IP Library › Granted Patent US 12,006,566
Granted Patent B2
US 12,006,566 · App. 17/252,936 · Granted Jun 11, 2024

Composite tungsten oxide film and method for producing same, and film-deposited base material and article each provided with said film

Inventors: Keiichi Sato (Tokyo, JP); Isao Ando (Tokyo, JP)
Assignee: SUMITOMO METAL MINING CO., LTD.
C23C14/083C01G41/006C03C17/245C23C14/3414C23C14/5806C01P2002/54C01P2002/74C01P2002/76C01P2006/40C01P2006/60C01P2006/90C03C2218/154C03C2218/32
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Quick Facts
Patent No.
US 12,006,566
App. No.
17/252,936
Granted
Jun 11, 2024
Kind
B2
Abstract

A composite tungsten oxide film having high film smoothness, with a function to shield infrared light by reflecting infrared light by a thermal insulation, while maintaining transparency in a visible light region, and a method for manufacturing the composite tungsten oxide film, and a film-deposited base material or an article using these functions. A composite tungsten oxide film including a composition with a general formula M x W y O z as main components, wherein 0.001≤x/y≤1, 2.2≤z/y≤3.0, organic components are not contained substantially, a transmittance in a wavelength of 550 nm is 50% or more, a transmittance in a wavelength of 1400 nm is 30% or less, and also, a reflectance in a wavelength of 1400 nm is 35% or more.

Claims (32)

1. A composite tungsten oxide film comprising a composition represented by a general formula M x W y O z , wherein an element M is one or more elements selected from alkaline metal, alkaline earth metal, Fe, In, Tl, and Sn, an element W is tungsten, and an element O is oxygen, as a main component,

wherein 0.001≤x/y≤1, 2.2≤z/y≤3.0,

wherein a particle dispersion and organic components are not contained substantially in the composition, and

wherein the composite tungsten oxide film is sputtered and heat treated, wherein the sputtered and heat treated composite tungsten oxide film has a transmittance in a wavelength of 550 nm of 50% or more, a transmittance in a wavelength of 1400 nm of 30% or less, and a reflectance in a wavelength of 1400 nm of 35% or more.

2. The composite tungsten oxide film according to claim 1 , wherein a surface roughness Sa of the composite tungsten oxide film is 20 nm or less.

3. The composite tungsten oxide film according to claim 1 , wherein a sheet resistance of the composite tungsten oxide film is less than 10 5 ohms per square.

4. The composite tungsten oxide film according to claim 1 , wherein the element M is one or more elements selected from Cs, Rb, K, Tl, In, Ba, Li, Na, Ca, Sr, Fe and Sn.

5. The composite tungsten oxide film according to claim 1 , wherein the composite tungsten oxide film contains a hexagonal crystal structure.

6. The composite tungsten oxide film according to claim 5 , wherein, when an intensity ratio between a diffraction intensity I (200) of hexagonal (200) face and a diffraction intensity I (002) of hexagonal (002) face by X-ray diffraction using CuKα ray is I (002)/I (200), the I (002)/I (200) is 0.30 or more and 0.50 or less, and

a ratio c/a between a-axis and c-axis of hexagonal crystal by X-ray diffraction using CuKα ray is 1.018 to 1.029.

7. The composite tungsten oxide film according to claim 1 , wherein the composite tungsten oxide film has is having a film thickness of more thicker than 20 nm.

8. A film-deposited base material, comprising wherein the composite tungsten oxide film according to claim 1 deposited on at least one surface of a base material.

9. The film-deposited base material according to claim 8 , wherein the base material has a thermal deformation temperature or a softening point of 400° C. or more.

10. The film-deposited base material according to claim 8 , wherein the base material is a glass.

11. An article comprising one or more of the composite tungsten oxide film according to claim 1 .

12. A method for producing the composite tungsten oxide film of claim 1 , comprising:

a film deposition process for deposition of the composite tungsten oxide film by a physical film deposition method, wherein the film is deposited in an inert gas atmosphere; and

a heat treatment process for heat-treating the deposited film, wherein the heat treatment process is at a temperature of 400° C. to 700° C. in an inert gas optionally containing a reducing gas.

13. An article comprising the film-deposited base material according to claim 8 .

14. A composite tungsten oxide film comprising a composition represented by a general formula M x W y O z , wherein an element M is one or more elements selected from alkaline metal, alkaline earth metal, Fe, In, Tl, and Sn, an element W is tungsten, and an element O is oxygen, as a main component,

wherein 0.001≤x/y≤1, 2.2≤z/y≤3.0,

wherein a particle dispersion is not contained substantially in the composition,

wherein the composite tungsten oxide film contains a hexagonal crystal structure,

wherein when an intensity ratio between a diffraction intensity I (200) of hexagonal (200) face and a diffraction intensity I (002) of hexagonal (002) face by X-ray diffraction using CuKα ray is I (002)/I (200), the I (002)/I (200) is 0.30 or more and 0.50 or less, and

wherein a ratio c/a between a-axis and c-axis of hexagonal crystal by X-ray diffraction using CuKα ray is 1.018 to 1.029.

15. The composite tungsten oxide film according to claim 9 , wherein, the element M is one or more elements selected from Cs, Rb, K, Tl and Ba.

16. The composite tungsten oxide film according to claim 14 , wherein the composite tungsten oxide film has a film thickness thicker than 20 nm.

17. A film-deposited base material, wherein the composite tungsten oxide film according to claim 14 is deposited on at least one surface of a base material.

18. The film-deposited base material according to claim 17 , wherein the base material has a thermal deformation temperature or a softening point of 400° C. or more.

19. The film-deposited base material according to claim 17 , wherein the base material is a glass.

20. An article comprising one or more of the composite tungsten oxide film according to claim 8 .

21. An article comprising the film-deposited base material according to claim 17 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 16, 2020
From: SATO, KEIICHI; ANDO, ISAO
To: SUMITOMO METAL MINING CO., LTD.
Reel/Frame 054669/0612 →
Priority Claims (2)
JP 2018-117340 · Jun 20, 2018 · national
JP 2019-024926 · Feb 14, 2019 · national
Continuity (1)
Related Publication 20210147973A1 · May 20, 2021