IP Library › Granted Patent US 11,356,111
Granted Patent B1
US 11,356,111 · App. 17/249,754 · Granted Jun 7, 2022

Self calibrating digital-to-analog converter

Inventors: Hanging Xing (Sunnyvale, CA); Ronak Prakashchandra Trivedi (Cupertino, CA); Jean CauXuan Le (Santa Clara, CA)
Assignee: NXP B.V.
H03M1/1028H04B1/06
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Quick Facts
Patent No.
US 11,356,111
App. No.
17/249,754
Granted
Jun 7, 2022
Kind
B1
Abstract

A self-calibrating digital-to-analog converter (DAC) is disclosed. The self-calibrating DAC includes an input port, a non-binary DAC, an ADC to receive an output of the non-binary DAC, a lookup table to store a plurality of calibration code and a calibration logic coupled with the non-binary DAC. The self-calibrating DAC has two modes of operations, a calibration mode and a normal operational mode. In the calibration mode, the self-calibrating DAC is configured to calculate weightages of the non-binary DAC and to calculate an offset coefficient and a gain coefficients using high precision on chip analog-to-digital converter (ADC).

Claims (31)

1. A self-calibrating digital-to-analog converter (DAC), comprising:

an input port;

a non-binary DAC;

an ADC including a modulator to receive an output of the non-binary DAC;

a lookup table to store a plurality of calibration codes;

a calibration logic coupled with the non-binary DAC and in a calibration mode, configured to calculate bit weightages of the non-binary DAC using a calibration code in the plurality of calibration codes and to calculate an offset coefficient and a gain coefficients of the non-binary DAC; and

a conversion module to convert, in a normal mode, an input code received via the input port, to a calibrated code using the weight and the offset & gain coefficients.

2. The self-calibrating DAC of claim 1 , further including a memory to store the weight and the offset & gain coefficient that are calculated during the calibration mode.

3. The self-calibrating DAC of claim 1 , wherein the weight is calculated for a selected bit of the non-binary DAC by measuring an output of the non-binary DAC using the ADC after setting the selected input bit of the non-binary DAC to 1 and setting all other input bits of the non-binary DAC to 0.

4. The self-calibrating DAC of claim 3 , wherein the selected bit of the input calibration code is incremented to a next bit until all input bits of the raw DAC are processed using a loop.

5. The self-calibrating DAC of claim 4 , wherein the loop is executed for a number of times equal to a resolution of the raw non-binary DAC.

6. The self-calibrating DAC of claim 1 , wherein the offset & gain coefficients are calculated by inputting a zero scale voltage to the ADC to obtain a zero scale calibration code (C ZS _cal) from the ADC.

7. The self-calibrating DAC of claim 6 , wherein the offset & gain coefficients are calculated by inputting a full scale voltage to the ADC to obtain a full scale calibration code (C FS _cal) from the ADC.

8. The self-calibrating DAC of claim 7 , wherein the offset coefficient is calculated by subtracting a zero scale code from C ZS _cal, wherein the zero scale code is obtained at the output of the ADC by inputting a zero scale code from the lookup table into the non-binary DAC and measuring the DAC output using the ADC.

9. The self-calibrating DAC of claim 8 , wherein the gain coefficient is calculated using an equation (C FS _cal−C ZS _cal)/2{circumflex over ( )}N DAC _cal−l), wherein N DAC _cal is a resolution of the self-calibrating DAC.

10. A method for self-calibrating a digital-to-analog converter (DAC) having a resolution, comprising:

in a calibration mode,

calculating a weight of a non-binary DAC using an ADC;

calculating an offset coefficient of the non-binary DAC;

calculating a gain coefficient of the non-binary DAC; and

in a normal mode,

converting an input digital code to a calibrated non-binary input code using the weight, the offset coefficient and the gain coefficient.

11. The method of claim 10 , wherein the weight is calculated for a selected input bit of the non-binary DAC by measuring an output of the non-binary DAC using the ADC after setting the selected input bit of the non-binary DAC to 1 and setting all other input bits of the non-binary DAC to 0.

12. The method of claim 11 , wherein the selected input bit of the non-binary DAC is incremented to a next bit until all input bits of the non-binary DAC are processed using a loop.

13. The method of claim 12 , wherein the loop is executed for a number of times equal to a resolution of the non-binary DAC.

14. The method of claim 10 , wherein the offset coefficient and the gain coefficient are calculated by inputting a zero scale voltage to the ADC to obtain a zero scale calibration code (C ZS _cal) from the ADC.

15. The method of claim 14 , wherein the offset coefficient and the gain coefficient are calculated by inputting a full scale voltage to the ADC to obtain a full scale calibration code (C FS _cal) from the ADC.

16. The method of claim 15 , wherein the offset coefficient is calculated by subtracting a zero scale code from C ZS _cal, wherein the zero scale code is obtained at the output of the ADC by inputting a zero scale code into the non-binary DAC and measuring an output of the non-binary DAC using the ADC.

17. The method of claim 16 , wherein the gain coefficient is calculated using an equation (C FS _cal−C ZS _cal)/2{circumflex over ( )}N DAC _cal−1), wherein N DAC _cal is the resolution.

18. The method of claim 10 , wherein the converting includes reading a digital input code and multiplying the input code by the gain coefficient and adding the offset coefficient.

19. The method of claim 10 , wherein the converting includes reading a digital input code and applying the gain coefficient and the offset coefficient to the digital input code.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2021
From: XING, HANQING; TRIVEDI, RONAK PRAKASHCHANDRA; LE, JEAN CAUXUAN
To: NXP B.V.
Reel/Frame 055567/0014 →
Cited By (3)
US 12,224,767 US 12,483,255 US 12,744,542