WAVEGUIDE COMPONENT FOR HIGH FREQUENCY TESTING
A waveguide interface is disclosed. The disclosed waveguide interface comprises: an inner boundary region extending peripherally around a cavity, a recessed region extending peripherally around the inner boundary region, and a plurality of protrusions extending from the recessed region.
1 . A waveguide interface, comprising:
an inner boundary region extending peripherally around a cavity;
a recessed region extending peripherally around the inner boundary region; and
a plurality of protrusions extending from the recessed region.
2 . The waveguide interface of claim 1 , wherein the plurality of protrusions is arranged concentrically within the recessed region.
3 . The waveguide interface of claim 1 , further comprising an outer boundary region extending peripherally around the recessed region.
4 . The waveguide interface of claim 1 , further comprising at least one hole configured to receive a fastener.
5 . The waveguide interface of claim 1 , further comprising at least one hole configured to receive an alignment pin.
6 . The waveguide interface of claim 1 , wherein the recessed region has a depth that is a is quarter of a wavelength of electromagnetic waves guided through the cavity at a frequency at which the waveguide interface is configured to operate.
7 . The waveguide interface of claim 1 , wherein a protrusion of the plurality of protrusions is shaped like a rectangular column.
8 . The waveguide interface of claim 1 , wherein the plurality of protrusions is arranged as a first ring of protrusions surrounding the inner boundary region and a second ring of protrusions surrounding the first ring of protrusions.
9 . The waveguide interface of claim 1 , wherein at least a part of the inner boundary region has a thickness extending radially outward from the cavity to the recessed region of a quarter of a wavelength of electromagnetic waves guided through the cavity at a frequency at which the waveguide interface is configured to operate.
10 . The waveguide interface of claim 1 , wherein the cavity, the inner boundary region, and the plurality of protrusions are substantially level with one another.
11 . A system, comprising:
a waveguide component that includes a first end, wherein the first end includes an interface configured to electrically couple to a device undergoing electronic testing; and
a set of one or more tracks configured to couple to an electronic testing equipment that is configured to couple to a second end of the waveguide component.
12 . The system of claim 11 , wherein the interface at the first end of the waveguide component includes an inner boundary region extending peripherally around a cavity, a recessed region extending peripherally around the inner boundary region, and a plurality of protrusions extending from the recessed region.
13 . The system of claim 12 , wherein the device undergoing testing is positioned a distance from the interface at the first end of the waveguide component that is less than a quarter of a wavelength of electromagnetic waves travelling in air at a frequency at which the waveguide interface is configured to operate but is not in physical contact with the waveguide interface.
14 . The system of claim 11 , wherein the electronic testing equipment is an extension is component of a network analyzer.
15 . The system of claim 11 , wherein the set of one or more tracks is configured to guide the electronic testing equipment along a first linear direction.
16 . The system of claim 15 , further comprising an additional set of one or more tracks configured to guide the electronic testing equipment along a second linear direction orthogonal to the first linear direction.
17 . The system of claim 15 , wherein movement of the electronic testing equipment along the first linear direction is actualized by a motor.
18 . The system of claim 15 , wherein movement of the electronic testing equipment along the first linear direction is at least in part controlled by a computer.
19 . The system of claim 15 , further comprising a turntable coupled to the electronic testing equipment that is configured to allow the electronic testing equipment to rotate about an axis orthogonal to the first linear direction.
20 . A method, comprising:
aligning a device under test with a waveguide interface of a waveguide component, wherein the waveguide interface includes an inner boundary region extending peripherally around a cavity, a recessed region extending peripherally around the inner boundary region, and a plurality of protrusions extending from the recessed region; and
causing electromagnetic waves to be transmitted from an electronic testing equipment through the waveguide component to the device under test.