Apparatus and methods for x-ray imaging
An x-ray apparatus and method can improve x-ray imaging in a variety of ways. For example, the improve x-ray apparatus can reduce scatter from x-ray images acquired by two-dimensional detectors. An improved 2D x-ray apparatus can provide 3D imaging for medical and/or industrial applications. An improved 2D x-ray apparatus and method can produce separate material imaging, and composition analysis for characterization and correlation of image, densitometry, and composition information of individual component or individual material within a single subject. Non-rotational 3D microscopy, combining 2D or 3D full field x-ray imaging and high resolution 2D or 3D x-ray microscopy or spectral absorptiometry and spectroscopy can achieve a higher resolution and wider field of view in x-ray imaging and quantitative analysis in 3D and real time. The x-ray apparatus can improve tracking and/or surgical guidance in time and/or space.
1. An x-ray measurement system comprising:
an x-ray source configured to emit one or more x-ray beams directed to an imaging subject; and
a two-dimensional (2D) x-ray detector downstream of the imaging subject, wherein a controller of the system is configured to obtain three-dimensional (3D) images of a region of interest in the subject by having a plurality of relative positions of x-ray emission to the region of interest, achieved by one or more of moving the region of interest or moving or steering x-ray emitting positions or having a plurality of the x-ray sources in at least two axes of the 3D space including positions in x-y-z axis, and obtaining 2D x-ray measurements; and
a non-transitory computer for storage medium containing software for reducing or removing scatter from the 2D x-ray measurements, such that data derived are used to create at least one 3D image of the region of interest,
wherein a distance between adjacent x-ray emitting positions or relative distance of the region of the interest between the moved positions is equal to approximately a resolution in a third axis, such that each of the adjacent x-ray emitting positions is configured to generate at least one or more different projection paths in the region of interest, and
wherein said distance is greater than zero and up to one pixel pitch.
2. The system of claim 1 , wherein the non-transitory computer for storage medium contains software for performing measurement for at least one application of diagnostics, guidance of treatment and surgery, biopsy, pre-operation planning, inspection, tracking and/or monitoring of a subject.
3. The system of claim 1 , wherein the x-ray source is configured to emit x-ray beams with controllable energy levels.
4. The system of claim 3 , wherein the x-ray measurement system is configured to apply a spectral material decomposition method to produce the 3D image for at least one component and or to produce in 3D relative density of a component to that of other components or rest of the region of interest, wherein the x-ray source is configured to emit at least two consecutive x-ray beams with the controllable energy levels for each imaging operation to apply the spectral material decomposition method.
5. The system of claim 1 , comprising a beam selector or beam absorption plates configured to selectively allow ray beams to reach predetermined locations of the x-ray detector and/or for scatter removal or reduction.
6. The system of claim 5 , wherein the controller is configured to reduce or remove scatter in time domain, space domain, and/or frequency domain in the x-ray measurements and/or to use a software to perform interpolation to produce high resolution primary x-ray image.
7. The system of claim 1 , comprising a second 2D x-ray detector.
8. The system of claim 1 , wherein a material decomposition method is configured to separate components or materials, enabling 3D imaging for at least one component relative to that of other components or region of interest, and/or driving six-dimensional (6D) or seven-dimensional (7D) image for at least one component in space and time compared to that of background or an external spatial marker or sensor.
9. The system of claim 1 , wherein a processor of the system is configured to receive and process a full view x-ray signal of the imaging subject from the x-ray detector and a higher spatial or spectral resolution signal of a region of interest within the imaging subject from x-ray microscopy, x-ray spectroscopy, or x-ray absorptiometry assembly.
10. The system of claim 1 , wherein a detector or detector assembly comprises a flat panel detector and a smaller 2D detector or one-dimensional (1D) or point detector behind the flat panel detector.
11. The system of claim 1 , wherein approximately a total number of emitting positions, or a number of 2D images taken to construct the 3D image is quantitatively related to a depth of the third axis of region of interest or thickness of a portion of region of interest and/or the resolution in the third axis.
12. The system of claim 1 , wherein when moving or steering in x and y dimensions, a total movement angle from emitting positions that are furthest apart is between 0.1 to 1 degree.
13. The system of claim 1 , wherein after the 2D images are taken, an equation system, m×n×p equations, with approximately m×n×p variables can be solved such that location of the x-ray source can produce an image of size m×n and there can be approximately p layers, wherein a linear equation system can be solvable by either an iterative method or a matrix method.
14. The system of claim 1 , wherein a processor can use a conventional computing tomography imaging algorithm to derive 3D image based on combined data and solution of a linear equation.
15. The system of claim 1 , wherein a material decomposition method is used for determining density, thickness, composition, x ray measurable properties of each component in the region of interest.
16. The system of claim 1 , wherein the x-ray measurement system is configured to output a material decomposition analysis based at least in part on a database of x-ray measurement properties of different materials, each material comprising of substances with known density and or thickness; or based on, basis function spectral x-ray imaging method, and other methods and algorithms are used in spectral CT and dual or multiple, or spectral x-ray imaging, or those of prior art may also be used for material decomposition.
17. The system of claim 1 , wherein each component in the region of interest may be differentiated by density, contrast label, spatial structure and shape, relative spatial position, composition, or movement characteristics, flow properties, flow characteristics, flow direction, fluidic dynamics, presence, visibility within a component, or any differentiable physical properties that may be analyzed by a first x-ray images, or simulated properties, or previously known properties or any combination of those properties.
18. The system of claim 1 , wherein contrast label is a traditional or x ray contrast agent, or an endogenous element or selected from the group consisting of calcium, zinc, air, argon, nitrogen, carbon dioxide, nitrogen dioxide, methane, helium, oxygen, gadolinium, iron, magnesium, manganese, copper, chromium, gold, silver, thulium, and barium, sodium, potassium, phosphorous, sulfur, chlorine, iron, cobalt, nickel, copper, zinc, molybdenum, selenium, iodine, chromium, Au-(gold), Pt-(platinum), Ta-(Tantalum), Yb-(Ytterbium), and Bi-(Bismuth) based nanoparticles, graphene nanoparticle or graphene radiolabel composites, nanotube composites, iodinated or barium, gadolinium, hydrogel or negative contrast, selected from microbubble, nanobubble.
19. The system of claim 1 , wherein the x-ray measurement system and or a non-transitory computer for storage medium for display is comprising a viewing or display software which includes a capability to display for an application needed for a user.
20. The system of claim 1 , wherein the controller of the system is configured to obtain 3D images of the region of interest in the subject based on primary x-ray beams passing through the region of interest derived from at least one measurement and/or data derived from any with reduced or minimal scatter.
21. The system of claim 1 , wherein a computer processor can perform data analysis of data derived using a method of visualization and/or quantitative data analysis performed previously on Computed Tomography (CT) scanner, Magnetic Resonance Imaging (MRI), Positive Emission Tomography (PET) and Single Photon Emission Computed Tomography SPECT and other existing quantitative tomography and imaging methods, which are much expensive and/or time-consuming than 2D radiography. The visualization and/or quantitative data analysis performed on the 2D x-ray imaging apparatuses disclosed herein can be done by running algorithms developed for diagnosis and identification and characterization using artificial intelligence, deep machine learning, artificial neural network, convolution neural network, and/or deep neural network.
22. The system of claim 1 , wherein the 3D data derived may be used in applications selected from the following: cancer diagnosis (localization of suspended cancer cells, stem cells, rare cells and foreign subjects), circulatory system diseases and conditions (such as coronary artery disease (atherosclerosis), blood vessel aneurysms, and blood clots, neurological disorders including spinal conditions, herniated discs, epilepsy, encephalitis, spinal stenosis (narrowing of the spinal canal), a blood clot or intracranial bleeding in patients with stroke, kidney and bladder stones, abscesses; inflammatory diseases (such as ulcerative colitis and sinusitis), muscle disorders, and/or injuries to the head, skeletal system, and/or internal organs.