IP Library Granted Patent US 11,837,317
Granted Patent B2
US 11,837,317 · App. 17/409,064 · Granted Dec 5, 2023

Memory device, memory system, and operating method of memory system

Inventors: Sun Young Lim (Hwaseong-si, KR); Seung Yong Shin (Yongin-si, KR); Hyun Duk Cho (Yongin-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G11C7/1063G11C7/1057G11C7/1084G11C7/222
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Quick Facts
Patent No.
US 11,837,317
App. No.
17/409,064
Granted
Dec 5, 2023
Kind
B2
Abstract

A memory device including a plurality of nonvolatile memory chips each including a status output pin and a buffer chip configured to receive a plurality of internal state signals, which indicate states of the plurality of nonvolatile memory chips, from the status output pins and output an external state signal having a set period on the basis of the internal state signals indicating a particular state, wherein in a first section of the external state signal having the set period, a duty cycle of the external state signal determines depending on an identification (ID) of the nonvolatile memory chip which outputs the internal state signal indicating the particular state among the plurality of nonvolatile memory chips.

Claims (30)

1. A memory device comprising:

a plurality of nonvolatile memory chips each including a status output pin; and

a buffer chip configured to receive a plurality of internal state signals, which indicate states of the plurality of nonvolatile memory chips, from the status output pins and output an external state signal having a set period on the basis of the received internal state signals indicating a particular state,

wherein in a first time section of the external state signal having the set period, the buffer chip is configured to determine a duty cycle of the external state signal depending on an identification (ID) of a nonvolatile memory chip which outputs the internal state signal indicating the particular state among the plurality of nonvolatile memory chips, and

wherein the buffer chip is configured to provide a read or a write command to at least one of the plurality of nonvolatile memory chips.

2. The memory device of claim 1 , wherein the duty cycle of the external state signal is proportional to the ID of the nonvolatile memory chip which outputs the internal state signal indicating the particular state among the plurality of nonvolatile memory chips.

3. The memory device of claim 1 , wherein the plurality of nonvolatile memory chips include n (n is a natural number) nonvolatile memory chips which receive a clock signal, and

wherein the set period of the external state signal is greater than n times a period of the clock signal.

4. The memory device of claim 1 , wherein:

the external state signal further includes a second time section which has the set period,

the first time section is subsequent to the second time section,

the particular state includes a first state, a second state, and a third state which differ from each other, and

in the second time section, the buffer chip is configured to determine the duty cycle of the external state signal depending on which one of the first state, the second state, and the third state is the particular state.

5. The memory device of claim 4 , wherein:

the plurality of nonvolatile memory chips include n (n is a natural number) nonvolatile memory chips which receive a clock signal,

when the particular state is the first state, the duty cycle of the external state signal is j times a period of the clock signal in the second time section,

when the particular state is the second state, the duty cycle of the external state signal is m times the period of the clock signal in the second time section, and

when the particular state is the third state, the duty cycle of the external state signal is k times the period of the clock signal in the second time section, where j, m, and k are different natural numbers.

6. The memory device of claim 1 , wherein:

the external state signal further includes a second ii aye section which has the set period and is subsequent to the first time section,

the particular state includes a first state, a second state, and a third state which differ from each other, and

in the second time section, the buffer chip is configured to determine the duty cycle of the external state signal depending on which one of the first state, the second state, and the third state is the particular state.

7. The memory device of claim 1 , wherein the nonvolatile memory chip is configured to output the internal state signal in response to the read or the write command being provided from the buffer chip.

8. The memory device of claim 1 , wherein:

the particular state is a ready state,

the plurality of nonvolatile memory chips include a first nonvolatile memory chip and a second nonvolatile memory chip,

the first nonvolatile memory chip is configured to output a first internal state signal, which indicates the ready state, through the status output pin of the first nonvolatile memory chip at a first time point,

the second nonvolatile memory chip is configured to output a second internal state signal, which indicates the ready state, through the status output pin of the second nonvolatile memory chip at a second time point after the first time point,

the buffer chip is configured to output the external state signal including the first time section and a second time section subsequent to the first time section, which have a set period, and

the duty cycle of the external state signal is proportional to an ID of the first nonvolatile memory chip in the first time section and is proportional to an ID of the second nonvolatile memory chip in the second time section.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2021
From: LIM, SUN YOUNG; SHIN, SEUNG YONG; CHO, HYUN DUK
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 057344/0634 →
Priority Claims (1)
KR 10-2020-0166312 · Dec 2, 2020 · national
Continuity (1)
Related Publication 20220172753A1 · Jun 2, 2022