doped semiconductor material, the method further comprises:

positioning the doped semiconductor material in a housing; and

generating a vacuum ambient within the housing, wherein measuring the at least one electrical-related parameter of the doped semiconductor material is performed while the doped semiconductor material is in the vacuum ambient.

8. The method of claim 7 , wherein generating the vacuum ambient within the housing comprises generating a vacuum ambient within the housing within a range of about 10 −3 -10 −9 Torr.

9. A method, comprising:

positioning a doped semiconductor material in a housing;

generating a vacuum ambient within the housing,

measuring at least one electrical-related parameter of at least one layer of material positioned above the doped semiconductor material by simultaneously:

irradiating at least a portion of an upper surface of the at least one layer of material with radiation, thereby defining an irradiated portion of the at least one layer of material;

urging a conductive tip of a cantilever beam probe into contact with the upper surface of the irradiated portion of at least one layer of material; and

generating an electrical current that flows through the at least one layer of material, through the doped semiconductor material, through a measurement device that is operatively coupled to the cantilever beam probe and through the cantilever beam probe, wherein the measurement device measures the at least one electrical-related parameter of the at least one layer of material, wherein measuring the at least one electrical-related parameter of the at least one layer of material is performed while the doped semiconductor material is in the vacuum ambient.

10. The method of claim 9 , wherein measuring the at least one electrical-related parameter of the at least one layer of material comprises measuring one of a current flowing through the at least one layer of material or a resistivity of the at least one layer of material.

11. The method of claim 9 wherein the at least one layer of material comprises a plurality of layers of material.

12. The method of claim 9 , wherein the at least one layer of material comprises one of a conductive material, an insulating material, silicon dioxide, a high-k gate insulation layer or a polymer.

13. The method of claim 9 , wherein irradiating at least a portion of an upper surface of the at least one layer of material with radiation comprises irradiating at least a portion of an upper surface of the at least one layer of material with radiation with an energy level per photon that falls, inclusively, within a range of 124 eV-124 keV.

14. The method of claim 9 , wherein generating the electrical current comprises actuating a voltage supply source so as to generate a voltage across the doped semiconductor material and the at least one layer of material, wherein the voltage supply source is operatively coupled to an electrode that is conductively coupled to the doped semiconductor material.

15. The method of claim 9 , further comprising providing relative movement between the doped semiconductor material and the conductive tip while measuring the at least one electrical-related parameter of the at least one layer of material.

16. The method of claim 9 , wherein generating a vacuum ambient within the housing comprises generating a vacuum ambient within the housing within a range of about 10 −3 -10 −9 Torr.

17. The method of claim 9 , wherein irradiating the at least a portion of an upper surface of the at least one layer of material causes an increase in free charge carriers in the irradiated portion of the at least one layer of material.

18. A method, comprising:

measuring at least one electrical-related parameter of a device structure comprising a doped semiconductor material by simultaneously:

irradiating at least a portion of the device structure with radiation, thereby defining an irradiated portion of the device structure;

urging a conductive tip of a cantilever beam probe into a position whereby the conductive tip is conductively coupled to the irradiated portion of the device structure; and

generating an electrical current that flows through the device structure, through a measurement device that is operatively coupled to the cantilever beam probe and through the cantilever beam probe, wherein the measurement device measures the at least one electrical-related parameter of the device structure, wherein the doped semiconductor material has a dopant concentration of at most approximately 1E 15 ions/cm 3 .

19. The method of claim 18 , further comprising providing relative movement between the doped semiconductor material and the conductive tip while measuring the at least one electrical-related parameter of the doped semiconductor material, wherein the doped semiconductor material has a general cylindrical configuration.

20. The method of claim 18 , further comprising:

positioning the doped semiconductor material in a housing; and

generating a vacuum ambient within the housing, wherein measuring the at least one electrical-related parameter of the doped semiconductor material is performed while the doped semiconductor material is in the vacuum ambient.