IP Library Granted Patent US 11,335,534
Granted Patent B2
US 11,335,534 · App. 17/027,341 · Granted May 17, 2022

Particle beam irradiation apparatus

Inventors: Takuma Aso (Tokyo, JP); Xin Man (Tokyo, JP); Makoto Sato (Tokyo, JP); Tatsuya Asahata (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
H01J37/222H01J37/244H01J37/265H01J37/28H01J37/3005
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Quick Facts
Patent No.
US 11,335,534
App. No.
17/027,341
Granted
May 17, 2022
Kind
B2
Abstract

The particle beam irradiation apparatus includes: an irradiation unit configured to radiate a particle beam; a first detection unit configured to detect first particles; a second detection unit configured to detect second particles; an image forming unit configured to form an observation image based on a first signal obtained by the detection of the first particles, which is performed by the first detection unit, and to form an observation image based on a second signal obtained by the detection of the second particles, which is performed by the second detection unit; and a control unit configured to calculate a brightness of a first region in the formed first observation image and perform a brightness adjustment of the first detection unit based on a first target brightness as a first brightness adjustment when the brightness of the first region is different from the first target brightness.

Claims (19)

1. A particle beam irradiation apparatus, comprising:

an irradiation unit configured to radiate a particle beam within a predetermined irradiation region;

a first detection unit configured to detect first particles generated from a sample, which is arranged so as to be located in the predetermined irradiation region, as a result of irradiation of the sample with the particle beam;

a second detection unit configured to detect second particles generated from the sample as a result of the irradiation of the sample with the particle beam;

an image forming unit configured to form an observation image based on a first signal obtained by the detection of the first particles, which is performed by the first detection unit, and to form an observation image based on a second signal obtained by the detection of the second particles, which is performed by the second detection unit; and

a control unit configured to acquire the observation images formed by the image forming unit as a first observation image and a second observation image, store the first observation image and the second observation image as an observation condition in a storage area of a storage unit, calculate a brightness of a first region in the stored first observation image, and perform a brightness adjustment of the first detection unit based on a first target brightness stored in the storage area of the storage unit as a first brightness adjustment when the brightness of the first region is different from the first target brightness, calculate a brightness of a second region in the stored second observation image, and perform a brightness adjustment of the second detection unit based on a second target brightness stored in the storage area of the storage unit as a second brightness adjustment when the brightness of the second region is different from the second target brightness,

wherein the control unit is configured to conduct a drift correction using an observation image including the second region which is formed by a second image forming unit after the second brightness adjustment, and

wherein the control unit is configured to acquire an observation image including the first region after conducting the drift correction, by the image forming unit after the first brightness adjustment.

2. The particle beam irradiation apparatus according to claim 1 , wherein each of the first observation image and the second observation image is the observation image formed based on the first signal.

3. The particle beam irradiation apparatus according to claim 1 , wherein each of the first observation image and the second observation image is the observation image formed based on the second signal.

4. The particle beam irradiation apparatus according to claim 1 ,

wherein the first observation image is the observation image formed based on the first signal, and

wherein the second observation image is the observation image formed based on the second signal.

5. The particle beam irradiation apparatus according to claim 1 , wherein the control unit is configured to make the brightness of the first region closer to the first target brightness through the first brightness adjustment and to make the brightness of the second region closer to the second target brightness through the second brightness adjustment.

6. The particle beam irradiation apparatus according to claim 1 ,

wherein the first region is included in the first observation image, and includes a portion of the sample, which is a target desired to be observed, and

wherein the second region is included in the second observation image, and includes a mark serving as a reference in drift correction for correcting a position of the first region.

7. The particle beam irradiation apparatus according to claim 1 , further comprising a display unit configured to display an image,

wherein the control unit is configured to control the display unit to display at least one of the first observation image formed by the image forming unit after the first brightness adjustment or the second observation image formed by the image forming unit after the second brightness adjustment.

Assignments (3)
CHANGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072903/0593 →
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072913/0104 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2022
From: ASO, TAKUMA; MAN, XIN; SATO, MAKOTO; ASAHATA, TATSUYA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 059645/0861 →
Priority Claims (1)
JP JP2019-173370 · Sep 24, 2019 · national
Continuity (1)
Related Publication 20210090853A1 · Mar 25, 2021