Two-terminator RF adapter for background/environment noise measurement
A two-terminator RF adapter for background noise measurement in a test environment comprises a system test port comprising a system test port termination and a system test port connector to connect to a system under test; and a data acquisition port, comprising a data acquisition port termination and a data acquisition port connector to connect to a data acquisition system.
1. A two-terminator RF adapter for background noise measurement in a test environment, comprising:
a system test port, comprising a system test port termination and a threaded system test port connector to connect to a system under test; and
a data acquisition port, comprising a data acquisition port termination and a threaded data acquisition port connector to connect to a data acquisition system;
wherein the system test port and the data acquisition port mechanically form a single piece with a continuous shield topology.
2. The two-terminator RF adapter of claim 1 , wherein the threaded system test port connector comprises a male connector and the threaded data acquisition port connector comprises a female connector.
3. The two-terminator RF adapter of claim 1 , wherein the threaded system test port connector comprises a female connector and the threaded data acquisition port connector comprises a male connector.
4. The two-terminator RF adapter of claim 1 , wherein the threaded system test port connector and the threaded data acquisition port connector are either both male connectors or both female connectors.
5. The two-terminator RF adapter of claim 1 , wherein the system test port termination comprises an open, short, 50 ohm, 75 ohm, or 100-ohm termination.
6. The two-terminator RF adapter of claim 1 , wherein the data acquisition port termination comprises an open, short, 50 ohm, 75 ohm, or 100-ohm termination.
7. The two-terminator RF adapter of claim 1 , wherein the two-terminator RF adapter further comprises a through connection for output of a response signal from the system under test and an internal electrical switch to switch the through connection to the system test port termination.