IP Library Patent Application 17143341
Patent Application
App. No. 17/143,341

IMAGE SENSOR PACKAGE HAVING INNER AND OUTER JOINT MEMBERS

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Quick Facts
Patent No.
US None
App. No.
17/143,341
Abstract

According to an aspect, an image sensor package includes a substrate, an image sensor die coupled to the substrate, a light-transmitting member, an inner joint member disposed between the light-transmitting member and the image sensor die, and an outer joint member disposed between the light-transmitting member and the substrate.

Claims (41)

1 . An image sensor package comprising:

a substrate;

an image sensor die coupled to the substrate;

a light-transmitting member;

an inner joint member disposed between the light-transmitting member and the image sensor die; and

an outer joint member disposed between the light-transmitting member and the substrate.

2 . The image sensor package of claim 1 , further comprising:

a conductive trace coupled to a surface of the light-transmitting member, the conductive trace being coupled to the inner joint member and the outer joint member.

3 . The image sensor package of claim 1 , wherein the image sensor die is coupled to the substrate in a flip-chip configuration.

4 . The image sensor package of claim 1 , wherein the inner joint member has a size smaller than a size of the outer joint member.

5 . The image sensor package of claim 1 , wherein the inner joint member includes a conductive ball member.

6 . The image sensor package of claim 1 , wherein the inner joint member includes a conductive pillar.

7 . The image sensor package of claim 1 , wherein the outer joint member includes a conductive ball member.

8 . The image sensor package of claim 1 , further comprising:

an encapsulation material disposed between the inner joint member and the outer joint member.

9 . The image sensor package of claim 1 , wherein the image sensor package is an interstitial ball grid array (iBGA) package.

10 . An image sensor package comprising:

a substrate;

an image sensor die coupled to the substrate, the image sensor die having an active region and a non-active region;

a light-transmitting member having a first surface and second surface;

a conductive trace coupled to the second surface of the light-transmitting member;

an inner joint member disposed between and connected to the non-active region of the image sensor die and the conductive trace; and

an outer joint member disposed between and connected to the conductive trace and the substrate.

11 . The image sensor package of claim 10 , wherein the image sensor die is a complementary metal oxide semiconductor (CMOS) image sensor die, and the CMOS image sensor die is coupled to the substrate in a flip-chip configuration.

12 . The image sensor package of claim 10 , wherein the inner joint member includes a conductive ball member.

13 . The image sensor package of claim 10 , wherein the inner joint member includes a conductive pillar.

14 . The image sensor package of claim 10 , wherein the outer joint member includes a conductive ball member.

15 . The image sensor package of claim 10 , further comprising:

an encapsulation material, the encapsulation material including an inner molding disposed between the inner joint member and the outer joint member, the encapsulation material including an outer molding that contacts edges of the light-transmitting member.

16 . The image sensor package of claim 10 , wherein the substrate includes a first surface and a second surface, the first surface of the substrate being coupled to the image sensor die, the image sensor package further comprising:

a plurality of conductive components coupled to the second surface of the substrate, the plurality of conductive components configured to be coupled to an external device.

17 . The image sensor package of claim 10 , wherein the image sensor package is devoid of bond wires.

18 . A method for assembling an image sensor package, the method comprising:

forming a conductive trace on a light-transmitting member via a lithography process;

coupling an inner joint member to a first portion of the conductive trace;

coupling an image sensor die to the inner joint member;

coupling an outer joint member to a second portion of the conductive trace; and

coupling a substrate to the outer joint member and the image sensor die.

19 . The method of claim 18 , further comprising:

applying an encapsulation material to the image sensor package, the encapsulation material including an inner molding disposed between the outer joint member and the inner joint member.

20 . The method of claim 19 , wherein the inner joint member includes a conductive ball member or a conductive pillar, and the outer joint member includes a conductive ball member.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 056595, FRAME 0177 Recorded Aug 16, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 064615/0564 →
SECURITY INTEREST Recorded Jun 15, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 056595/0177 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2021
From: HSIEH, YU-TE
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 054844/0136 →