IP Library Granted Patent US 11,443,415
Granted Patent B2
US 11,443,415 · App. 17/142,703 · Granted Sep 13, 2022

Inspection method, computer-readable recording medium, and reference standard plate

Inventor: Masaru Mizunaka (Tokyo, JP)
Assignee: OLYMPUS CORPORATION
G06T7/0002H04N17/002G06T2207/30242
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Quick Facts
Patent No.
US 11,443,415
App. No.
17/142,703
Granted
Sep 13, 2022
Kind
B2
Abstract

An inspection method for inspecting a counting function of an imaging system that captures an image of a phase object includes: capturing an image of a reference standard plate that includes a base region and a plurality of counting target regions having a phase amount in a thickness direction different from a phase amount of the base region, under a condition where the number of counting target regions positioned within a field of view of the imaging system is specified among the plurality of counting target regions; counting the counting target regions included in the captured image of the reference standard plate; and outputting at least a counted result of the counting target regions.

Claims (42)

1. An inspection method of an imaging system, the inspection method comprising:

capturing, by an image sensor of the imaging system, an image of a reference standard plate,

wherein the reference standard plate comprises a base region and a plurality of counting target regions regularly arranged on the base region, the plurality of counting target regions having a phase amount in a thickness direction different from a phase amount of the base region, and

wherein a known number of counting target regions among the plurality of counting target regions is positioned within a field of view of the image sensor of the imaging system;

performing, by a processor of the imaging system, a counting function of counting a number of counting target regions included in the image of the reference standard plate;

performing, by the processor, a comparison of the number of counting target regions included in the image of the reference standard plate and the known number of counting target regions positioned within the field of view of the imaging system; and

determining, by the processor, a reliability of the counting function based on a result of the comparison.

2. The inspection method according to claim 1 ,

wherein determining the reliability of the counting function comprises determining, by the processor, a first evaluation result regarding accuracy of count based on a result of the counting function and the known number of counting target regions.

3. The inspection method according to claim 1 ,

wherein determining the reliability of the counting function comprises determining, by the processor, a second evaluation result regarding precision of count based on a result of the counting function.

4. The inspection method according to claim 2 ,

wherein determining the reliability of the counting function comprises determining, by the processor, a second evaluation result regarding precision of count based on a result of the counting function.

5. The inspection method according to claim 1 ,

wherein capturing the image of the reference standard plate comprises capturing, by the image sensor, the image of the reference standard plate where an imaging magnification of the image sensor is known.

6. The inspection method according to claim 2 ,

wherein capturing the image of the reference standard plate comprises capturing, by the image sensor, the image of the reference standard plate where an imaging magnification of the image sensor is known.

7. The inspection method according to claim 3 ,

wherein capturing the image of the reference standard plate comprises capturing, by the image sensor, the image of the reference standard plate where an imaging magnification of the image sensor is known.

8. The inspection method according to claim 4 ,

wherein capturing the image of the reference standard plate comprises capturing, by the image sensor, the image of the reference standard plate where an imaging magnification of the image sensor is known.

9. The inspection method according to claim 1 ,

wherein capturing the image of the reference standard plate comprises capturing the image of the reference standard plate disposed at a prescribed position with respect to the field of view where an imaging magnification of the image sensor is known.

10. The inspection method according to claim 1 ,

wherein each of the plurality of counting target regions has a thickness different from a thickness of the base region.

11. The inspection method according to claim 10 , wherein the each of the plurality of counting target regions includes a micro lens.

12. The inspection method according to claim 1 ,

wherein each of the plurality of counting target regions has a refractive index different from a refractive index of the base region.

13. The inspection method according to claim 1 ,

wherein capturing the image of the reference standard plate comprises capturing, by the imaging sensor, the image of the reference standard plate by using any one of a phase-contrast observation method, a differential interference contrast observation method, an oblique illumination observation method, a bright-field observation method, and a dark-field observation method.

14. The inspection method according to claim 13 ,

wherein performing the counting function comprises changing an algorithm for counting the number of counting target regions included in the image according to a size of the plurality of counting target regions.

15. The inspection method according to claim 1 , wherein:

the base region is formed of a phase object; and

the plurality of counting target regions are formed of phase objects.

16. A non-transitory computer-readable recording medium recording a program for inspecting a counting function of an imaging system, wherein the program causes a computer of the imaging system to at least perform:

causing an image sensor of the imaging system to capture an image of a reference standard plate,

wherein the reference standard plate comprises a base region and a plurality of counting target regions regularly arranged on the base region, the plurality of counting target regions having a phase amount in a thickness direction different from a phase amount of the base region, and

wherein a known number of counting target regions among the plurality of counting target regions is positioned within a field of view of the image sensor of the imaging system;

performing a counting function of counting a number of counting target regions included in the image of the reference standard plate;

performing a comparison of the number of counting target regions included in the image of the reference standard plate and the known number of counting target regions positioned within the field of view of the imaging system; and

determining a reliability of the counting function based on a result of the comparison.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 7, 2022
From: OLYMPUS CORPORATION
To: EVIDENT CORPORATION
Reel/Frame 061396/0129 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2021
From: MIZUNAKA, MASARU
To: OLYMPUS CORPORATION
Reel/Frame 054830/0366 →
Priority Claims (1)
JP JP2020-000657 · Jan 7, 2020 · national
Continuity (1)
Related Publication 20210209743A1 · Jul 8, 2021