Method for manufacturing a display device
A plurality of thin film transistors provided in a peripheral region are first staggered thin film transistors where a first channel layer configured of low-temperature polysilicon is included, and the first channel layer is not interposed between a first source electrode and a first gate electrode, and between a first drain electrode and the first gate electrode. A plurality of thin film transistors provided in a display region are second staggered thin film transistors where a second channel layer configured of an oxide semiconductor is included, and the second channel layer is not interposed between a second source electrode and a second gate electrode, and between a second drain electrode and the second gate electrode. The first thin film transistor is located below the second thin film transistor.
1. A method for manufacturing a display device including a display region for displaying an image and a peripheral region which is outside of the display region, the method comprising:
forming a first thin transistor where a first channel layer configured of low-temperature polysilicon is included, and the first channel layer is not interposed between a first source electrode and a first gate electrode, and between a first drain electrode and the first gate electrode, in the peripheral region;
forming a second thin film transistor where a second channel layer configured of an oxide semiconductor is included, and the second channel layer is not interposed between a second source electrode and a second gate electrode, and between a second drain electrode and the second gate electrode, in the display region, after forming the first thin film transistor;
forming a plurality of pixel electrodes in the display region, after forming the second thin film transistor;
forming a light-emitting element layer on the plurality of pixel electrodes; and
forming a common electrode on the light-emitting element laver,
wherein in the forming of the first thin film transistor in the peripheral region, a conductive layer is formed by forming the low-temperature polysilicon layer and injecting ions into the low-temperature poly silicon layer in the display region.
2. The method for manufacturing a display device according to claim 1 ,
wherein the conductive layer is formed to have a size overlapping a whole of the second thin film transistor.
3. The method for manufacturing a display device according to claim 1 ,
wherein in the forming of the first thin film transistor in the peripheral region, a second conductive layer that is used as an electrode for forming a capacitor along with the conductive layer is formed, at the same time as the forming of the first gate electrode.
4. A method for manufacturing a display device including a display region, for displaying an image and a peripheral region which is outside of the display region, the method comprising:
forming a respective first thin film transistor where a first channel layer configured of low-temperature polysilicon is included, and the first channel layer is not interposed between a first source electrode and a first gate electrode, and between a first drain electrode and the first gate electrode, in each of the peripheral region and the display region;
forming a second thin film transistor where a second channel layer configured of an oxide semiconductor is included, and the second channel layer is not interposed between a second source electrode and a second gate electrode, and between a second drain electrode and the second gate electrode, in the display region, after forming the first thin film transistor;
forming a plurality of pixel electrodes in the display region, after forming the second thin film transistor;
forming a light-emitting element layer on the plurality of pixel electrodes; and
forming a common electrode on the light-emitting element layer.
5. A method for manufacturing a display device including a display region for displaying an image and a peripheral region which is outside of the display region, the method comprising:
forming a first thin film transistor where a first channel layer configured of low-temperature polysilicon is included, and the first channel layer is not interposed between a first source electrode and a first gate electrode, and between a first drain electrode and the first gate electrode, in the peripheral region;
forming a second thin film transistor where a second channel layer configured of an oxide semiconductor is included, and the second channel layer is not interposed between a second source electrode and a second gate electrode and between a second drain electrode and the second gate electrode, in the display region, after forming the first thin film transistor;
forming a plurality of pixel electrodes in the display region, after forming the second thin film transistor;
forming a light-emitting element layer on the plurality of pixel electrodes; and
forming a common electrode on the light-emitting element layer,
wherein in the forming of the second thin film transistor in the display region,
a through-hole reaching to an upper surface of the first channel layer from an insulating layer below the second gate electrode is formed, before forming the second gate electrode,
a contact plug is formed within the through-hole, at the same time as the forming of the second gate electrode, and
a metal layer is formed to overlap at least an end portion of the first channel layer of the first thin film transistor by being integrated with the contact plug.