IP Library › Granted Patent US 11,391,659
Granted Patent B2
US 11,391,659 · App. 17/070,646 · Granted Jul 19, 2022

Optical detecting system

Inventors: Young Dug Kim (Gyeonggi-do, KR); Seung Bum Yang (Daejeon, KR); Kyoung Man Cho (Seoul, KR); Dong Jun Jeong (Daejeon, KR); Nam Kyun Kim (Gyeonggi-do, KR)
Assignee: THE WAVE TALK, INC.
G01N15/0227G01N15/0211G06V20/693G06V20/698H04N5/247G01N2015/0065
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Quick Facts
Patent No.
US 11,391,659
App. No.
17/070,646
Granted
Jul 19, 2022
Kind
B2
Abstract

According to an embodiment of the present disclosure, provided is an optical detection system for detecting a laser speckle generated by multiple scattering of a wave irradiated toward a sample from a wave source, and based on a change in the laser speckle over time, detecting the presence of microbes in the sample in real time.

Claims (40)

1. An optical measurement apparatus comprising:

a wave source;

an optical unit configured to transfer a wave generated in the wave source to a first path or a second path;

a first speckle generation unit disposed on the first path and including a static scattering medium to scatter the first wave incident along the first path and generate a first speckle;

a first image sensor configured to detect the first speckle in time series order;

a sample accommodation unit disposed on the second path and including a sample to be measured;

a second image sensor configured to detect an optical signal generated in the sample in time series order; and

a controller configured to obtain a temporal correlation of the first speckle using the detected first speckle and control an operation of the second image sensor based on the obtained temporal correlation of the first speckle.

2. The optical measurement apparatus of claim 1 , wherein the sample accommodation unit comprises a second speckle generation unit configured to scatter a second wave incident along the second path and generate a second speckle.

3. The optical measurement apparatus of claim 2 , wherein the controller obtains a temporal correlation of a detected second speckle using the detected second speckle, and estimates the presence or concentration of microbe in the sample based on the obtained temporal correlation of the second speckle.

4. The optical measurement apparatus of claim 1 , wherein the controller determines a change in the property of the first wave based on the temporal correlation of the first speckle, and controls an operation of the second image sensor according to the change in the property of the first wave.

5. The optical measurement apparatus of claim 4 , wherein the controller calculates a temporal correlation coefficient of the first speckle and operates the second image sensor only when the temporal correlation coefficient of the first speckle corresponds to a preset range.

6. The optical measurement apparatus of claim 4 , wherein the controller calculates the temporal correlation coefficient of the first speckle and uses the temporal correlation coefficient of the first speckle to calibrate a detection signal of the second image sensor.

7. The optical measurement apparatus of claim 2 , wherein the first speckle generation unit and the second speckle generation unit are integrally formed.

8. The optical measurement apparatus of claim 2 , wherein the second speckle generation unit further comprises a multiple scattering amplifier including a multiple scattering material to amplify the number of times of multiple scattering of the second wave in the sample.

9. An optical measurement apparatus comprising:

a wave source;

an optical unit configured to transfer a wave generated in the wave source to a first path or a second path;

a first speckle generation unit disposed on the first path and including a static scattering medium to scatter the first wave incident along the first path and generate a first speckle;

a second speckle generation unit disposed on the second path and including a sample to be measured to scatter a second wave incident along the second path and generate a second speckle;

a first shutter disposed between the optical unit and the second speckle generation unit;

an image sensor configured to detect the first speckle or the second speckle in time series order; and

a controller configured to obtain a temporal correlation of the first speckle using the detected first speckle by the image sensor and control an operation of the first shutter based on the obtained temporal correlation of the first speckle.

10. The optical measurement apparatus of claim 9 , wherein the controller obtains a temporal correlation of the detected second speckle using the detected second speckle, and estimates the presence or concentration of microbe in the sample based on the obtained temporal correlation of the second speckle.

11. The optical measurement apparatus of claim 9 , wherein the controller determines a change in the property of the first wave based on the temporal correlation of the first speckle, and controls an operation of the first shutter according to the change in the property of the first wave.

12. The optical measurement apparatus of claim 11 , wherein the controller calculates a temporal correlation coefficient of the first speckle and opens the first shutter to detect the second speckle only when the temporal correlation coefficient of the first speckle corresponds to a preset range.

13. The optical measurement apparatus of claim 11 , further comprising a second shutter disposed between the optical unit and the first speckle generation unit, and

wherein the controller controls the second shutter to be closed while the first shutter is opened.

14. The optical measurement apparatus of claim 9 , wherein the second speckle generation unit further comprises a multiple scattering amplifier including a multiple scattering material to amplify the number of times of multiple scattering of the second wave in the sample.

15. An optical measurement apparatus comprising:

a wave source;

an optical unit configured to transfer a wave generated in the wave source to a first path or a second path;

a first speckle generation unit disposed on the first path and including a control group sample to scatter the first wave incident along the first path and generate a first speckle;

a first image sensor configured to detect the first speckle in time series order;

a second speckle generation unit disposed on the second path and including a measurement group sample and a medium to scatter a second wave incident along the second path and generate a second speckle;

a second image sensor configured to detect the second speckle in time series order; and

a controller configured to estimate a first concentration of the control group sample and a second concentration of the measurement group sample using the detected first speckle and the detected second speckle, and determine the presence of live bacteria in the measurement group sample using the first concentration and the second concentration.

16. The optical measurement apparatus of claim 15 , wherein the controller obtains a temporal correlation of the first speckle using the detected first speckle, and then estimates the first concentration of the control group sample using the temporal correlation of the first speckle, obtains a temporal correlation of the second speckle using the detected second speckle, and then estimates the second concentration of the measurement group sample using the temporal correlation of the second speckle.

17. The optical measurement apparatus of claim 15 , wherein the measurement group sample is a sample diluted m times the control group sample, and the controller obtains a growth time at which the second concentration is equal to the first concentration and then derives a ratio of live bacteria and dead bacteria in the measurement group sample using the growth time.

18. The optical measurement apparatus of claim 15 , wherein the second speckle generation unit further comprises a multiple scattering amplifier including a multiple scattering material to amplify the number of times of multiple scattering of the second wave in the sample.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 23, 2022
From: KIM, YOUNG DUG; YANG, SEUNG BUM; CHO, KYOUNG MAN; JEONG, JI EUN; KIM, NAM KYUN
To: THE WAVE TALK, INC.
Reel/Frame 059381/0487 →
Priority Claims (4)
KR 10-2018-0057326 · May 18, 2018 · national
KR 10-2018-0077193 · Jul 3, 2018 · national
KR 10-2019-0057746 · May 17, 2019 · national
KR 10-2019-0057747 · May 17, 2019 · national
Continuity (2)
Continuation 16492577
Related Publication 20210025803A1 · Jan 28, 2021