IP Library › Granted Patent US 11,936,364
Granted Patent B2
US 11,936,364 · App. 17/043,559 · Granted Mar 19, 2024

Surface acoustic wave device on device on composite substrate

Inventors: Sylvain Ballandras (Besançon, FR); Thierry LaRoche (Besançon, FR)
Assignee: Soitec
H03H9/02866H03H3/08H03H9/02574H03H9/02661H03H9/145H03H9/25H03H9/6489
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Quick Facts
Patent No.
US 11,936,364
App. No.
17/043,559
Granted
Mar 19, 2024
Kind
B2
Abstract

A surface acoustic wave device comprising a base substrate, a piezoelectric layer and an electrode layer in between the piezoelectric layer and the base substrate, a comb electrode formed on the piezoelectric layer comprising a plurality of electrode means with a pitch p, defined asp=A, with A being the wavelength of the standing acoustic wave generated by applying opposite potentials to the electrode layer and comb electrode, wherein the piezoelectric layer comprises at least one region located in between the electrode means, in which at least one physical parameter is different compared to the region underneath the electrode means or fingers. A method of fabrication for such surface acoustic wave device is also disclosed. The physical parameter may be thickness, elasticity, doping concentration of Ti or number of protons obtained by proton exchange.

Claims (24)

1. A surface acoustic wave device, comprising:

a base substrate;

a piezoelectric layer;

an electrode layer in between the piezoelectric layer and the base substrate; and

a comb electrode formed on the piezoelectric layer comprising a plurality of electrode fingers with a pitch ρ, defined as ρ=λ, with λ being a wavelength of a standing acoustic wave generated by applying opposite potentials to the electrode layer and the comb electrode;

wherein, the piezoelectric layer comprises at least one region located in between the plurality of electrode fingers in which at least one physical parameter is different compared to a region underneath the plurality of electrode fingers; and

wherein the at least one physical parameter of the piezoelectric layer being different in the at least one region is one of elasticity of the piezoelectric layer and a dopant concentration.

2. The surface acoustic wave device of claim 1 , further comprising a Bragg mirror underneath the piezoelectric layer.

3. The surface acoustic wave device of claim 2 , wherein the electrode layer is between the piezoelectric layer and the base substrate, and the electrode layer is part of the Bragg mirror.

4. The surface acoustic wave device of claim 2 , wherein the Bragg mirror comprises a plurality of layers of alternating impedance.

5. The surface acoustic wave device of claim 1 , wherein a thickness t r in the at least one region of the piezoelectric layer is smaller than a thickness t of the piezoelectric layer.

6. The surface acoustic wave device of claim 1 , wherein a thickness t of the piezoelectric layer is defined by optimization of a coupling between a bulk acoustic wave and the standing acoustic wave generated between the comb electrode and the electrode layer and is on the order or smaller than the wavelength λ of the standing acoustic wave.

7. The surface acoustic wave device of claim 1 , wherein a dimension of the comb electrode is defined by optimization of a coupling between a bulk acoustic wave and the standing acoustic wave generated by the comb electrode.

8. A frequency filter device comprising the surface acoustic wave device according to claim 1 .

9. A method of fabrication of a surface acoustic wave device, comprising the steps of:

a) providing an electrode layer on top of a base substrate;

b) providing a piezoelectric layer on the electrode layer; and

c) forming an upper comb electrode layer including electrode fingers on the piezoelectric layer;

wherein, in step b), the piezoelectric layer is provided such that the piezoelectric layer comprises at least one region located in between the electrode fingers in which at least one physical parameter is different compared to a region underneath the electrode fingers, and

wherein step b) comprises one of an implantation or diffusion of atomic species in the region of the piezoelectric layer located between the electrode fingers and an etching step for removing part of the piezoelectric layer in the region of the piezoelectric layer located between the electrode fingers.

10. The method of claim 9 , further comprising a step d) of providing a Bragg mirror on or over the base substrate before the step of providing the piezoelectric layer.

11. The method of claim 10 , further comprising forming the Bragg mirror such that the electrode layer is part of the Bragg mirror.

12. The method of claim 10 , wherein at least one of the steps a) to d) comprises a layer transfer process.

13. The method of claim 9 , wherein step b) comprises a proton exchange in the at least one region of the piezoelectric layer located between the electrode fingers.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY DATA PREVIOUSLY RECORDED AT REEL: 063752 FRAME: 0962. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Jun 2, 2023
From: FREC'N'SYS
To: SOITEC
Reel/Frame 063844/0750 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ADDRESS OF ASSIGNEE PREVIOUSLY RECORDED AT REEL: 063749 FRAME: 0796. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER . Recorded Jun 2, 2023
From: FREC'N'SYS
To: SOITEC
Reel/Frame 064219/0104 →
MERGER Recorded May 24, 2023
From: FREC'N'SYS
To: SOITEC
Reel/Frame 063749/0796 →
MERGER Recorded May 24, 2023
From: FREC'N'SYS
To: SOITEC
Reel/Frame 063752/0962 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 8, 2021
From: BALLANDRAS, SYLVAIN; LAROCHE, THIERRY
To: FREC'N'SYS
Reel/Frame 058330/0990 →
Priority Claims (1)
FR 1852750 · Mar 29, 2018 · national
Continuity (1)
Related Publication 20210021255A1 · Jan 21, 2021
Cited By (2)
US 12,255,612 US 12,726,170