Ellipsometer and inspection device for semiconductor device

1. An ellipsometer comprising:

a polarizing optical device configured to separate light, reflected from a sample that is irradiated with an illumination light comprising a linearly polarized light, into a first linearly polarized light in a first polarization direction and a second linearly polarized light in a second polarization direction that is orthogonal to the first polarization direction; and

a light-receiving optical system configured to calculate Ψ(Psi) and Δ(Delta), an amplitude ratio and a phase difference of the two polarized lights respectively, from an interference fringe formed by interference between the first linearly polarized light and the second linearly polarized light after passing through an analyzing device with a transmission axis different from the first polarization direction and the second polarization direction.

2. The ellipsometer of claim 1 , further comprising:

a light source configured to emit the illumination light;

a polarizer irradiated by the illumination light emitted from the light source and configured to transmit the illumination light comprising the linearly polarized light in one direction; and

an objective lens configured to illuminate the sample with the illumination light comprising the linearly polarized light and transmit the reflected light reflected from the sample,

wherein the light-receiving optical system comprises:

an image detector comprising one or two dimension detector arrays configured to detect the interference fringe; and

an image processing device configured to calculate the ψ(Psi) and the Δ(Delta) based on the interference fringe.

3. The ellipsometer of claim 2 , wherein an optical axis of the illumination light incident on the sample, and an optical axis of the reflected light reflected from the sample are orthogonal to a measurement surface of the sample and coaxial to each other at least adjacent to the sample.

4. The ellipsometer of claim 2 , wherein the objective lens is configured to illuminate the sample on a front focal plane of the objective lens by condensing the illumination light into a focused point, and

wherein the image detector is disposed on a back focal plane of the objective lens or conjugate position of the back focal plane of the objective lens.

5. The ellipsometer of claim 2 , wherein the light-receiving optical system further comprises the analyzing device comprising a linear polarizer configured to transmit polarization components of the first linearly polarized light and the second linearly polarized light in directions inclined by 45 degrees with respect to the first polarization direction and the second polarization direction, respectively, and

wherein the image detector is configured to detect the interference fringe of each of the components of the first linearly polarized light and the second linearly polarized light transmitted through the analyzing device.

6. The ellipsometer of claim 2 , wherein the light-receiving optical system further comprises the analyzing device comprising a polarizing beam splitter configured to reflect polarization components of the first linearly polarized light and the second linearly polarized light in different directions from the first polarization direction and the second polarization direction, respectively, and transmit the polarization components of the first linearly polarized light and the second linearly polarized light in directions orthogonal to reflecting polarization directions, and

wherein the image detector comprises:

a first image detector configured to detect the interference fringe of each of the components reflected by the polarizing beam splitter; and

a second image detector configured to detect the interference fringe of each of the components transmitted through the polarizing beam splitter.

7. The ellipsometer of claim 2 , wherein the light-receiving optical system comprises the analyzing device comprising a polarizing beam splitter configured to reflect polarization components of the first linearly polarized light and the second linearly polarized light in different directions from the first polarization direction and the second polarization direction, respectively, and transmit the polarization components of the first linearly polarized light and the second linearly polarized light in directions orthogonal to reflecting polarization directions,

wherein the polarizing beam splitter is configured to redirect the reflected components and the transmitted components onto a same image detector.

8. The ellipsometer of claim 2 wherein the polarizer irradiated by the illumination light comprises either or both of a linear polarizer and a polarization retarder.

9. The ellipsometer of claim 1 , further comprising:

a light source configured to emit the illumination light;

a polarizer irradiated by the illumination light emitted from the light source and configured to transmit the illumination light comprising the linearly polarized light in one direction;

an illumination lens configured to transmit the illumination light comprising the linearly polarized light to the sample; and

a receiving lens configured to transmit the reflected light reflected from the sample,

wherein the light-receiving optical system comprises:

an image detector comprising one or two dimension detector array configured to detect the interference fringe; and

an image processing device configured to calculate the ψ(Psi) and the Δ(Delta) based on the interference fringe.

10. The ellipsometer of claim 9 , wherein an optical axis of the illumination light incident on the sample, and an optical axis of the reflected light reflected from the sample are inclined symmetrically with respect to a normal axis of a measurement surface of the sample at least adjacent to the sample.

11. The ellipsometer of claim 9 , wherein the illumination lens is configured to illuminate the sample on a front focal plane of the illumination lens by condensing the illumination light into a focused point, and

wherein the image detector is disposed on a back focal plane of the receiving lens or a conjugate position of the back focal plane of the receiving lens.

12. The ellipsometer of claim 9 , wherein the illumination lens is configured to illuminate the sample on a front focal plane of the illumination lens by condensing the illumination light into an area having a predetermined diffusion in the sample, and

wherein the image detector is disposed on an image position of the sample.

13. The ellipsometer of claim 1 , wherein the polarizing optical device is a Nomarski prism.

14. The ellipsometer of claim 13 , wherein the Nomarski prism comprises a plurality of divided pieces each having a fan shape and a central angle in which a rotation angle of one rotation around an optical axis is equally divided within a plane orthogonal to the optical axis of the reflected light, and

wherein each of the plurality of divided pieces is configured to separate the first linearly polarized light and the second linearly polarized light in a direction orthogonal to a bisector of the central angle.

15. The ellipsometer of claim 1 , wherein the polarizing optical device comprises a Wollaston prism or a Rochon prism.

16. The ellipsometer of claim 1 , wherein the polarizing optical device is a beam displacer configured to separate the linearly polarized light on one side to be parallel.

17. The ellipsometer of claim 1 , wherein the illumination light is a monochromatic light.

18. The ellipsometer of claim 1 , wherein the illumination light is white light having broadband wavelength, and

wherein the light-receiving optical system comprises:

an image detector comprising one or two dimension detector array configured to detect the interference fringe; and

an image processing device configured to Fourier-transform the interference fringe and calculate ψ(Psi) and Δ(Delta), the amplitude ratio and the phase difference of two polarized light respectively, based on an amplitude and a phase of a Fourier-transformed interference fringe.

19. The ellipsometer of claim 1 , wherein the illumination light comprises either a fully linearly polarized light or a fully elliptically polarized light.

20. The ellipsometer of claim 1 wherein the ψ(Psi) and the Δ(Delta) value is calculated by a fringe contrast and a phase value respectively by means either of fitting of a periodic function or Fourier transformation of the interference fringe.