IP Library Patent Application 17248515
Patent Application
App. No. 17/248,515

IMAGE SENSORS HAVING READOUT CIRCUITRY WITH A SWITCHED CAPACITOR LOW-PASS FILTER

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Quick Facts
Patent No.
US None
App. No.
17/248,515
Abstract

An image sensor may include an array of imaging pixels arranged in rows and columns. Each column of imaging pixels may be coupled to a respective column output line that is used to read out samples from the imaging pixels. Each column output line may be coupled to a respective switched capacitor low-pass filter that is used to filter out high-frequency noise during readout. The switched capacitor includes a capacitor, a first transistor that is coupled between the capacitor and the column output line, and a second transistor that is coupled between the capacitor and an additional capacitor. The first and second transistors are repeatedly, alternatingly asserted at a frequency that is selected based on a target cutoff frequency for the low-pass filter.

Claims (37)

1 . An image sensor, comprising:

an array of imaging pixels;

a column output line coupled to a column of the imaging pixels; and

a switched capacitor low-pass filter coupled to the column output line.

2 . The image sensor defined in claim 1 , further comprising:

a capacitor, wherein the switched capacitor low-pass filter is coupled between the capacitor and the column output line.

3 . The image sensor defined in claim 1 , wherein the capacitor is a first capacitor and wherein the switched capacitor low-pass filter comprises a second capacitor.

4 . The image sensor defined in claim 3 , wherein a capacitance of the first capacitor is greater than a capacitance of the second capacitor.

5 . The image sensor defined in claim 3 , wherein a capacitance of the first capacitor is at least ten times greater than a capacitance of the second capacitor.

6 . The image sensor defined in claim 3 , wherein the switched capacitor low-pass filter comprises a first transistor that is coupled between the second capacitor and the column output line.

7 . The image sensor defined in claim 6 , wherein the switched capacitor low-pass filter comprises a second transistor that is coupled between the second capacitor and the first capacitor.

8 . The image sensor defined in claim 7 , wherein the first and second transistors are configured to be repeatedly, alternatingly asserted during a readout period.

9 . The image sensor defined in claim 7 , wherein the first and second transistors are configured to be repeatedly asserted in a non-overlapping manner.

10 . The image sensor defined in claim 9 , wherein the first and second transistors are configured to be repeatedly asserted in the non-overlapping manner at a frequency and wherein the frequency is greater than or equal to 1 MHz.

11 . The image sensor defined in claim 9 , wherein the first and second transistors are configured to be repeatedly asserted in the non-overlapping manner at a frequency and wherein the frequency is greater than or equal to 10 MHz.

12 . The image sensor defined in claim 9 , wherein the first and second transistors are configured to be repeatedly asserted in the non-overlapping manner at a frequency and wherein the frequency is between 1 MHz and 100 MHz.

13 . An image sensor, comprising:

an array of imaging pixels;

a column output line coupled to a column of the imaging pixels;

a first capacitor;

a first transistor that is coupled between the first capacitor and the column output line;

a second capacitor; and

a second transistor that is coupled between the first and second capacitors, wherein the first and second transistors are configured to be repeatedly, alternatingly asserted during a readout period.

14 . The image sensor defined in claim 13 , wherein a capacitance of the second capacitor is greater than a capacitance of the first capacitor.

15 . The image sensor defined in claim 13 , wherein the first and second transistors are configured to be repeatedly, alternatingly asserted during the readout period at a frequency that is greater than or equal to 1 MHz.

16 . The image sensor defined in claim 13 , wherein the first and second transistors are configured to be repeatedly, alternatingly asserted during the readout period at a frequency that is between 1 MHz and 100 MHz.

17 . An image sensor, comprising:

an array of imaging pixels;

a plurality of column lines, wherein each column line is configured to receive outputs from a respective column of the imaging pixels; and

a plurality of switched capacitor low-pass filters, wherein each column line is coupled to a respective switched capacitor low-pass filter.

18 . The image sensor defined in claim 17 , wherein each switched capacitor low-pass filter comprises:

a first capacitor;

a first transistor that is coupled between the first capacitor and the respective column output line; and

a second transistor that is coupled to the first capacitor.

19 . The image sensor defined in claim 18 , further comprising:

control circuitry configured to alternate asserting the first and second transistors of each switched capacitor low-pass filter.

20 . The image sensor defined in claim 19 , wherein the control circuitry is configured to alternate asserting the first and second transistors of each switched capacitor low-pass filter at a frequency that is greater than 1 MHz.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL 056595, FRAME 0177 Recorded Aug 16, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 064615/0564 →
SECURITY INTEREST Recorded Jun 15, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 056595/0177 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2021
From: SPIESSENS, PETER
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 055064/0060 →