IP Library › Granted Patent US 12,141,959
Granted Patent B2
US 12,141,959 · App. 17/275,224 · Granted Nov 12, 2024

Streamlining an automatic visual inspection process

Inventors: Yonatan Hyatt (Tel-Aviv, IL); Alexander Spivak (Hadera, IL); Katherina Shefer (Tel-Aviv, IL)
Assignee: SIEMENS AKTIENGESELLSCHAFT
G06T7/001G06F18/40G06V10/235G06V10/46G06V10/945
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Quick Facts
Patent No.
US 12,141,959
App. No.
17/275,224
Granted
Nov 12, 2024
Kind
B2
Abstract

Embodiments of the invention provide automatic detection of same-type objects on an inspection line and automatically capture and/or display an image of the object once it is detected. Additionally, embodiments of the invention automatically provide the outline of an object to a user, enabling the user to either confirm or easily correct the outline. The confirmed or corrected outline is then automatically applied to all images of inspected items of the same-type, allowing optimization of inspection tasks such as defect detection, for all inspected items, based on a short, possibly a one-time, input, from the user.

Claims (20)

1. A method for automatic visual inspection, the method comprising:

displaying to a user, in a first image, an outline surrounding a first item on an inspection line;

receiving input from the user via a user interface device;

changing the outline surrounding the first item to create an adjusted outline, based on the input from the user;

detecting a same-type item on the inspection line in a second image;

causing the adjusted outline to be applied to the same-type item in the second image; and

controlling, by a controller, at least one of a defect detecting module and a camera obtaining images of the first item and the same-type item;

performing inspection tasks on the same-type item based on at least one of the controlled defect detecting module and the controlled camera obtaining images of the first item and the same-type item, the inspection tasks relating to an area within the adjusted outline in the second image.

2. The method of claim 1 , wherein the same-type item is positioned on the inspection line at an angle relative to a position of the first item.

3. The method of claim 1 , comprising:

receiving input that the first item is defect-free;

acquiring additional images of same-type objects items on the inspection line; and

after a plurality of additional images are acquired, displaying to the user images of same-type items that differ from the first image, thereby minimizing an amount of time required from the user to review images.

4. The method of claim 3 , wherein the same-type items in the images that differ from the first image have suspected defects, are in a wrong position or location, are not well detected or are not accurately surrounded by the first item's outline.

5. The method of claim 1 , further comprising:

controlling the camera, via the controller, such that imaging parameters relating to the area within the adjusted outline are optimized.

6. The method of claim 1 , further comprising:

displaying a previously or subsequently obtained image of the inspection line, with the adjusted outline surrounding a same-type item in the previously or subsequently obtained image.

7. The method of claim 6 , further comprising:

displaying the second image to the user.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 9, 2024
From: INSPEKTO A.M.V. LTD.
To: SIEMENS AKTIENGESELLSCHAFT
Reel/Frame 067938/0517 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2021
From: HYATT, YONATAN; SPIVAK, ALEXANDER; SHEFER, KATHERINA
To: INSPEKTO A.M.V. LTD.
Reel/Frame 055745/0255 →
Priority Claims (1)
IL 261733 · Sep 13, 2018 · national
Continuity (2)
Provisional Application 62730545 · Sep 13, 2018
Related Publication 20220044379A1 · Feb 10, 2022