Displacement measurement system
View Patent ↗Provided is a displacement measurement system including: a sensor that is contactable with a measurement target object and includes a first spacer that has at least a one-dimensional spread, and two or more types of light emitting particles that are distributed over the spread of the first spacer and emit light at different wavelengths by an excitation energy; an excitation energy source that causes the two or more types of light emitting particles included in the sensor to emit light; and a light receiver that receives light emitted from the sensor.
1. A displacement measurement system comprising:
a sensor that is contactable with a measurement target object and includes a first spacer that has at least a one-dimensional spread, and two or more types of light emitting particles that are distributed over the spread of the first spacer and emit light at different wavelengths by an excitation energy;
an excitation energy source that causes the two or more types of light emitting particles included in the sensor to emit light; and
a light receiver that receives light emitted from the sensor,
wherein the two or more types of light emitting particles are made of a same material but have different respective particle diameters.
2. The displacement measurement system of claim 1 ,
wherein the two or more types of light emitting particles have an overlap between a light emission spectrum of one type of the light emitting particles and an excitation spectrum of another type of the light emitting particles.
3. The displacement measurement system according to claim 1 ,
wherein, as the two or more types of light emitting particles, at least one of semiconductor nanoparticles and an organic dye is used.
4. The displacement measurement system of claim 1 , further comprising:
an image analyzer that measures a displacement of the measurement target object that is in contact with the sensor based on a wavelength distribution of the received light.
5. The displacement measurement system of claim 1 ,
wherein the excitation energy is at least one of a light energy and an electrical energy.
6. A pressure measurement system using the displacement measurement system of claim 1 .
7. A displacement measurement system comprising:
a sensor that is contactable with a measurement target object and includes a first light emitting particle layer in which first light emitting particles that emit light at a first wavelength by an excitation energy are distributed over at least a one-dimensional spread, a second light emitting particle layer in which second light emitting particles that emit light at a second wavelength different from the first wavelength by the excitation energy are distributed over the spread, and a second spacer layer that separates the first light emitting particle layer from the second light emitting particle layer in a direction intersecting the spread;
an excitation energy source that causes the first light emitting particles and the second light emitting particles included in the sensor to emit light;
a light receiver that receives light emitted from the sensor; and
an image analyzer that measures a displacement of the measurement target object that is in contact with the sensor based on a wavelength distribution of the received light.
8. The displacement measurement system of claim 7 ,
wherein the first light emitting particles and the second light emitting particles have an overlap between a light emission spectrum of one type of the light emitting particles and an absorption spectrum of the other type of the light emitting particles.
9. The displacement measurement system of claim 7 ,
wherein, as the first light emitting particles and the second light emitting particles, at least one of semiconductor nanoparticles and an organic dye is used.
10. The displacement measurement system of claim 7 ,
wherein the excitation energy is at least one of a light energy and an electrical energy.
11. A pressure measurement system using the displacement measurement system of claim 7 .