IP Library › Granted Patent US 12,032,282
Granted Patent B2
US 12,032,282 · App. 17/201,025 · Granted Jul 9, 2024

Imprint apparatus, imprint method, and article manufacturing method

Inventor: Toshiaki Ando (Tokyo, JP)
Assignee: CANON KABUSHIKI KAISHA
G03F7/0002
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Quick Facts
Patent No.
US 12,032,282
App. No.
17/201,025
Granted
Jul 9, 2024
Kind
B2
Abstract

An imprint apparatus in which contamination in an apparatus due to an uncured material or the like can be minimized is provided. The imprint apparatus includes: a first irradiation unit configured to irradiate an imprint material on a substrate with light for performing curing in a state in which the imprint material is brought into contact with a pattern portion having a concave and convex pattern formed in a mold; and a second irradiation unit configured to irradiate a peripheral region of the pattern portion of the mold after the irradiation of the light using the first irradiation unit.

Claims (14)

1. An imprint apparatus, comprising:

a first irradiation unit configured to irradiate an imprint material on a substrate with light for performing curing in a state in which the imprint material is brought into contact with a pattern portion having a concave and convex pattern and being formed in a first surface of a mold that faces the imprint material in the state in which the imprint material is brought into contact with the pattern portion;

a second irradiation unit configured to irradiate a peripheral region of the pattern portion of the mold with light, the peripheral region of the pattern portion of the mold being formed in a second surface of the mold different from the first surface of the mold that faces the imprint material in the state in which the imprint material is brought into contact with the pattern portion; and

a controller including a memory configured to store computer-readable instructions and a processor configured to execute the computer-readable instructions stored in the memory to cause the second irradiation unit to irradiate the peripheral region of the pattern portion of the mold formed in the second surface of the mold with light after causing the first irradiation unit to irradiate the imprint material on the substrate with light for performing curing in the state in which the imprint material is brought into contact with the pattern portion of the mold formed in the first surface of the mold,

wherein the second irradiation unit is configured to irradiate an uncured imprint material adhering to the peripheral region of the pattern portion of the mold formed in the second surface of the mold with curing light that cures the uncured imprint material adhering to the peripheral region of the pattern portion.

2. The imprint apparatus according to claim 1 , wherein the second irradiation unit includes a reflector configured to reflect the light radiated from the first irradiation unit to the peripheral region of the pattern portion of the mold formed in the second surface of the mold.

3. The imprint apparatus according to claim 2 , wherein the reflector has either a planar shape or a concave surface shape.

4. The imprint apparatus according to claim 1 , wherein the first surface of the mold faces the imprint material in the state in which the imprint material is brought into contact with the pattern portion, and the second surface of the mold faces away from the imprint material in the state in which the imprint material is brought into contact with the pattern portion.

5. The imprint apparatus according to claim 4 , wherein the first surface of the mold extends along a first direction and the second surface of the mold extends along a second direction orthogonal to the first direction.

6. The imprint apparatus according to claim 1 , wherein the second irradiation unit is provided in a holder configured to hold the mold.

7. The imprint apparatus according to claim 1 , wherein the second irradiation unit is provided in a substrate moving portion configured to hold and move the substrate.

8. The imprint apparatus according to claim 1 , wherein the second irradiation unit has a member configured to change an irradiated region of the light radiated from the first irradiation unit to radiate the peripheral region of the pattern portion of the mold formed in the second surface of the mold.

9. The imprint apparatus according to claim 1 , wherein the controller is included in a housing of the imprint apparatus or disposed externally to the imprint apparatus.

10. The imprint apparatus according to claim 1 , wherein the controller further causes the second irradiation unit to irradiate the peripheral region of the pattern portion of the mold formed in the second surface of the mold with the curing light after the imprint material is separated from the pattern portion of the mold formed in the first surface of the mold.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 31, 2021
From: ANDO, TOSHIAKI
To: CANON KABUSHIKI KAISHA
Reel/Frame 055792/0058 →
Priority Claims (1)
JP 2020-068331 · Apr 6, 2020 · national
Continuity (1)
Related Publication 20210311386A1 · Oct 7, 2021