Imaging system and method to convert lateral scanning into axial remote focusing
View Patent ↗An imaging system configured to transform a lateral scan motion into axial refocusing, thus enabling aberration free remote focusing. In one embodiment, the imaging system provides aberration free remote focusing by causing a beam of light to be scanned over a stationary mirror having a variable height in the scan direction, thereby causing the beam of light to be defocused in an axial direction in the return direction (e.g., the direction of propagation for the reflected beam of light). By configuring the back-reflected light resulting from the lateral scan component as described herein, a pure axial scan motion may be obtained at the rate of the employed (lateral) scanning technology (e.g., a GSM). This capability allows the imaging system of the present inventive concept to leverage rapid lateral scan technologies to produce rapid axial displacement of the axial focus of the beam of light.
1. An imaging system comprising:
a light source configured to generate a beam of light;
a first mirror configured to scan the beam of light across a second mirror so the beam of light passes through an objective and is reflected by the second mirror during the scan to yield reflections of the beam of light that pass through the objective prior to returning to the first mirror, the second mirror including a tilted planar mirror having a unified structure including a first portion and a second portion, the first portion and the second portion each being planar; the first portion configured to reflect the beam of light at a different distance than the second portion of the second mirror such that the first portion generates a first reflection having a different axial focus than a second reflection generated by the second portion, the first mirror configured to scan the beam of light across both the first portion and the second portion of the second mirror while the second mirror remains stationary to provide the different axial focus between the first reflection generated by the first portion and the second reflection generated by the second portion; and
at least one device configured to capture one or more images of a sample using the reflections of the beam of light,
wherein the objective is shifted off an optical axis to create a tilted focus that is incident normal to the tilted planar mirror of the second mirror.
2. The imaging system of claim 1 ,
wherein,
the first mirror is configured to scan the beam of light across the second mirror so the beam of light passes through the objective before reaching the second mirror.
3. The imaging system of claim 1 , further comprising:
another device configured to measure a focus of each of the reflections of the beam of light.
4. The imaging system of claim 1 ,
wherein,
the first mirror is configured to transmit the reflections of the beam of light to another objective, and
the another objective is configured to illuminate the sample using the reflections of the beam of light.
5. The imaging system of claim 4 ,
wherein,
the at least one device is configured to capture the one or more images of the sample based on illumination of the sample using the reflections of the beam of light from the another objective.
6. A method comprising:
generating, by a light source, a beam of light;
scanning, by a first mirror, the beam of light across a second mirror;
transmitting, via an objective, reflections of the beam of light generated by the second mirror to the first mirror, the reflections of the beam of light passing through the objective prior to returning to the first mirror, the second mirror including a tilted planar mirror having a unified structure including a first portion and a second portion, the first portion and the second portion each being planar; the first portion configured to reflect the beam of light at a different distance than the second portion of the second mirror such that the first portion generates a first reflection having a different axial focus than a second reflection generated by the second portion, the beam of light scanned by the first mirror by reflecting the beam of light across both the first portion and the second portion of the second mirror while the second mirror remains stationary to provide the different axial focus between the first reflection generated by the first portion and the second reflection generated by the second portion;
capturing, by one or more devices, image data of a sample using the reflections of the beam of light; and
generating, by the one or more devices, an image of the sample based on the image data,
wherein the objective is shifted off an optical axis to create a tilted focus that is incident normal to the tilted planar mirror of the second mirror.
7. The method of claim 6 , further comprising:
providing, via the first mirror, the reflections of the beam of light to another objective, the another objective configured to illuminate the sample using the reflections of the beam of light.
8. The method of claim 7 ,
wherein,
the one or more devices are configured to capture the image data based on illumination of the sample using the reflections of the beam of light from the another objective.
9. The method of claim 6 , further comprising:
measuring, by a second device, a focus of each of the reflections of the beam of light.
10. An imaging system comprising:
a light source configured to generate a beam of light;
a first mirror configured to scan the beam of light across a second mirror so the beam of light passes through an objective and is reflected by the second mirror during the scan to yield reflections of the beam of light, the second mirror including a tilted planar mirror having a unified structure including a first portion and a second portion, the first portion and the second portion each being planar; the first portion configured to reflect the beam of light at a different distance than the second portion of the second mirror such that the first portion generates a first reflection having a different axial focus than a second reflection generated by the second portion, the first mirror configured to scan the beam of light by reflecting the beam of light across both the first portion and the second portion of the second mirror while the second mirror remains stationary to provide the different axial focus between the first reflection generated by the first portion and the second reflection generated by the second portion; and
at least one device configured to capture one or more images of a sample using the reflections of the beam of light and measure a focus of each of the reflections of the beam of light,
wherein the objective is shifted off an optical axis to create a tilted focus that is incident normal to the tilted planar mirror of the second mirror.
11. The imaging system of claim 10 ,
wherein,
the at least one device includes a first camera configured to capture the one or more images of the sample using the reflections of the beam of light, and
the at least one device includes a second camera configured to measure the focus of each of the reflections of the beam of light.