IP Library Granted Patent US 11,348,703
Granted Patent B2
US 11,348,703 · App. 17/022,831 · Granted May 31, 2022

Tunable side-bounce x-ray monochromator

Inventors: Hawoong Hong (Naperville, IL); Jonathan Z. Tischler (Lisle, IL); Xianbo Shi (Naperville, IL)
Assignee: UCHICAGO ARGONNE, LLC
G21K1/062
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Quick Facts
Patent No.
US 11,348,703
App. No.
17/022,831
Granted
May 31, 2022
Kind
B2
Abstract

Monochromators selectively transmit a narrow band of wavelengths of radiation from a broader band of wavelengths for use in a variety of applications and industries. Disclosed is a method and system for fixed-exit angle tunable monochromator. The system includes a first diffraction element configured to reflect an input beam incident on a surface of the first diffraction element. The input beam has an input beam vector and the first diffraction element is rotatable about the input beam vector. The system further includes a second diffraction element configured to reflect the beam as an output beam having a fixed beam exit angle. The beam is incident on a surface of the second diffraction element and the reflected beam has a reflected beam vector. The second diffraction element is rotatable about both the input beam vector and the reflected beam vector.

Claims (39)

1. A beam steering system for a tunable monochromator, the system comprising:

a first diffraction element configured to reflect, as a reflected beam, an input beam incident on a surface of the first diffraction element, the input beam having an input beam vector, the first diffraction element rotatable about the input beam vector, the reflected beam having a reflected beam vector; and

a second diffraction element configured to reflect, as an output beam having a beam exit angle, the reflected beam incident on a surface of the second diffraction element, and the second diffraction element rotatable about both the input beam vector and the reflected beam vector.

2. The beam steering system of claim 1 , wherein the first diffraction element and the second diffraction element each comprise crystal.

3. The beam steering system of claim 1 , wherein the first diffraction element and the second diffraction element each comprise a multilayer.

4. The beam steering system of claim 1 , wherein the first diffraction element and the second diffraction element each comprise a grating.

5. The beam steering system of claim 1 , wherein the output beam has an energy in the x-ray radiation range.

6. The beam steering system of claim 1 , wherein the beam exit angle is a fixed angle.

7. The beam steering system of claim 1 , further comprising:

a first mount physically coupled to the first diffraction element, the first mount configured to rotate the first diffraction element about the input beam vector; and

a second mount physically coupled to the second diffraction element, the second mount configured to rotate the second diffraction element about the input beam vector and the reflected beam vector.

8. The beam steering system of claim 7 , further comprising a three-axis translation stage physically coupled to the second diffraction element, the three-axis translation stage configured to translate the second diffraction element in three orthogonal directions.

9. The beam steering system of claim 8 , further comprising:

a controller communicatively coupled to (i) the first mount, the controller configured to control the rotation of the first diffraction element, (ii) the second mount, the controller configured to control the rotation of the second diffraction element, and (iii) the three-axis translation stage, the controller configured to control the position of the second diffraction element; and

a processor communicatively coupled to the controller, the processor configured to provide the controller with (i) rotational coordinates of the first diffraction element, (ii) rotational coordinates of the second diffraction element, and (iii) translational coordinates of the second diffraction element.

10. The beam steering system of claim 1 , wherein the first diffraction element is physically configured such that the input beam has an angle of incidence on the first diffraction element, with the angle of incidence being determined by a desired energy of the output beam.

11. A method for tuning output beam energy of a tunable monochromator, the method comprising:

rotating a first diffraction element around an input beam vector by a first angle value, the first diffraction element configured to reflect, as a reflected beam having a reflected beam vector, an input beam having the input beam vector;

rotating a second diffraction element around the input beam vector by the first angle value;

rotating the second diffraction element around the reflected beam vector by a second angle value; and

reflecting, by the second diffraction element, the reflected beam as an output beam having a beam exit angle.

12. The method of claim 11 , wherein the first diffraction element and the second diffraction element each comprise crystal.

13. The method of claim 11 , wherein the first diffraction element and the second diffraction element each comprise a multilayer.

14. The method of claim 11 , wherein the first diffraction element and the second diffraction element each comprise a grating.

15. The method of claim 11 , wherein the output beam has an energy in the x-ray radiation range.

16. The method of claim 11 , wherein the output beam has a fixed beam exit angle.

17. The method of claim 11 , further comprising:

rotating, by a first mount physically coupled to the first diffraction element, the first diffraction element about the input beam vector; and

rotating, by a second mount physically coupled to the second diffraction element, the second diffraction element about the input beam vector and the reflected beam vector.

18. The method of claim 17 , further comprising translating, by a three-axis translation stage physically coupled to the second diffraction element, the second diffraction element.

19. The method of claim 18 , further comprising:

a controller communicatively coupled to (i) the first mount, (ii) the second mount, and (iii) the three-axis translation stage, the controller configured to:

control the rotation of the first diffraction element;

control the rotation of the second diffraction element; and

control the position of the second diffraction element;

and;

provide, by a processor communicatively coupled to the controller, the controller with (i) rotational coordinates of the first diffraction element, (ii) rotational coordinates of the second diffraction element, and (iii) translational coordinates of the second diffraction element.

20. The method of claim 11 , further comprising:

positioning the first diffraction element such that the input beam has an angle of incidence on the first diffraction element, with the angle of incidence being determined by a desired energy of the output beam.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2022
From: TISCHLER, JONATHAN Z.; HONG, HAWOONG; SHI, XIANBO
To: UCHICAGO ARGONNE, LLC
Reel/Frame 059767/0173 →
CONFIRMATORY LICENSE Recorded Mar 24, 2021
From: UCHICAGO ARGONNE, LLC
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 055698/0419 →
Continuity (1)
Related Publication 20220084711A1 · Mar 17, 2022