IP Library Granted Patent US 11,984,311
Granted Patent B2
US 11,984,311 · App. 17/284,144 · Granted May 14, 2024

Mass spectrometry via frequency tagging

Inventors: Robert Graham Cooks (West Lafayette, IN); Dalton Snyder (West Lafayette, IN)
Assignee: Purdue Research Foundation
H01J49/4225G01N33/6848H01J49/025H01J49/429
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Quick Facts
Patent No.
US 11,984,311
App. No.
17/284,144
Granted
May 14, 2024
Kind
B2
Abstract

The invention generally relates to mass spectrometry via frequency tagging.

Claims (3)

1. A method for analyzing a sample, the method comprising:

introducing a precursor ion of a sample into a mass spectrometer comprising a single ion trap; and

analyzing the sample via the mass spectrometer that applies a plurality of scan functions to the single ion trap to fragment the precursor ion and simultaneously eject a product ion of the precursor ion in a manner that preserves in time a relationship of the precursor ion and the product ion.

Continuity (2)
Provisional Application 62743600 · Oct 10, 2018
Related Publication 20210335592A1 · Oct 28, 2021
Cited By (1)
US 12,347,668