Adaptive read disturb algorithm for NAND storage accounting for layer-based effect
A storage device includes 3D NAND including layers of multi-level cells. Test reads are performed by reading only LSB pages and reading layers in a repeating pattern of reading two and skipping two. A test read of a block is performed when its read count reaches a threshold. The counter threshold is updated according to errors detected during the test read such that the frequency of test reads increases with increase in errors detected. Counter thresholds according to errors may be specified in a table. The table may be selected as corresponding to a range of PEC values including the current PEC count of the 3D NAND. Each table further specifies a number of errors that will result in garbage collection being performed.
1. A storage device comprising:
a NAND storage device comprising a plurality of blocks of storage; and
a controller coupled to the NAND storage device and programmed to perform a test read of a subject block of the plurality of blocks of storage by reading only pages corresponding to one bit position;
wherein NAND storage device comprises a plurality of layers, the controller being programmed to perform the test read of the subject block by reading the plurality of layers in a repeating pattern including reading two layers and skipping two layers and reading a last layer of the plurality of layers wherein the controller is programmed to:
receive, from an error control code (ECC) decoder, a bin number indicating a range of error numbers for each page of the subject block read during the test read;
compile statistics for each bin number;
evaluate the statistics with respect to a table; and
update the counter threshold according to the evaluation of the statistics with respect to the table
wherein the controller is programmed to perform the test read when a test condition is met with respect to the subject block, the test condition being a number of reads recorded in a read counter for the subject block reaching a counter threshold for the subject block
wherein the controller is programmed to update the counter threshold based on a number of errors detected during the test read.
2. A storage device comprising:
a NAND storage device comprising a plurality of blocks of storage; and
a controller coupled to the NAND storage device and programmed to process each block of storage of the plurality of blocks of storage as a subject block by:
record in a read counter a number for the subject block of storage a number of reads performed with respect to the subject block;
when the read counter reaches a counter threshold, perform a test read of the subject block;
evaluate error statistics for the test read of the subject block; and
update the counter threshold for the subject block according to the evaluation of the error statistics for the test read of the subject block;
wherein the controller is programmed to: receive, from an error control code (ECC) decoder, a bin number indicating a range of error numbers for each page of the subject block read during the test read; and
compile the error statistics by counting a number of times each bin number is output by the ECC decoder during the test read.
3. The storage device of claim 2 , wherein the controller is programmed to:
identify an entry in a table corresponding to the error statistics; and
increase the counter threshold by a counter threshold frequency of the entry.
4. The storage device of claim 3 , wherein the controller is programmed to:
read a program/erase cycle (PEC) count for the NAND storage device; and
select the table from among a plurality of tables as being associated with a PEC range including the PEC count.
5. The storage device of claim 4 , wherein the plurality of tables are such that for a given error statistic value, a first table of the plurality of tables will specify a higher counter threshold frequency than a second table of the plurality of tables having a higher associated PEC range.
6. The storage device of claim 2 , wherein the controller is programmed to:
if the error statistics include any occurrences of a bin number corresponding to a maximum error count, perform garbage collection with respect to the subject block.
7. The storage device of claim 6 , wherein the controller is programmed to perform garbage collection with respect to the subject block by performing garbage collection with respect to a super block including the subject block and one or more other blocks of the plurality of blocks of storage.