IP Library › Granted Patent US 11,398,357
Granted Patent B2
US 11,398,357 · App. 17/197,225 · Granted Jul 26, 2022

Aluminum polymer capacitor with enhanced internal conductance and breakdown voltage capability

Inventors: Victor Andoralov (Évora, PT); Miguel Evaristo (Évora, PT); Rui A. Monteiro (Évora, PT); Philip M. Lessner (Simpsonville, SC)
Assignee: KEMET Electronics Corporation
H01G11/48H01G11/04H01G11/56H01G11/74
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,398,357
App. No.
17/197,225
Granted
Jul 26, 2022
Kind
B2
Abstract

An improved capacitor is provided. The capacitor comprises a working element wherein the working element comprises an anode comprising a first dielectric on the anode, a cathode and a conductive separator between the first dielectric and cathode. The conductive separator comprises a separator and a first conductive polymer wherein the first conductive polymer at least partially encapsulates the separator. A second conductive polymer at least partially encapsulates the first conductive polymer and wherein the first conductive polymer has a higher conductivity than the second conductive polymer. An anode lead is in electrical contact with the anode and a cathode lead is in electrical contact with the cathode.

Claims (32)

1. A method for forming a capacitor comprising:

forming a working element by:

providing an anode comprising a first dielectric and an anode lead;

providing a cathode comprising a cathode lead;

forming a conductive separator comprising a separator and a first conductive polymer wherein said first conductive polymer at least partially encapsulates said separator;

winding said anode and said cathode with said conductive separator between said first dielectric and said cathode to form a wound capacitor precursor; and

introducing a second conductive polymer into said wound capacitor precursor wherein said second conductive polymer at least partially encapsulates said first conductive polymer.

2. The method for forming a capacitor of claim 1 wherein said first conductive polymer is formed by in situ polymerization techniques.

3. The method for forming a capacitor of claim 1 wherein said introducing slurry into said wound capacitor precursor wherein said slurry comprises a pre-formed conductive polymer.

4. The method for forming a capacitor of claim 1 wherein said first conductive polymer has a higher conductivity than said second conductive polymer.

5. The method for forming a capacitor of claim 4 wherein said first conductive polymer has a first conductivity and said second conductive polymer has a second conductivity wherein said first conductivity is at least 150% to no more than 2500% of said second conductivity.

6. The method for forming a capacitor of claim 1 wherein said first conductive polymer has a first breakdown voltage and said second conductive polymer has a second breakdown voltage wherein said second breakdown voltage is higher than said first breakdown voltage.

7. The method for forming a capacitor of claim 6 wherein said second breakdown voltage is 120% to 700% of said first breakdown voltage.

8. The method for forming a capacitor of claim 1 wherein said first conductive polymer has a first work function and said second conductive polymer has a second work function wherein said second work function is higher than said first work function.

9. The method for forming a capacitor of claim 8 wherein said second work function is at least 0.2 eV to no more than 1.2 eV higher than said first work function.

10. The method for forming a capacitor of claim 1 further comprising:

adding a liquid electrolyte to said working element wherein said liquid electrolyte is between said dielectric and said cathode.

11. The method for forming a capacitor of claim 1 wherein said conductive separator has a first conductive polymer coating weight of at least 0.1 mg/cm 2 to no more than 10 mg/cm2.

12. The method for forming a capacitor of claim 1 wherein said conductive separator comprises a separator with said first conductive polymer coated on said material or said first conductive polymer impregnates said separator.

13. The method for forming a capacitor of claim 12 wherein at least one of said first conductive polymer or said second conductive polymer comprises a polymer selected from the group consisting of polyaniline, polythiophene and polypyrrole.

14. The method for forming a capacitor of claim 13 wherein said polythiopene is poly 3,4-ethylenedioxythiophene.

15. The method for forming a capacitor of claim 13 wherein said first conductive polymer or said second conductive polymer is a self-doping polymer.

16. The method for forming a capacitor of claim 1 comprising forming multiple anode leads or multiple cathode leads.

17. The method for forming a capacitor of claim 1 wherein at least one of said anode or said cathode comprises a valve metal.

18. The method for forming a capacitor of claim 17 wherein said valve metal is selected from the group consisting of tantalum, aluminum, niobium, titanium, zirconium, hafnium, alloys of these elements and a conductive oxide thereof.

19. The method for forming a capacitor of claim 18 wherein said valve metal is aluminum.

20. The method for forming a capacitor of claim 1 having a rated voltage of at least 15 volts to no more than 500 volts.

21. The method for forming a capacitor of claim 1 wherein said first conductive polymer has an average particle size which is higher than an average particle size of said second conductive polymer.

22. The method for forming a capacitor of claim 21 wherein said second conductive polymer is a soluble conductive polymer.

23. The method for forming a capacitor of claim 21 wherein said second conductive polymer has a particle size of no more than 200 nm.

24. The method for forming a capacitor of claim 21 wherein said particle size is at least 1 nm.

25. The method for forming a capacitor of claim 24 wherein said particle size is at least 20 nm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2021
From: ANDORALOV, VICTOR; EVARISTO, MIGUEL; MONTEIRO, RUI A.; LESSNER, PHILIP M.
To: KEMET ELECTRONICS CORPORATION
Reel/Frame 055546/0041 →
Continuity (2)
Division 16558500 · Sep 3, 2019
Related Publication 20210193400A1 · Jun 24, 2021