Granted Patent
B2
US 11,984,311 · App. 17/284,144 · Granted May 14, 2024
Mass spectrometry via frequency tagging
Assignee:
Purdue Research Foundation
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Abstract
The invention generally relates to mass spectrometry via frequency tagging.
Claims (3)
1. A method for analyzing a sample, the method comprising:
introducing a precursor ion of a sample into a mass spectrometer comprising a single ion trap; and
analyzing the sample via the mass spectrometer that applies a plurality of scan functions to the single ion trap to fragment the precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion.
Continuity (2)
Provisional Application
62743600
· Oct 10, 2018
Cited By (1)