Staggered read recovery for improved read window budget in a three dimensional (3D) NAND memory array
At the end of or after a reading operation in a 3D (three dimensional) NAND array, the wordlines of the 3D NAND array can be transitioned to ground in a staggered manner. The 3D NAND array includes a 3D stack with multiple wordlines vertically stacked, including a bottom-most wordline, a top-most wordline, and middle wordlines between the bottom-most wordline and the top-most wordline. A controller that controls the reading can set the multiple wordlines to a high voltage at the end or after the reading operation and then transition a selected wordline of the multiple wordlines from the high voltage to ground prior to transitioning the other wordlines to ground. Thus, the controller will transition the other wordlines from the high voltage to ground after a delay.
1. A method for reading a NAND device, comprising:
reading a 3D (three dimensional) NAND device having a 3D stack with multiple wordlines vertically stacked, including setting the multiple wordlines to a high voltage bias, wherein the multiple wordlines include a bottom-most wordline, a top-most wordline, and middle wordlines between the bottom-most wordline and the top-most wordline;
transitioning a selected wordline of the multiple wordlines from the high voltage bias to ground, wherein the selected wordline is a selected middle wordline of the middle wordlines, the selected middle wordline being a critical wordline having a higher sensitivity to temperature change than other wordlines in the 3D stack;
delaying a transitioning of other wordlines of the multiple wordlines from the high voltage bias to ground relative to the transitioning of the selected wordline of the multiple wordlines from the high voltage bias to ground; and
transitioning the other wordlines from the high voltage bias to ground after the delaying.
2. The method of claim 1 , wherein the selected wordline comprises either the bottom-most wordline or the top-most wordline.
3. The method of claim 1 , wherein the selected middle wordline comprises a wordline halfway between the bottom-most wordline and the top-most wordline.
4. The method of claim 1 , wherein the selected middle wordline comprises a wordline selected for read.
5. The method of claim 1 , wherein the selected wordline is one among a plurality of selected wordlines.
6. The method of claim 5 , wherein the plurality of selected wordlines comprise wordlines between two critical wordlines that have a higher sensitivity to temperature change than other wordlines in the 3D stack.
7. The method of claim 1 , wherein transitioning the selected wordline from the high voltage bias to ground comprises transitioning the selected wordline from a pass voltage Vpassr to ground.
8. The method of claim 1 , wherein delaying the transitioning of the other wordlines, and transitioning the other wordlines from the high voltage bias to ground after the delaying comprises transitioning the other wordlines in groups of wordlines, with a transition delay between the transitioning of different groups of wordlines.
9. A NAND storage device, comprising:
a 3D (three dimensional) NAND array having a 3D stack with multiple wordlines vertically stacked, including a bottom-most wordline, a top-most wordline, and middle wordlines between the bottom-most wordline and the top-most wordline; and
a controller to read the 3D NAND array, including to set the multiple wordlines to a high voltage bias, transition a selected wordline of the multiple wordlines from the high voltage bias to ground, delay a transitioning of other wordlines of the multiple wordlines from the high voltage bias to ground relative to the transition of the selected wordline of the multiple wordlines from the high voltage bias to ground, and transition the other wordlines from the high voltage bias to ground after the delay, wherein the selected wordline is a selected middle wordline of the middle wordlines, the selected middle wordline being a critical wordline having a higher sensitivity to temperature change than other wordlines in the 3D stack.
10. The NAND storage device of claim 9 , wherein the selected wordline comprises either the bottom-most wordline or the top-most wordline.
11. The NAND storage device of claim 9 , wherein the selected middle wordline comprises a wordline halfway between the bottom-most wordline and the top-most wordline.
12. The NAND storage device of claim 9 , wherein the selected wordline is one among a plurality of selected wordlines.
13. The NAND storage device of claim 12 , wherein the plurality of selected wordlines comprise wordlines between two critical wordlines that have a higher sensitivity to temperature change than other wordlines in the 3D stack.
14. The NAND storage device of claim 9 , wherein the controller is to transition the selected wordline from a pass voltage Vpassr to ground.
15. The NAND storage device of claim 9 , wherein the controller is to transition the other wordlines in groups of wordlines, with a transition delay between the transitioning of different groups of wordlines.
16. The NAND storage device of claim 9 , wherein the NAND storage device comprises a solid state driver (SSD).