IP Library › Patent Application 17147218
Patent Application
App. No. 17/147,218

COMMUNICATION METHOD AND DEVICE

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Patent No.
US None
App. No.
17/147,218
Abstract

Embodiments of this application relate to the field of communications technologies and disclose a communication method and a device. The method includes: determining an offset based on a first quantity, wherein the first quantity is a quantity of beams that are used to determine signal quality of a first cell; and determining the signal quality of the first cell based on the offset.

Claims (39)

1 . A communication method comprising:

determining, by a terminal, first signal quality of a first cell based on a first quantity of beams in the first cell;

determining, by the terminal, an offset based on the first quantity; and

determining, by the terminal, second signal quality of the first cell based on the offset and the first signal quality.

2 . The method according to claim 1 , wherein determining the offset based on the first quantity comprises:

determining a coefficient of basic measurement offset delta based on the first quantity; and

multiplying the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.

3 . The method according to claim 2 , wherein determining the second signal quality of the first cell comprises: adjusting, by the terminal using the offset corresponding to the first quantity, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.

4 . The method according to claim 1 , wherein determining the second signal quality of the first cell comprises: adjusting, by the terminal using the offset, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.

5 . The method according to claim 4 , wherein the beam has highest signal quality among the first quantity of beams in the first cell with signal quality of each beam of the first quantity of beams below a first preset threshold.

6 . The method according to claim 5 , wherein the beam having the highest signal quality among the first quantity of beams in the first cell is X beams whose signal quality has a smallest difference from the first preset threshold, the X beams belong to the first cell, and X is an integer greater than 0.

7 . The method according to claim 6 , wherein X is equal to 1.

8 . The method according to claim 4 , wherein when there is at least one beam, among the first quantity of beams, whose signal quality is higher than a preset threshold, the signal quality directly obtained based on the beam is obtained based on an average value of the signal quality of the at least one beam.

9 . The method according to claim 1 , further comprising: sending the second signal quality of the first cell.

10 . An apparatus, comprising:

a non-transitory memory storage comprising instructions; and

one or more processors in communication with the memory storage, wherein the one or more processors execute the instructions to cause the apparatus to:

determine first signal quality of a first cell based on a first quantity of beams in the first cell;

determine an offset based on the first quantity; and

determine second signal quality of the first cell based on the offset and the first signal quality.

11 . The apparatus according to claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to:

determine a coefficient of basic measurement offset delta based on the first quantity; and

multiply the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.

12 . The apparatus according to claim 11 , wherein the one or more processors further execute the instructions to cause the apparatus to:

adjust, by using the offset corresponding to the first quantity, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.

13 . The apparatus according to claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to:

adjust, by using the offset, signal quality directly obtained based on a beam of the first quantity of beams, to obtain the second signal quality of the first cell.

14 . The apparatus according to claim 13 , wherein the beam has highest signal quality among the first quantity of beams in the first cell with signal quality of each beam of the first quantity of beams below a first preset threshold.

15 . The apparatus according to claim 14 , wherein the beam having the highest signal quality among the first quantity of beams in the first cell is X beams whose signal quality has a smallest difference from the first preset threshold, the X beams belong to the first cell, and X is an integer greater than 0.

16 . The apparatus according to claim 15 , wherein X is equal to 1.

17 . The apparatus according to claim 13 , wherein when there is at least one beam, among the first quantity of beams, whose signal quality is higher than a preset threshold, the signal quality directly obtained based on the beam is obtained based on an average value of the signal quality of the at least one beam.

18 . The apparatus according to claim 10 , wherein the one or more processors further execute the instructions to cause the apparatus to: send the second signal quality of the first cell.

19 . A non-transitory computer-readable storage medium storing a program to be executed by a processor, the program including instructions for:

determining first signal quality of a first cell based on a first quantity of beams in the first cell;

determining an offset based on the first quantity; and

determining second signal quality of the first cell based on the offset and the first signal quality.

20 . The storage medium according to claim 19 , wherein the program further includes instructions for:

determining a coefficient of basic measurement offset delta based on the first quantity; and

multiplying the coefficient by the basic measurement offset delta to obtain the offset corresponding to the first quantity.