Mixed pad size and pad design
Disclosed is a package and method of forming the package with a mixed pad size. The package includes a first set of pads having a first size and a first pitch, where the first set of pads are solder mask defined (SMD) pads. The package also includes a second set of pads having a second size and a second pitch, where the second set of pads are non-solder mask defined (NSMD) pads.
1. An apparatus comprising a package, the package comprising:
a first set of pads having a first size and a first pitch, wherein the first set of pads are solder mask defined (SMD) pads; and
a second set of pads having a second size different from the first size and a second pitch different from the first pitch, wherein the second set of pads are non-solder mask defined (NSMD) pads,
wherein the first pitch is a center to center distance between adjacent pads of the first set of pads and the second pitch is a center to center distance between adjacent pads of the second set of pads,
wherein the first size of the first set of pads are generally uniform and smaller than the second size of the second set of pads, and
wherein one or more pads of the first set of pads occupy an outermost perimeter of the package.
2. The package of claim 1 , wherein the first set of pads and the second set of pads are formed in a first metal layer of the apparatus.
3. The package of claim 2 , wherein the apparatus is covered by a solder resist with openings over the first set of pads and the second set of pads.
4. The apparatus of claim 3 , further comprising:
a first set of solder resist openings for the first set of pads, wherein each of the first set of solder resist openings are smaller than each of the first set of pads.
5. The package of claim 3 , further comprising:
a second set of solder resist openings for the second set of pads, wherein each of the second set of solder resist openings are larger than each of the second set of pads.
6. The apparatus of claim 1 , wherein each of the second set of pads is between 10% and 100% larger than each of the first set of pads.
7. The package of claim 1 , wherein the first pitch of the first set of pads are generally uniform and smaller than the second pitch of the second set of pads.
8. The apparatus of claim 7 , wherein the second pitch is between 10% and 100% larger than each of the first pitch.
9. The package of claim 1 , wherein the apparatus is a single sided ball grid array (BGA) package or a double-sided ball grid array (BGA) package.
10. The apparatus of claim 1 , wherein the apparatus selected from the group consisting of a music player, a video player, an entertainment unit, a navigation device, a communications device, a mobile device, a mobile phone, a smartphone, a personal digital assistant, a fixed location terminal, a tablet computer, a computer, a wearable device, an Internet of things (IoT) device, a laptop computer, a server, and a device in an automotive vehicle.
11. A method for fabricating a package, the method comprising:
forming a first set of pads having a first size and a first pitch, wherein the first set of pads are solder mask defined (SMD) pads; and
forming a second set of pads having a second size different from the first size and a second pitch different from the first pitch, wherein the second set of pads are non-solder mask defined (NSMD) pads,
wherein the first pitch is a center to center distance between adjacent pads of the first set of pads and the second pitch is a center to center distance between adjacent pads of the second set of pads,
wherein the first size of the first set of pads are generally uniform and smaller than the second size of the second set of pads, and
wherein one or more pads of the first set of pads occupy an outermost perimeter of the package.
12. The method of claim 11 , wherein the first set of pads and the second set of pads are formed in a first metal layer of the package.
13. The method of claim 12 , wherein the package is covered by a solder resist with openings over the first set of pads and the second set of pads.
14. The method of claim 13 , further comprising:
forming a first set of solder resist openings for the first set of pads, wherein each of the first set of solder resist openings are smaller than each of the first set of pads.
15. The method of claim 13 , further comprising:
forming a second set of solder resist openings for the second set of pads, wherein each of the second set of solder resist openings are larger than each of the second set of pads.
16. The method of claim 11 , wherein each of the second set of pads is between 10% and 100% larger than each of the first set of pads.
17. The method of claim 11 , wherein the first pitch of the first set of pads are generally uniform and smaller than the second pitch of the second set of pads.
18. The method of claim 17 , wherein each of the second pitch is between 10% and 100% larger than each of the first pitch.
19. The method of claim 11 , wherein the package is a single sided ball grid array (BGA) package or a double-sided ball grid array (BGA) package.
20. The method of claim 11 , wherein the package is incorporated into an apparatus selected from the group consisting of a music player, a video player, an entertainment unit, a navigation device, a communications device, a mobile device, a mobile phone, a smartphone, a personal digital assistant, a fixed location terminal, a tablet computer, a computer, a wearable device, an Internet of things (IoT) device, a laptop computer, a server, and a device in an automotive vehicle.
21. The package of claim 5 , further comprising:
a second set of connection structures configured to couple with the second set of pads,
wherein at least one of the second set of set of connection structures in contact with sides of the solder resist of the corresponding one of the second set of solder resist opening.
22. The method of claim 15 , further comprising:
forming a second set of connection structures configured to couple with the second set of pads,
wherein at least one of the second set of set of connection structures in contact with sides of the solder resist of the corresponding one of the second set of solder resist opening.