Charged particle beam system
A control system of a charged particle beam apparatus obtains a first coefficient by performing multiple resolution analysis based on wavelet transform or discrete wavelet transform on at least a part of an image or a signal acquired by the charged particle beam apparatus. The control system obtains a second coefficient by performing, on at least a part of the first coefficient or an absolute value of the first coefficient, any one of calculation of a maximum value, calculation of a numerical value corresponding to a specified order in an order related to a magnitude, fitting to a histogram, calculation of an average value, and calculation of a total sum.
1. A charged particle beam system comprising:
a charged particle beam apparatus; and
a control system that analyzes an image obtained by the charged particle beam apparatus, wherein
the control system
obtains a first coefficient by performing multiple resolution analysis based on wavelet transform or discrete wavelet transform on at least a part of an image or a signal acquired by the charged particle beam apparatus, and
obtains a second coefficient by performing, on at least a part of the first coefficient or an absolute value of the first coefficient, any one of calculation of a maximum value, calculation of a numerical value corresponding to a specified order in an order related to a magnitude, fitting to a histogram, calculation of an average value, and calculation of a total sum.
2. A charged particle beam system, comprising:
a charged particle beam apparatus; and
a control system that analyzes an image obtained by the charged particle beam apparatus, wherein
the control system
obtains a first coefficient by performing one of multiple resolution analysis, Fourier transform, and convolution operation based on wavelet transform or discrete wavelet transform on at least a part of an image or a signal acquired by the charged particle beam apparatus, obtains a second coefficient by performing, on at least a part of the first coefficient or an absolute value of the first coefficient, any one of calculation of a maximum
obtains a second coefficient by performing, on at least a part of the first coefficient or an absolute value of the first coefficient, any one of calculation of a maximum value, calculation of a numerical value corresponding to a specified order in an order related to a magnitude, fitting to a histogram, calculation of an average value, and calculation of a total sum, and
obtains a third coefficient by obtaining any one of a product, a sum, and an average value obtained using the product or the sum for a plurality of the obtained second coefficients.
3. The charged particle beam system according to claim 1 , wherein
the control system performs the multiple resolution analysis based on the wavelet transform or the discrete wavelet transform on the image or the signal acquired by the charged particle beam apparatus, and
the first coefficient is a coefficient obtained by performing the multiple resolution analysis based on the wavelet transform or the discrete wavelet transform on one direction or two or more different directions.
4. The charged particle beam system according to claim 2 , wherein
the control system performs convolution calculation on the image or the signal acquired by the charged particle beam apparatus,
an element of a kernel or a filter used in the convolution calculation is a complex number,
a coefficient of a real part or an imaginary part of the complex number is both a positive number and a negative number, or all of the coefficients of the real part or the imaginary part of the complex number have only a positive or negative sign, and
a control system subtracts a result obtained by the convolution calculation from an original image or signal, or from an image or signal acquired under the same condition as the original image or signal.
5. The charged particle beam system according to claim 2 , wherein
the first coefficient is a coefficient obtained using a plurality of different kernels or filters as a kernel or a filter used for the convolution calculation.
6. The charged particle beam system according to claim 5 , wherein
the plurality of different kernels or filters are obtained by rotating a single kernel or filter in one or more different directions.
7. The charged particle beam system according to claim 1 , wherein
the first coefficient is a coefficient obtained at a plurality of resolutions or levels among coefficients obtained by the multiple resolution analysis based on the discrete wavelet transform.
8. The charged particle beam system according to claim 7 , wherein
the second coefficient is obtained by performing, on at least a part of a coefficient obtained at each resolution or level or an absolute value of the coefficient obtained at each resolution or level among the first coefficients, any one of calculation of a maximum value, calculation of a numerical value corresponding to a specified order in an order related to a magnitude, fitting to a histogram, calculation of an average value, and calculation of a total sum.
9. The charged particle beam system according to claim 1 , wherein
the control system
acquires a plurality of images or signals under a plurality of conditions having different parameter values for image acquisition, and
determines a parameter value for acquiring a new image based on a value of the second coefficient obtained for at least a part of the plurality of images or signals.
10. The charged particle beam system according to claim 2 , wherein
the control system
acquires a plurality of images or signals under a plurality of conditions having different parameter values for image acquisition, and
determines a parameter value for acquiring a new image based on a value of the third coefficient obtained for at least a part of the plurality of images or signals.
11. The charged particle beam system according to claim 9 , wherein
the plurality of conditions having different parameter values for image acquisition are a plurality of conditions in which at least one of a parameter value used for focus adjustment and a parameter value used for aberration adjustment is different.
12. The charged particle beam system according to claim 11 , wherein
the aberration adjustment is adjustment of astigmatism.
13. The charged particle beam system according to claim 9 , wherein
the control system determines the parameter value for acquiring a new image by obtaining a condition under which a value of the second coefficient is the maximum, or a condition obtained by performing fitting, interpolation, or calculation of a center of gravity on a relationship between the parameter value for image acquisition and the second coefficient.
14. The charged particle beam system according to claim 10 , wherein
the control system determines the parameter value for acquiring a new image by obtaining a condition under which a value of the third coefficient is the maximum, or a condition obtained by performing fitting, interpolation, or calculation of a center of gravity on a relationship between the parameter value for image acquisition and the third coefficient.
15. The charged particle beam system according to claim 1 , wherein
the control system changes display in accordance with a value of the second coefficient.
16. The charged particle beam system according to claim 2 , wherein
the control system changes display in accordance with a value of the third coefficient.
17. The charged particle beam system according to claim 1 , wherein
the control system obtains, based on a magnitude of the second coefficient obtained for a part of the image or the signal acquired under a plurality of conditions having different parameter values for image acquisition, a parameter value at which the second coefficient is the maximum in a plurality of regions in the image or the signal, or a parameter value obtained by performing fitting, interpolation, or calculation of a center of gravity on a relationship between the parameter value for image acquisition and the second coefficient.
18. The charged particle beam system according to claim 2 , wherein
the control system obtains, based on a magnitude of the third coefficient obtained for a part of the image or the signal acquired under a plurality of conditions having different parameter values for image acquisition, a parameter value at which the third coefficient is the maximum in a plurality of regions in the image or the signal, or a parameter value obtained by performing fitting, interpolation, or calculation of a center of gravity on a relationship between the parameter value for image acquisition and the third coefficient.
19. The charged particle beam system according to claim 17 , wherein
the control system applies a predetermined formula to the obtained parameter value to obtain any one of a distribution of focusing conditions, a distribution of heights of a sample, and a three-dimensional structure of the sample in each of the plurality of regions in the image or the signal.
20. The charged particle beam system according to claim 18 , wherein
the control system applies a predetermined formula to the obtained parameter value to obtain any one of a distribution of focusing conditions, a distribution of heights of a sample, and a three-dimensional structure of the sample in each of the plurality of regions in the image or the signal.