Translation device, test system including the same, and memory system including the translation device

1. A translation device comprising:

a plurality of first input/output (I/O) circuits configured to respectively transmit and receive first signals through a plurality of pins based on a pulse amplitude modulation (PAM)-M mode;

at least one second I/O circuit configured to transmit and receive a second signal through at least one pin based on a PAM-N mode; and

a translation circuit configured to translate the first signals into the second signal and to translate the second signal into the first signals,

wherein

M and N are different integers of 2 or more, and

wherein the first signals are received by first pins of the plurality of pins, translated into the second signal by the translation circuit and transmitted through a second pin of the at least one pin, and the second signal is received by the second pin, translated into the first signal by the translation circuit, and transmitted through the first pins.

2. The translation device of claim 1 , further comprising:

a plurality of first termination circuits respectively connected to the plurality of first I/O circuits and configured to each provide a first termination resistance; and

at least one second termination circuit connected to the at least one second I/O circuit and configured to provide a second termination resistance.

3. The translation device of claim 2 , wherein a termination type of each of the plurality of first termination circuits includes a center tapped termination (CTT) type, a pseudo open drain (POD) type, or a low voltage swing termination logic (LVSTL) type, and

a termination type of each of the at least one second termination circuit includes the CTT type, the POD type, or the LVSTL type.

4. The translation device of claim 2 , wherein each of the plurality of first termination circuits comprises at least one variable resistor to vary the first termination resistance, and

the at least one second termination circuit comprises at least one variable resistor to vary the second termination resistance.

5. The translation device of claim 1 , wherein M is 2, and each of the first signals is a non-return to zero (NRZ) signal modulated based on an NRZ mode, and

N is 4, and the second signal is a PAM-4 signal modulated based on a PAM-4 mode.

6. The translation device of claim 5 , wherein the plurality of first I/O circuits are configured to receive the first signals including a first NRZ signal and a second NRZ signal,

the translation circuit is configured to translate the first NRZ signal and the second NRZ signal into the PAM-4 signal, and

the at least one second I/O circuit is configured to transmit the PAM-4 signal.

7. The translation device of claim 6 , wherein the plurality of first I/O circuits are configured to sample each of the first NRZ signal and the second NRZ signal based on a first internal clock signal having a first frequency to generate a most significant bit and a least significant bit, and

the translation circuit comprises:

an aligner configured to generate an aligned signal from the most significant bit and the least significant bit based on the first internal clock signal;

a data selector configured to generate a selected signal from the aligned signal based on a second internal clock signal having a second frequency; and

a multiplexer configured to multiplex the selected signal based on a third internal clock signal having a third frequency which is higher than each of the first frequency and the second frequency.

8. The translation device of claim 5 , wherein the at least one second I/O circuit is configured to receive the second signal including the PAM-4 signal,

the translation circuit is configured to translate the PAM-4 signal into a first non-return to zero (NRZ) signal and a second NRZ signal, and

the plurality of first I/O circuits are configured to transmit the first NRZ signal and the second NRZ signal.

9. The translation device of claim 8 , wherein the at least one second I/O circuit is configured to sample the PAM-4 signal based on a first internal clock signal having a first frequency to generate a most significant bit and a least significant bit, and

the translation circuit comprises:

an aligner configured to generate an aligned signal from the most significant bit and the least significant bit based on the first internal clock signal;

a data selector configured to generate a first selected signal and a second selected signal from the aligned signal based on a second internal clock signal having a second frequency; and

a first multiplexer and a second multiplexer configured to respectively multiplex the first selected signal and the second selected signal based on a third internal clock signal having a third frequency which is higher than each of the first frequency and the second frequency.

10. The translation device of claim 1 , wherein M is 4, and each of the first signals is a PAM-4 signal modulated based on a PAM-4 mode, and

N is 2, and the second signal is a non-return to zero (NRZ) signal modulated based on an NRZ mode.

11. The translation device of claim 10 , wherein the plurality of first I/O circuits are configured to receive the first signals including a first PAM-4 signal and a second PAM-4 signal,

the translation circuit is configured to translate the first PAM-4 signal and the second PAM-4 signal into the NRZ signal, and

the at least one second I/O circuit is configured to transmit the NRZ signal.

12. The translation device of claim 10 , wherein the at least one second I/O circuit is configured to receive the second signal including the NRZ signal,

the translation circuit is configured to translate the NRZ signal into a first PAM-4 signal and a second PAM-4 signal, and

the plurality of first I/O circuits are configured to transmit the first PAM-4 signal and the second PAM-4 signal.

13. The translation device of claim 11 , wherein the translation device includes a built out test (BOT) device.

14. The translation device of claim 13 , wherein the plurality of first I/O circuits are connected to an automatic test equipment (ATE) through the plurality of pins, and

the at least one second I/O circuit is connected to a device under test (DUT) through the at least one pin.

15. The translation device of claim 13 , wherein the plurality of first I/O circuits are respectively connected to a plurality of device under tests (DUTs) through the plurality of pins, and

the at least one second I/O circuit is connected to an automatic test equipment (ATE) through the at least one pin.

16. A translation device comprising:

a first input/output (I/O) circuit configured to transmit and receive a first signal based on a pulse amplitude modulation (PAM)-M mode;

a second I/O circuit configured to transmit and receive a second signal based on a PAM-N mode;

a translation circuit configured to translate the first signal into the second signal and to translate the second signal into the first signal;

a first termination circuit disposed between a first I/O pin and the first I/O circuit and configured to provide a first termination resistance; and

a second termination circuit disposed between a second I/O pin and the second I/O circuit and configured to provide a second termination resistance,

wherein M and N are different integers of 2 or more,

wherein the first signal is received by the first I/O pin, translated into the second signal by the translation circuit and transmitted through the second I/O pin, and the second signal is received by the second I/O pin, translated into the first signal by the translation circuit, and transmitted through the first I/O pin.

17. The translation device of claim 16 , wherein a termination type of the first termination circuit includes a center tapped termination (CTT) type, a pseudo open drain (POD) type, or a low voltage swing termination logic (LVSTL) type, and

a termination type of the second termination circuit includes the CTT type, the POD type, or the LVSTL type.

18. The translation device of claim 16 , wherein the first termination circuit comprises at least one variable resistor to vary the first termination resistance, and

the second termination circuit comprises at least one variable resistor to vary the second termination resistance.

19. The translation device of claim 16 , wherein M is 2, and the first signal is a non-return to zero (NRZ) signal modulated based on an NRZ mode, and

N is 4, and the second signal is a PAM-4 signal modulated based on a PAM-4 mode.

20. The translation device of claim 19 , wherein the translation circuit comprises:

an aligner configured to align a plurality of sampled bits in the NRZ signal based on a first internal clock signal having a first frequency to generate an aligned signal;

a deserializer configured to deserialize the aligned signal based on a second internal clock signal having a second frequency to generate a selected signal; and

a multiplexer configured to multiplex the selected signal based on a third internal clock signal having a third frequency.