IP Library › Granted Patent US 11,264,072
Granted Patent B2
US 11,264,072 · App. 17/021,173 · Granted Mar 1, 2022

Memory device

Inventor: Ryousuke Takizawa (Naka Kanagawa, JP)
Assignee: KIOXIA CORPORATION
G11C11/1675G11C11/1659G11C11/1673
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Quick Facts
Patent No.
US 11,264,072
App. No.
17/021,173
Granted
Mar 1, 2022
Kind
B2
Abstract

According to one embodiment, a memory device includes first and second lines, a memory cell connected between the first and second lines, and including a resistance change memory element and a switching element, a current supply circuit supplying write current to the memory cell when data is written to the resistance change memory element, a detection circuit detecting an on state of the switching element after supply operation of the write current is enabled, and a control circuit controlling a time required until supplying the write current from the current supply circuit is stopped, wherein a starting point of the controlling the time is a time point at which the on state of the switching element is detected.

Claims (53)

1. A memory device comprising:

a first line extending in a first direction;

a second line extending in a second direction crossing the first direction;

a memory cell connected between the first line and the second line, and including a resistance change memory element which stores data based on a resistive state and a switching element connected to the resistance change memory element in series;

a current supply circuit which supplies write current to the resistance change memory element and the switching element when data is written to the resistance change memory element;

a detection circuit which detects an on state of the switching element after supply operation of the write current by the current supply circuit is enabled; and

a control circuit which controls a time required until supplying the write current from the current supply circuit is stopped, wherein a starting point of the controlling the time is a time point at which the on state of the switching element is detected by the detection circuit.

2. The memory device of claim 1 , wherein

the control circuit performs control such that the current supply circuit stops the supply of the write current when a predetermined time passed from the starting point.

3. The memory device of claim 2 , wherein

the current supply circuit supplies forming current to the resistance change memory element and the switching element when a forming process is applied to the memory cell,

the detection circuit detects the on state of the switching element after supply operation of the forming current by the current supply circuit is enabled, and

the control circuit controls an operation in which the current supply circuit stops the supply of the forming current after the switching element is turned on based on the supply of the forming current, wherein a starting point of the controlling the operation is a time point at which the on state of the switching element is detected by the detection circuit.

4. The memory device of claim 1 , wherein

the current supply circuit supplies forming current to the resistance change memory element and the switching element when a forming process is applied to the memory cell,

the detection circuit detects the on state of the switching element after supply operation of the forming current by the current supply circuit is enabled, and

the control circuit controls an operation in which the current supply circuit stops the supply of the forming current immediately after the switching element is turned on based on the supply of the forming current, wherein a starting point of the controlling the operation is a time point at which the on state of the switching element is detected by the detection circuit.

5. The memory device of claim 1 , wherein

the detection circuit detects the on state of the switching element by comparing a value based on current having passed through the resistance change memory element and the switching element with a reference value.

6. The memory device of claim 1 , wherein

the detection circuit is provided on a current sink side opposite to the current supply circuit with respect to two terminals of series-connection of the memory cell.

7. The memory device of claim 1 , wherein

the detection circuit comprises a current blocking switch, is provided on a current sink side opposite to the current supply circuit with respect to two terminals of series-connection of the memory cell, and controls the current blocking switch at time of detecting current.

8. The memory device of claim 1 , further comprising

a determination circuit which determines that the on state of the switching element is not detected by the detection circuit.

9. The memory device of claim 1 , wherein

the resistance change memory element is a magnetoresistance effect element.

10. The memory device of claim 1 , wherein

the switching element has properties in which the switching element changes from an off state to an on state when voltage applied between two terminals is increased and reaches a first voltage, and the switching element changes from the on state to the off state when the voltage applied between the two terminals is decreased and reaches a second voltage lower than the first voltage.

11. A memory device comprising:

a first line extending in a first direction;

a second line extending in a second direction crossing the first direction;

a memory cell connected between the first line and the second line, and including a resistance change memory element which stores data based on a resistive state and a switching element connected to the resistance change memory element in series;

a current supply circuit which supplies read current to the resistance change memory element and the switching element when data is read from the resistance change memory element;

a data signal acquisition circuit which acquires a data signal obtained by supply of the read current, the data signal being based on the data stored in the resistance change memory element;

a detection circuit which detects an on state of the switching element after supply operation of the read current by the current supply circuit is enabled; and

a control circuit which controls a time required until the data signal acquisition circuit acquires the data signal, wherein a starting point of the controlling the time is a time point at which the on state of the switching element is detected by the detection circuit.

12. The memory device of claim 11 , wherein

the control circuit performs control such that the data signal acquisition circuit acquires the data signal when a predetermined time passed from the starting point.

13. The memory device of claim 11 , wherein

the control circuit performs control such that the current supply circuit stops the supply of the read current after the data signal acquisition circuit acquires the data signal.

14. The memory device of claim 11 , wherein

the detection circuit detects the on state of the switching element by comparing a value based on current having passed through the resistance change memory element and the switching element with a reference value.

15. The memory device of claim 11 , wherein

the detection circuit is provided on a current sink side opposite to the current supply circuit with respect to two terminals of series-connection of the memory cell.

16. The memory device of claim 11 , wherein

the detection circuit comprises a current blocking switch, is provided on a current sink side opposite to the current supply circuit with respect to two terminals of series-connection of the memory cell, and controls the current blocking switch at time of detecting current.

17. The memory device of claim 11 , further comprising

a determination circuit which determines that the on stare of the switching element is not detected by the detection circuit.

18. The memory device of claim 11 , wherein

the resistance change memory element is a magnetoresistance effect element.

19. The memory device of claim 11 , wherein

the switching element has properties in which the switching element changes from an off state to an on state when voltage applied between two terminals is increased and reaches a first voltage, and the switching element changes from the on state to the off state when the voltage applied between the two terminals is decreased and reaches a second voltage lower than the first voltage.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2020
From: TAZIKAWA, RYOUSUKE
To: KIOXIA CORPORATION
Reel/Frame 054065/0645 →
Priority Claims (1)
JP JP2020-050836 · Mar 23, 2020 · national
Continuity (1)
Related Publication 20210295890A1 · Sep 23, 2021