IP Library › Granted Patent US 11,836,290
Granted Patent B2
US 11,836,290 · App. 17/157,304 · Granted Dec 5, 2023

Spread spectrum sensor scanning using resistive-inductive-capacitive sensors

Inventors: Michael A. Kost (Austin, TX); Bruce E. Duewer (Austin, TX); Tejasvi Das (Austin, TX); Matthew Beardsworth (Austin, TX); Anthony S. Doy (Austin, TX)
Assignee: Cirrus Logic Inc.
G06F3/016G01D5/14G01D5/16G01D5/20G01D5/24
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Quick Facts
Patent No.
US 11,836,290
App. No.
17/157,304
Granted
Dec 5, 2023
Kind
B2
Abstract

A system may include at least one resistive-inductive-capacitive sensor and a control circuit configured to maintain timing parameters for operation of the at least one resistive-inductive-capacitive sensor and vary at least one of the timing parameters to control a spectrum associated with the at least one resistive-inductive-capacitive sensor, wherein the spectrum comprises one of a sensor activity spectrum of the at least one resistive-inductive-capacitive sensor and a current usage spectrum associated with electrical current delivered to the at least one resistive-inductive-capacitive sensor from a source of electrical energy.

Claims (54)

1. A system comprising:

at least one resistive-inductive-capacitive sensor in electrical communication with a human-machine interface such that human interaction with the human-machine interface causes a displacement in a mechanical member of the human-machine interface which in turn causes variance in an impedance of the at least one resistive-inductive-capacitive sensor; and

a control circuit configured to:

maintain timing parameters for operation of the at least one resistive-inductive-capacitive sensor; and

vary at least one of the timing parameters to control a spectrum associated with the at least one resistive-inductive-capacitive sensor, wherein the spectrum comprises one of a sensor activity spectrum of the at least one resistive-inductive-capacitive sensor and a current usage spectrum associated with electrical current delivered to the at least one resistive-inductive-capacitive sensor from a source of electrical energy.

2. The system of claim 1 , wherein the timing parameters comprise at least one of:

an order in which the at least one resistive-inductive-capacitive sensor is scanned during a scan period;

a time between successive observations of two resistive-inductive-capacitive sensors of the at least one resistive-inductive-capacitive sensor;

a time between successive observations of particular resistive-inductive-capacitive sensors; and

a duration within the scan period for observing a particular resistive-inductive-capacitive sensor of the at least one resistive-inductive-capacitive sensor.

3. The system of claim 1 , wherein within the duration within the scan period for observing a particular resistive-inductive-capacitive sensor of the at least one resistive-inductive-capacitive sensor, a driving signal for driving the at least one resistive-inductive-capacitive sensor is increased from a beginning of the duration to a maximum drive strength and decreased from the maximum drive strength until an end of the duration.

4. The system of claim 1 , wherein the control circuit is configured to randomly vary at least one of the timing parameters.

5. The system of claim 1 , wherein the control circuit is configured to pseudo-randomly vary at least one of the timing parameters.

6. The system of claim 1 , wherein the control circuit is configured to pseudo-randomly vary at least one of the timing parameters using a linear-feedback shift register.

7. The system of claim 1 , wherein the control circuit is configured to vary at least one of the timing parameters in accordance with a fixed repeating pattern.

8. The system of claim 1 , wherein the timing parameters comprise at least one of a presence, duration, and position of an unused slot in which none of the at least one resistive-inductive-capacitive sensors is active.

9. The system of claim 1 , further comprising:

a driver configured to drive the at least one resistive-inductive-capacitive sensor at a driving frequency;

a measurement circuit communicatively coupled to the at least one resistive-inductive-capacitive sensor and configured to:

measure phase information associated with the at least one resistive-inductive-capacitive sensor; and

based on the phase information, determine a displacement of a mechanical member relative to the at least one resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the at least one resistive-inductive-capacitive sensor.

10. The system of claim 9 , wherein the at least one resistive-inductive-capacitive sensor comprises a plurality of resistive-inductive-capacitive sensors, and the control circuit is configured to maintain the timing parameters in order to:

time-division multiplex drive the plurality of resistive-inductive-capacitive sensors; and

time-division multiplex measure by the measurement circuit the phase information associated with each of the plurality of resistive-inductive-capacitive sensors.

11. A method comprising:

maintaining timing parameters for operation of at least one resistive-inductive-capacitive sensor in electrical communication with a human-machine interface such that human interaction with the human-machine interface causes a displacement in a mechanical member of the human-machine interface which in turn causes variance in an impedance of the at least one resistive-inductive-capacitive sensor; and

varying at least one of the timing parameters to control a spectrum associated with the at least one resistive-inductive-capacitive sensor, wherein the spectrum comprises one of a sensor activity spectrum of the at least one resistive-inductive-capacitive sensor and a current usage spectrum associated with electrical current delivered to the at least one resistive-inductive-capacitive sensor from a source of electrical energy.

12. The method of claim 11 , wherein the timing parameters comprise at least one of:

an order in which the at least one resistive-inductive-capacitive sensor is scanned during a scan period;

a time between successive observations of two resistive-inductive-capacitive sensors of the at least one resistive-inductive-capacitive sensor;

a time between successive observations of particular resistive-inductive-capacitive sensors; and

a duration within the scan period for observing a particular resistive-inductive-capacitive sensor of the at least one resistive-inductive-capacitive sensor.

13. The method of claim 11 , wherein within the duration within the scan period for observing a particular resistive-inductive-capacitive sensor of the at least one resistive-inductive-capacitive sensor, a driving signal for driving the at least one resistive-inductive-capacitive sensor is increased from a beginning of the duration to a maximum drive strength and decreased from the maximum drive strength until an end of the duration.

14. The method of claim 11 , further comprising randomly varying at least one of the timing parameters.

15. The method of claim 11 , further comprising pseudo-randomly varying at least one of the timing parameters.

16. The method of claim 11 , further comprising pseudo-randomly varying at least one of the timing parameters using a linear-feedback shift register.

17. The method of claim 11 , further comprising varying at least one of the timing parameters in accordance with a fixed repeating pattern.

18. The method of claim 11 , wherein the timing parameters comprise at least one of a presence, duration, and position of an unused slot in which none of the at least one resistive-inductive-capacitive sensors is active.

19. The method of claim 11 , further comprising:

driving the at least one resistive-inductive-capacitive sensor at a driving frequency;

measuring phase information associated with the at least one resistive-inductive-capacitive sensor; and

based on the phase information, determining a displacement of a mechanical member relative to the at least one resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the at least one resistive-inductive-capacitive sensor.

20. The method of claim 19 , wherein the at least one resistive-inductive-capacitive sensor comprises a plurality of resistive-inductive-capacitive sensors, and the method further comprises maintaining the timing parameters in order to:

time-division multiplex drive the plurality of resistive-inductive-capacitive sensors; and

time-division multiplex measure by the measurement circuit the phase information associated with each of the plurality of resistive-inductive-capacitive sensors.

21. A host device comprising:

an enclosure;

a human-machine interface;

a resonant phase sensing system integral to the enclosure and comprising:

at least one resistive-inductive-capacitive sensor in electrical communication with the human-machine interface such that human interaction with the human-machine interface causes a displacement in a mechanical member of the human-machine interface which in turn causes variance in an impedance of the at least one resistive-inductive-capacitive sensor; and

a driver configured to drive the at least one resistive-inductive-capacitive sensor with a driving signal at a driving frequency; and

a control circuit configured to:

maintain timing parameters for operation of the at least one resistive-inductive-capacitive sensor; and

vary at least one of the timing parameters to control a spectrum associated with the at least one resistive-inductive-capacitive sensor, wherein the spectrum comprises one of a sensor activity spectrum of the at least one resistive-inductive-capacitive sensor and a current usage spectrum associated with electrical current delivered to the at least one resistive-inductive-capacitive sensor from a source of electrical energy.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2023
From: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
To: CIRRUS LOGIC, INC.
Reel/Frame 064864/0839 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2021
From: KOST, MICHAEL A.; DUEWER, BRUCE E.; DAS, TEJASVI; BEARDSWORTH, MATTHEW; DOY, ANTHONY S.
To: CIRRUS LOGIC INTERNATIONAL SEMICONDUCTOR LTD.
Reel/Frame 055021/0515 →
Continuity (3)
Continuation 16455462 · Jun 27, 2019
Provisional Application 62810797 · Feb 26, 2019
Related Publication 20210140797A1 · May 13, 2021
Cited By (3)
US 12,650,737 US 12,650,738 US 12,669,878