Method and apparatus for multi-color discrete frequency infrared spectroscopic imaging
View Patent ↗The disclosure is directed to methods and apparatus for obtaining a discrete frequency infrared (DFIR) spectroscopic image. The method includes generating, by a laser source, a pulsed laser beam comprising a spectral frequency in a mid-IR region and a pulse repetition rate; transmitting, by a first group of optical components, the pulsed laser beam onto a location of a sample; collecting, by a second group of optical components, an optical signal emitting from the location of the sample onto a detector to obtain a raw electric signal; demodulating, by a demodulator based on the pulse repetition rate, the raw electric signal to obtain an intensity value; and determining, by a control device and based on the intensity value, a pixel value corresponding to the spectral frequency in a DFIR spectroscopic image.
1. A method for obtaining a discrete frequency infrared (DFIR) spectroscopic image for a sample, the method comprising:
generating, by a first laser source, a first pulsed laser beam comprising a first spectral frequency in a mid-IR region and a first pulse repetition rate;
transmitting, by a first group of optical components, the first pulsed laser beam onto a first location of a sample;
collecting, by a second group of optical components, first optical signal at the first spectral frequency emitting from the first location of the sample onto a detector to obtain first raw electric signal;
demodulating, by a first demodulator based on the first pulse repetition rate, the first raw electric signal to obtain a first intensity value corresponding to the first location of the sample; and
determining, by a control device comprising a memory storing instructions and a processor in communication with the memory and based on the first intensity value, a first pixel value corresponding to the first spectral frequency in a DFIR spectroscopic image corresponding to the first location of the sample.
2. The method according to claim 1 , further comprising:
generating, by a second laser source, a second pulsed laser beam comprising a second spectral frequency in the mid-IR region and the first pulse repetition rate;
transmitting, by the first group of optical components, the second pulsed laser beam onto the first location of the sample;
collecting, by the second group of optical components, second optical signal emitting from the first location of the sample onto the detector to obtain second raw electric signal;
demodulating, by the first demodulator based on the first pulse repetition rate, the second raw electric signal to obtain a second intensity value corresponding to the first location of the sample; and
determining, by the control device and based on the second intensity value, a second pixel value corresponding to the second spectral frequency in the DFIR spectroscopic image corresponding to the first location of the sample,
wherein:
the first spectral frequency and the second spectral frequency are different, and
the first pulsed laser beam and the second pulsed laser beam are transmitted onto the first location of the sample in a sequential manner.
3. The method according to claim 1 , further comprising:
generating, by a second laser source, a second pulsed laser beam comprising a second spectral frequency in the mid-IR region and a second pulse repetition rate;
transmitting, by the first group of optical components, the second pulsed laser beam onto the first location of the sample;
collecting, by the second group of optical components, second optical signal emitting from the first location of the sample onto the detector to obtain second raw electric signal;
demodulating, by a second demodulator based on the second pulse repetition rate, the second raw electric signal to obtain a second intensity value corresponding to the first location of the sample; and
determining, by the control device and based on the second intensity value, a second pixel value corresponding to the second spectral frequency in the DFIR spectroscopic image corresponding to the first location of the sample,
wherein:
the first spectral frequency and the second spectral frequency are different,
the first pulse repetition rate and the second pulse repetition rate are different, and
the first pulsed laser beam and the second pulsed laser beam are transmitted onto the first location of the sample simultaneously.
4. The method according to claim 1 , further comprising:
determining, by the control device, a plurality of pixel values corresponding to the first spectral frequency of the DFIR spectroscopic image based on a plurality of intensity values for a plurality of locations of the sample by at least one of the following:
sweeping, by a movable stage holding the sample, the sample relative to the first pulsed laser beam; or
steering, by at least one rotatable mirror in the first group of optical components, the first pulsed laser beam on the sample.
5. The method according to claim 4 , wherein:
the movable stage is in a sweeping motion following a third order trajectory so that the sample is moved in a s-curve.
6. The method according to claim 5 , wherein:
the sweeping motion is along a long axis of a field of interest (FOI) on the sample.
7. The method according to claim 1 , wherein:
the first laser source comprises at least one of the following:
a quantum cascade laser (QCL);
an optical parametric oscillator (OPO); or
an interband cascade laser (ICL).
8. The method according to claim 1 , wherein:
the detector comprises at least one of the following:
a mercury cadmium telluride (MCT) detector;
an uncooled bolometer; or
a visible detector in conjunction with a visible laser.
9. The method according to claim 1 , wherein:
the first group of optical components comprises rotatable mirrors to adjust a pointing angle of the first pulsed laser beam;
the first pulsed laser beam is transmitted onto the sample in a epi-illumination mode; and
the first group of optical components and the second group of optical components comprises at least one common optical component.
10. The method according to claim 1 , wherein:
a lock-in amplifier comprises the first demodulator to demodulate the first raw electric signal from background to obtain the first intensity value based on the first pulse repetition rate.
11. An apparatus for obtaining a discrete frequency infrared (DFIR) spectroscopic image for a sample, the apparatus comprising:
a first laser sources configured to generate a first pulsed laser beam comprising a first spectral frequency in a mid-IR region and a first pulse repetition rate;
a first group of optical components configured to transmit the first pulsed laser beam onto a first location of a sample;
a second group of optical components configured to collect first optical signal at the first spectral frequency emitting from the first location of the sample onto a detector to obtain first raw electric signal;
a first demodulator configured to demodulate, based on the first pulse repetition rate, the first raw electric signal to obtain a first intensity value corresponding to the first location of the sample; and
a control device configured to determine, based on the first intensity value, a first pixel value corresponding to the first spectral frequency in a DFIR spectroscopic image corresponding to the first location of the sample.
12. The apparatus according to claim 11 , further comprising:
a second laser source configured to generate a second pulsed laser beam comprising a second spectral frequency in the mid-IR region and the first pulse repetition rate, wherein:
the first group of optical components is configured to transmit the second pulsed laser beam onto the first location of the sample;
the second group of optical components is configured to collect second optical signal emitting from the first location of the sample onto the detector to obtain second raw electric signal;
the first demodulator is configured to demodulate, based on the first pulse repetition rate, the second raw electric signal to obtain a second intensity value corresponding to the first location of the sample;
the control device is configured to determine, based on the second intensity value, a second pixel value corresponding to the second spectral frequency in the DFIR spectroscopic image corresponding to the first location of the sample;
the first spectral frequency and the second spectral frequency are different; and
the first pulsed laser beam and the second pulsed laser beam are transmitted onto the first location of the sample in a sequential manner.
13. The apparatus according to claim 11 , further comprising:
a second laser source is configured to generate a second pulsed laser beam comprising a second spectral frequency in the mid-IR region and a second pulse repetition rate, wherein:
the first group of optical components is configured to transmit the second pulsed laser beam onto the first location of the sample;
the second group of optical components is configured to collect second optical signal emitting from the first location of the sample onto the detector to obtain second raw electric signal;
a second demodulator is configured to demodulate, based on the second pulse repetition rate, the second raw electric signal to obtain a second intensity value corresponding to the first location of the sample;
the control device is configured to determine, based on the second intensity value, a second pixel value corresponding to the second spectral frequency in the DFIR spectroscopic image corresponding to the first location of the sample;
the first spectral frequency and the second spectral frequency are different;
the first pulse repetition rate and the second pulse repetition rate are different; and
the first pulsed laser beam and the second pulsed laser beam are transmitted onto the first location of the sample simultaneously.
14. The apparatus according to claim 11 , wherein:
the control device is further configured to determine a plurality of pixel values corresponding to the first spectral frequency of the DFIR spectroscopic image based on a plurality of intensity values for a plurality of locations of the sample by at least one of the following:
sweeping, by a movable stage holding the sample, the sample relative to the first pulsed laser beam; or
steering, by at least one rotatable mirror in the first group of optical components, the first pulsed laser beam on the sample.
15. The apparatus according to claim 14 , wherein:
the movable stage is in a sweeping motion following a third order trajectory so that the sample is moved in a s-curve.
16. The apparatus according to claim 15 , wherein:
the sweeping motion is along a long axis of a field of interest (FOI) on the sample.
17. The apparatus according to claim 11 , wherein:
the first laser source comprises at least one of the following:
a quantum cascade laser (QCL);
an optical parametric oscillator (OPO); or
an interband cascade laser (ICL).
18. The apparatus according to claim 11 , wherein:
the detector comprises at least one of the following:
a mercury cadmium telluride (MCT) detector;
an uncooled bolometer; or
a visible detector in conjunction with a visible laser.
19. The apparatus according to claim 11 , wherein:
the first group of optical components comprises rotatable mirrors to adjust a pointing angle of the first pulsed laser beam;
the first pulsed laser beam is transmitted onto the sample in a epi-illumination mode; and
the first group of optical components and the second group of optical components comprises at least one common optical component.
20. The apparatus according to claim 11 , wherein:
a lock-in amplifier comprises the first demodulator to demodulate the first raw electric signal from background to obtain the first intensity value based on the first pulse repetition rate.