Automated TFM grid resolution setup tools
Examples of the present subject matter provide techniques for calculating amplitude fidelity (AF) for a variety of grid resolutions using a single TFM image of a specified flaw. Thus, the grid resolution may be set so that it yields a desired AF using a calculation process without performing a blind iterative process. Moreover, examples of the present subject matter may measure AF in more than one axis, improving accuracy.
1. A method comprising:
constructing a total-focusing method (TFM) image of a representation of a flaw in an object at a first grid resolution;
determining a center of mass of the representation of the flaw based on the constructed TFM image;
identifying a major axis and a minor axis of the representation of the flaw based on the center of mass, wherein the major axis defines a beam waist axis and the minor axis defines an acoustic propagation direction;
determining a plurality of pixel or voxel values from the TFM image along the major and minor axes;
calculating a width of a curve corresponding to a length of an axis of a target eclipse based on a specified amplitude fidelity (AF); and
based on the plurality of pixel or voxel values along the major and minor axes and the calculated width of the curve, determining a second grid resolution corresponding to the specified AF so that at least three grid points fall along the target ellipse.
2. The method of claim 1 , further comprising:
applying an interpolation technique to the plurality of pixel or voxel values along the major and minor axes.
3. The method of claim 2 , further comprising:
normalizing the pixel or voxel values along the major and minor axes.
4. The method of claim 1 , further comprising:
constructing a second TFM image of representation at the second grid resolution; and
verifying the AF value of the second TFM image.
5. The method of claim 4 , wherein verifying the AF value comprises:
validating the AF value by moving a grid of the second TFM image in a plurality of different directions.
6. The method of claim 1 , wherein the first grid resolution is greater than the second grid resolution.
7. A machine-storage medium embodying instructions that, when executed by a machine, cause the machine to perform operations comprising:
constructing a total-focusing method (TFM) image of a representation of a flaw in an object at a first grid resolution;
determining a center of mass of the representation of the flaw based on the constructed TFM;
identifying a major axis and a minor axis of the representation of the flaw based on the center of mass, wherein the major axis defines a beam waist axis and the minor axis defines an acoustic propagation direction;
determining a plurality of pixel or voxel values from the TFM image along the major and minor axes;
calculating a width of a curve corresponding to a length of an axis of a target eclipse based on a specified amplitude fidelity (AF); and
based on the plurality of pixel or voxel values along the major and minor axes and the calculated width of the curve, determining a second grid resolution corresponding to the specified AF so that at least three grid points fall along the target ellipse.
8. The machine-storage medium of claim 7 , further comprising:
applying an interpolation technique to the plurality of pixel or voxel values along the major and minor axes.
9. The machine-storage medium of claim 8 , further comprising:
normalizing the plurality of pixel or voxel values along the major and minor axes.
10. The machine-storage medium of claim 7 , further comprising:
constructing a second TFM image of representation at the second grid resolution; and
verifying the AF value of the second TFM image.
11. The machine-storage medium of claim 10 , wherein verifying the AF value comprises:
validating the AF value by moving a grid of the second TFM image in a plurality of different directions.
12. The machine-storage medium of claim 7 , wherein the first grid resolution is greater than the second grid resolution.
13. A system comprising:
one or more processors of a machine; and
a memory storing instructions that, when executed by the one or more processors, cause the machine to perform operations comprising:
constructing a total-focusing method (TFM) image of a representation of a flaw in an object at a first grid resolution;
determining a center of mass of the representation of the flaw based on the constructed TFM image;
identifying a major axis and a minor axis of the representation of the flaw based on the center of mass, wherein the major axis defines a beam waist axis and the minor axis defines an acoustic propagation direction;
determining a plurality of pixel or voxel values from the TFM image along the major and minor axes;
calculating a width of a curve corresponding to a length of an axis of a target eclipse based on a specified amplitude fidelity (AF), and
based on the plurality of pixel or voxel values along the major and minor axes and the calculated width of the curve, determining a second grid resolution corresponding to the specified AF so that at least three grid points fall along the target ellipse.
14. The system of claim 13 , the operations further comprising:
applying an interpolation technique to the plurality of pixel or voxel values along the major and minor axes.
15. The system of claim 14 , the operations further comprising:
normalizing the plurality of pixel or voxel values along the major and minor axes.
16. The system of claim 13 , the operations further comprising:
constructing a second TFM image of representation at the second grid resolution; and
verifying the AF value of the second TFM image.
17. The system of claim 16 , wherein verifying the AF value comprises:
validating the AF value by moving a grid of the second TFM image in a plurality of different directions.
18. The system of claim 13 , wherein the first grid resolution is greater than the second grid resolution.