IP Library Granted Patent US 11,815,568
Granted Patent B2
US 11,815,568 · App. 17/135,628 · Granted Nov 14, 2023

System and method for fast magnetometer calibration using gyroscope

Inventors: Mahaveer Jain (Santa Clara, CA); Mahesh Chowdhary (San Jose, CA)
Assignee: STMicroelectronics, Inc.
G01R33/0035G01C25/005
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Quick Facts
Patent No.
US 11,815,568
App. No.
17/135,628
Granted
Nov 14, 2023
Kind
B2
Abstract

An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman filter process. The electronic device generates a second magnetometer calibration parameter based on a least squares estimation process.

Claims (32)

1. A method, comprising:

generating gyroscope sensor signals with a gyroscope of an electronic device;

generating magnetometer sensor signals with a magnetometer of the electronic device;

estimating a first magnetometer calibration parameter by performing a Kalman filter process with the gyroscope sensor signals and the magnetometer sensor signals;

estimating a second magnetometer calibration parameter by performing a least squares process with the gyroscope sensor signals and the magnetometer sensor signals;

validating the first and second magnetometer calibration parameters by analyzing a convergence between the first magnetometer calibration parameter and the second magnetometer calibration parameter; and

simultaneously operating multiple instances of the Kalman filter and the least squares process, wherein the multiple instances of the Kalman filter and the least squares process are offset from each other in time, wherein simultaneously operating multiple instances of the Kalman filter and least squares process includes continuously calibrating the magnetometer.

2. The method of claim 1 , wherein estimating the first magnetometer calibration parameter includes determining a hard iron offset.

3. The method of claim 2 , wherein estimating the hard iron offset includes minimizing an error constraint on a total magnetic field based, in part, on the gyroscope sensor signals.

4. The method of claim 1 , wherein estimating the second magnetometer calibration includes determining a hard iron offset.

5. The method of claim 4 , wherein estimating the hard iron offset includes minimizing an error between a first derivative of magnetic field and a gyroscope propagated magnetic field.

6. The method of claim 1 , wherein validating the first and second magnetometer calibration parameters includes determining a difference between the first and second magnetometer calibration parameters.

7. The method of claim 1 , further comprising determining an orientation of the electronic device based on the first and second magnetometer calibration parameters.

8. An electronic device, comprising:

a gyroscope configured to output gyroscope sensor signals;

a magnetometer configured to output magnetometer sensor signals; and

a magnetometer calibration module configured to receive the gyroscope sensor signals and the magnetometer sensor signals and to generate a first magnetometer calibration parameter with a Kalman filter process with the gyroscope sensor signals and the magnetometer sensor signals and to generate a second magnetometer calibration parameter based on a least squares process with the gyroscope sensor signals and the magnetometer sensor signals, wherein the magnetometer calibration module is configured to simultaneously operate multiple instances of the Kalman filter process and the least squares process to continuously calibrate the magnetometer, wherein the multiple instances of the Kalman filter and the least squares process are offset from each other in time.

9. The electronic device of claim 8 , wherein the magnetometer calibration module is configured to validate the first and second magnetometer calibration parameters based on a convergence of the first magnetometer calibration parameter and the second magnetometer calibration parameter.

10. The electronic device of claim 9 , further comprising a sensor processor configured to receive the at least one of the first and second magnetometer calibration parameters and to determine an orientation of the magnetometer based on at least one of the first and second magnetometer calibration parameters.

11. The electronic device of claim 8 , wherein the magnetometer calibration module is configured to determine a first hard iron offset with the Kalman filter process.

12. The electronic device of claim 11 , wherein the magnetometer calibration module is configured to determine a second hard iron offset with the least squares process.

13. The electronic device of claim 8 , further comprising:

at least one memory configured to store software instructions; and

at least one processor configured to execute the software instructions, wherein the magnetometer calibration module is a software module implemented by executing the software instructions with the at least one processor.

14. A method, comprising:

generating a first magnetometer calibration parameter by performing a Kalman filter process on gyroscope sensor signals and magnetometer sensor signals;

generating a second magnetometer calibration parameter by performing a least squares process with the gyroscope sensor signals and the magnetometer sensor signals;

validating the first and second magnetometer calibration parameters by comparing the first and second magnetometer calibration parameters; and

determining an orientation of an electronic device based on the magnetometer sensor signals and at least one of the first and second magnetometer calibration parameters; and

continuously calibrate the magnetometer sensor by simultaneously operating multiple instances of the Kalman filter and the least squares process, wherein the multiple instances of the Kalman filter and the least squares process are offset from each other in time.

15. The method of claim 14 , further comprising determining a heading of the electronic device based on the magnetometer sensor signals and at least one of the first and second magnetometer calibration parameters.

16. The method of claim 14 , wherein the electronic device is a virtual reality headset or an augmented reality headset.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2023
From: JAIN, MAHAVEER; CHOWDHARY, MAHESH
To: STMICROELECTRONICS, INC.
Reel/Frame 062458/0685 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2020
From: JAIN, MAHAVEER; CHOWDHARY, MAHESH
To: STMICROELECTRONICS, INC.
Reel/Frame 054768/0880 →
Continuity (1)
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