IP Library Granted Patent US 11,994,533
Granted Patent B2
US 11,994,533 · App. 17/105,475 · Granted May 28, 2024

Methods and systems for scanning probe sample property measurement and imaging

Inventors: Rafael Piestun (Boulder, CO); Simon Labouesse (Boulder, CO); Markus B. Raschke (Boulder, CO); Eric Muller (Hamilton, NY); Samuel Johnson (Boulder, CO)
Assignee: The Regents of the University of Colorado, a body corporate
G01Q60/22G01J3/0208G01J3/10G01J3/2846G01J3/4412G01J3/45G01Q10/06G01Q30/04G01Q60/06
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Quick Facts
Patent No.
US 11,994,533
App. No.
17/105,475
Granted
May 28, 2024
Kind
B2
Abstract

Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.

Claims (83)

1. A system comprising:

a probe to generate measurement signals based on a location of the probe relative to a sample, wherein the probe is connected to an actuator to move the probe to a desired location over the sample;

a sampling system configured to:

generate instructions to determine the location, and a state, of the probe; and

divide the location of the sample into a grid, wherein the instructions generated cause the probe to:

first use a random or deterministic psuedo-random spatial sampling of the grid to collect data; and

then use the collected data to identify selected areas within the grid covering the sample; and

a reconstruction module to reconstruct a representation of the sample based on the measurements collected from the selected areas of the sample.

2. The system of claim 1 , wherein the probe is an optical probe.

3. The system of claim 2 further comprising a light source to illuminate at least one of: the probe, and at least a portion of the sample.

4. The system of claim 1 , wherein the probe generates signals for processing to facilitate retrieval of an optical spectrum.

5. The system of claim 1 , wherein the sampling system determines the location and the state of the probe based on prior signals collected by the probe.

6. The system of claim 1 , wherein the sampling system is further configured to determine the location, and the state, of the probe based on prior knowledge about at least one of: the sample, and the sampling system.

7. The system of claim 6 , wherein the prior knowledge includes at least one of: a light source spectrum, a spectral sparsity of the sample, a number of distinct chemical species, compositional characteristics of the sample, and structural features in the sample.

8. The system of claim 4 , wherein for generating signals to facilitate retrieval of the optical spectrum, the probe comprises: a spectrometer, an interferometer, a grating spectrometer, a Fourier transform spectrometer, an optical homodyne, a heterodyne detection component, or a laser.

9. The system of claim 4 , wherein the optical spectrum provides spectroscopic data including a spatial analysis or a spectral analysis.

10. The system of claim 1 , wherein the sampling system is further configured to divide the sample into a grid, and wherein the instructions generated cause the probe to select a pseudo-random subset of the grid.

11. The system of claim 1 , wherein, in a plurality of probe states, the probe is configured to measure different qualities of the sample at a given location.

12. The system of claim 11 further comprising a Fourier transform interferometer including a mirror, wherein the plurality of probe states corresponding to different positions of the mirror.

13. The system of claim 1 , wherein the sampling system is further configured to divide the sample into a grid, and wherein the instructions generated cause the probe to select at least one of: a subset of the grid, and a subset of the states of the measurement probe.

14. The system of claim 4 further comprising a spectrometer, wherein the sampling system is further configured to divide the sample into a grid, and wherein the instructions generated cause the probe to select a pseudo-random subset of the grid for a spectroscopy analysis.

15. The system of claim 1 , wherein the representation includes at least one of: spatial information, and spectral information, about the sample.

16. The system of claim 1 , wherein the representation includes sub-diffraction limit spatial resolution information about the sample.

17. The system of claim 1 , wherein the reconstruction module is configured to reconstruct the representation to include nanometer scale images having at least one of intrinsic vibrational, phonon, and electronic resonance contrast.

18. The system of claim 1 , wherein the reconstruction module is configured to reconstruct the representation to include information about at least one of a: biological, molecular, and quantum, system.

19. The system of claim 1 , wherein the sampling system is further configured to provide sub Nyquist sampling.

20. The system of claim 1 , wherein the sampling system is further configured to perform at least one of: compressed sampling, matrix completion, and adaptive random sampling.

21. A method comprising:

identifying a sample within an imaging and spectroscopy system;

applying, using a smart sampling algorithm, a grid to the sample; and

generating, using the smart sampling algorithm, instructions that when executed by one or more processors cause the system to obtain a spectral image representation of the sample based on a subset of measurements from the grid in a selected pattern,

wherein the selected pattern is a pseudo random pattern that takes into account information regarding estimated information regarding the sample.

22. The method of claim 21 further comprising pre-shaping a scan of the sample in phase, amplitude, or spectrum, before light is incident on the sample.

23. The method of claim 21 further comprising pre-shaping a scan of the sample after light is incident to the sample.

24. The method of claim 21 , wherein the selected pattern takes into account information regarding a physical setup of components of the system.

25. The method of claim 21 , wherein the estimated information includes at least one of: pulse spread time, and members of chemical species.

26. The method of claim 21 further comprising: feeding back the subset of measurements taken from the grid, and updating the subset to include, or remove, a measurement from other areas of the grid.

27. The method of claim 21 further comprising generating an optimized trajectory of a probe to facilitate minimizing a scanning time.

28. The method of claim 21 further comprising shifting a carrier frequency into a rotating frame to reduce a number of data points required to sample a spectrum of the sample.

29. An apparatus comprising:

a non-transitory computer readable medium; and

a processing system,

wherein the non-transitory computer readable medium has program instructions stored thereon which, when executed by the processing system, direct the processing system to:

receive a profile hint associated with a sample that is the subject of spectroscopy analysis;

generate encoded instructions for performing the spectroscopy analysis of a sample based on selected subsampling of the subject; and

communicate the instructions to a spectroscopy analysis system that performs the spectroscopy analysis in accordance with the encoded instructions,

wherein the encoded instructions further cause the spectroscopy analysis system to shift a carrier frequency into a rotating frame.

30. The apparatus of claim 29 , wherein the carrier frequency being shifted into the rotating frame by the spectroscopy analysis system reduces a number of data points required to sample a spectrum of the sample.

31. The apparatus of claim 29 , wherein the encoded instructions further cause the spectroscopy analysis system to:

identify two basis vectors spanning a rotated space; and

measure a complex-valued field using amplitude modulated two-phase homodyne imaging.

32. The apparatus of claim 31 , wherein the encoded instructions further cause the spectroscopy analysis system to generate spectroscopically resolved voxels by: repeating the two-phase homodyne imaging at each reference arm delay, stacking resulting images, correcting for spatial drift, and Fourier transforming an interferogram at each pixel using the rotating frame.

33. The apparatus of claim 29 , wherein the profile hint identifies resonances of interest.

34. The apparatus of claim 33 , wherein a spectral resolution is selected based on the resonances of interest.

35. The apparatus of claim 33 , wherein a maximum measure frequency is selected based on the resonances of interest.

36. The apparatus of claim 29 , wherein the encoded instructions further cause the spectroscopy analysis system to feedback a subset of measurements taken from a grid.

37. The apparatus of claim 36 , wherein the encoded instructions further cause the spectroscopy analysis system to update the subset to include an additional measurement from other areas of the grid.

38. The apparatus of claim 37 , wherein the encoded instructions further cause the spectroscopy analysis system to generate an optimized trajectory of a tip of a probe to facilitate minimizing a scanning time.

39. A method comprising:

identifying a sample within an imaging and spectroscopy system;

applying, using a smart sampling algorithm, a grid to the sample;

generating, using the smart sampling algorithm, instructions that when executed by one or more processors cause the system to obtain a spectral image representation of the sample based on a subset of measurements from the grid in a selected pattern; and

feeding back the subset of measurements taken from the grid.

40. The method of claim 39 further comprising updating the subset to include, or remove, a measurement from other areas of the grid.

41. An apparatus comprising:

a non-transitory computer readable medium; and

a processing system,

wherein the non-transitory computer readable medium has program instructions stored thereon which, when executed by the processing system, direct the processing system to:

receive a profile hint associated with a sample that is the subject of spectroscopy analysis, wherein the profile hint identifies resonances of interest;

generate encoded instructions for performing the spectroscopy analysis of a sample based on selected subsampling of the subject; and

communicate the instructions to a spectroscopy analysis system that performs the spectroscopy analysis in accordance with the encoded instructions.

42. The apparatus of claim 41 , wherein a spectral resolution is selected based on the resonances.

43. The apparatus of claim 41 , wherein a maximum measure frequency is selected based on the resonances.

44. An apparatus comprising:

a non-transitory computer readable medium; and

a processing system,

wherein the non-transitory computer readable medium has program instructions stored thereon which, when executed by the processing system, direct the processing system to:

receive a profile hint associated with a sample that is the subject of spectroscopy analysis;

generate encoded instructions for performing the spectroscopy analysis of a sample based on selected subsampling of the subject; and

communicate the instructions to a spectroscopy analysis system that performs the spectroscopy analysis in accordance with the encoded instructions,

wherein the encoded instructions further cause the spectroscopy analysis system to feedback a subset of measurements taken from a grid.

45. The apparatus of claim 44 , wherein the encoded instructions further cause the spectroscopy analysis system to update the subset to include an additional measurement from other areas of the grid.

46. The apparatus of claim 45 , wherein the encoded instructions further cause the spectroscopy analysis system to generate an optimized trajectory of a tip of a probe to facilitate minimizing a scanning time.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2024
From: LABOUESSE, SIMON
To: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE
Reel/Frame 069620/0075 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2024
From: PIESTUN, RAFAEL; RASCHKE, MARKUS B.; MULLER, ERIC; JOHNSON, SAMUEL
To: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE
Reel/Frame 067199/0556 →
CONFIRMATORY LICENSE Recorded Jun 7, 2023
From: UNIVERSITY OF COLORADO
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 063903/0616 →
Continuity (3)
Continuation In Part PCTUS2019034200 · May 28, 2019
Provisional Application 62676675 · May 25, 2018
Related Publication 20210080484A1 · Mar 18, 2021