IP Library Granted Patent US 11,482,467
Granted Patent B2
US 11,482,467 · App. 17/269,524 · Granted Oct 25, 2022

Thermally conductive sheet and method of manufacturing semiconductor device

Inventors: Mika Kobune (Tokyo, JP); Michiaki Yajima (Tokyo, JP)
Assignee: SHOWA DENKO MATERIALS CO., LTD.
H01L23/3737H01L21/4882H01L23/3675
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Quick Facts
Patent No.
US 11,482,467
App. No.
17/269,524
Granted
Oct 25, 2022
Kind
B2
Abstract

A method of manufacturing a semiconductor device includes adhering together a heat dissipating body and a plurality of heat generating bodies via a thermally conductive sheet, by applying pressure to the heat dissipating body and the plurality of heat generating bodies in a thickness direction of the thermally conductive sheet with the thermally conductive sheet disposed therebetween, the thermally conductive sheet having a compression modulus of 1.40 MPa or less under a compressive stress of 0.10 MPa at 150° C.

Claims (11)

1. A method of manufacturing a semiconductor device, the method comprising adhering together a heat dissipating body and a plurality of heat generating bodies via a thermally conductive sheet, by applying pressure to the heat dissipating body and the plurality of heat generating bodies in a thickness direction of the thermally conductive sheet with the thermally conductive sheet disposed therebetween, the thermally conductive sheet having a compression modulus of from 0.50 to 1.40 MPa under a compressive stress of 0.10 MPa at 150° C.

2. The method of manufacturing a semiconductor device according to claim 1 , wherein the thermally conductive sheet has a thermal conductivity of 7 W/(mK) or higher, the thermal conductivity being obtained using a thermal resistance measured by a steady state method.

3. The method of manufacturing a semiconductor device according to claim 1 , wherein the thermally conductive sheet has a tack strength of 5.0 N·mm or more at 25° C.

4. The method of manufacturing a semiconductor device according to claim 1 , wherein the pressure is from 0.05 to 10.00 MPa.

5. The method of manufacturing a semiconductor device according to claim 4 , wherein the pressure is from 0.10 to 0.50 MPa.

6. The method of manufacturing a semiconductor device according to claim 1 , wherein the plurality of heat generating bodies comprise a plurality of different kinds of heat generating bodies.

7. The method of manufacturing a semiconductor device according to claim 1 , wherein an area of a face, of at least one of the plurality of heat generating bodies, that faces the thermally conductive sheet is 100 mm 2 or more.

8. The method of manufacturing a semiconductor device according to claim 1 ,

wherein the plurality of heat generating bodies are provided on a substrate, and

wherein an area of a face of the substrate that faces the plurality of heat generating bodies is 1000 mm 2 or more.

9. The method of manufacturing a semiconductor device according to claim 1 , wherein the plurality of heat generating bodies comprise three or more heat generating bodies.

Assignments (4)
CHANGE OF ADDRESS Recorded Feb 14, 2024
From: RESONAC CORPORATION
To: RESONAC CORPORATION
Reel/Frame 066599/0037 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED ON REEL 063016 FRAME 0952. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Apr 17, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 063348/0944 →
CHANGE OF NAME Recorded Mar 17, 2023
From: SHOWA DENKO MATERIALS CO., LTD.
To: RESONAC CORPORATION
Reel/Frame 063016/0952 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2021
From: KOBUNE, MIKA; YAJIMA, MICHIAKI
To: SHOWA DENKO MATERIALS CO., LTD.
Reel/Frame 055526/0206 →
Continuity (1)
Related Publication 20210183734A1 · Jun 17, 2021