Apparatus and methods for selectively etching films
An apparatus and methods for selectively etching a particular layer are disclosed. The apparatus and methods are directed towards maintaining the etch rate of the particular layer, while keeping intact a non-etched layer. The etching process may be accomplished by co-flowing a hydrogen precursor gas and a fluorine precursor gas into a remote plasma unit. A resulting gas mixture may then be flowed onto the substrate having a silicon oxide layer as an etch layer and a silicon nitride layer as a non-etched layer, for example. A reaction between the resulting gas mixture and the particular layer takes place, resulting in etching of the silicon oxide layer while maintaining the silicon nitride layer in the above example.
1. A method for selectively etching a film disposed on a substrate, the method comprising:
providing a substrate in a reaction chamber of a semiconductor processing device, the substrate having a first layer and a second layer;
igniting a plasma in a remote plasma unit by flowing an inert gas into the remote plasma unit;
flowing a hydrogen precursor gas and a fluorine precursor gas concurrently as a gaseous mixture into the remote plasma unit;
flowing the gaseous mixture onto the substrate, whereby a reaction takes place between the gaseous mixture and the first layer, resulting in an etching of the first layer while maintaining intact the second layer;
wherein the fluorine precursor gas comprises at least one of: nitrogen trifluoride (NF 3 ); carbon tetrafluoride (CF 4 ); sulfur hexafluoride (SF 6 ); hydrogen fluoride (HF); hydrofluoric acid (HF) with water vapor; or fluorine (F 2 ); and
wherein the hydrogen precursor gas comprises at least one of: hydrogen (H 2 ); hydrogen fluoride (HF); hydrogen chloride (HCl); or water (H 2 O).
2. The method of claim 1 , further comprising:
flowing an ammonia precursor gas into the reaction chamber, whereby the ammonia precursor gas mixes with the gaseous mixture.
3. The method of claim 2 , wherein the ammonia precursor gas comprises at least one of: ammonia (NH 3 ); hydrazine (N 2 H 4 ); or urea (NH 2 CONH 2 ).
4. The method of claim 1 , further comprising:
flowing the hydrogen precursor gas by itself into the remote plasma unit before flowing a hydrogen precursor gas and a fluorine precursor gas concurrently.
5. The method of claim 1 , further comprising:
flowing the fluorine precursor gas by itself into the remote plasma unit before flowing a hydrogen precursor gas and a fluorine precursor gas concurrently.
6. The method of claim 1 , wherein the first layer comprises at least one of: silicon oxide; germanium oxide; aluminum oxide; cobalt oxide; tungsten oxide; silicon; germanium; aluminum; cobalt; tungsten; or alloys of various metals.
7. The method of claim 1 , wherein the second layer comprises at least one of: silicon nitride; metal nitride; or aluminum nitride.
8. The method of claim 1 , wherein the inert gas comprises at least one of: argon; krypton; helium; xenon; or nitrogen.