Scanning probe microscope with a sample holder fed with electromagnetic wave signals

1. A scanning probe microscope comprising:

a holder having at least one electric port, said holder configured to support a sample to be imaged;

a probe;

an actuator configured to move at least one of the holder and the probe up to three directions; and

a reflectometer configured to measure reflection or transmission coefficients at each of the at least one electric ports of said holder by feeding each of the at least one electric ports of said holder with electromagnetic wave signals.

2. The scanning probe microscope of claim 1 , wherein said probe is made of or coated by an electrically conducting or semiconducting material.

3. The scanning probe microscope of claim 1 , further comprising at least one matching circuit in a particular impedance.

4. The scanning probe microscope of claim 1 , wherein a first corresponding port of said reflectometer is electrically connected or coupled to a first port of said holder.

5. The scanning probe microscope of claim 4 , wherein a second corresponding port of said reflectometer is electrically connected or coupled to a second port of said holder.

6. The scanning probe microscope of claim 4 , wherein an auxiliary port of said reflectometer is electrically connected or coupled to said probe.

7. The scanning probe microscope of claim 1 , wherein said actuator comprises a piezo actuator.

8. The scanning probe microscope of claim 1 , wherein said reflectometer comprises a planar or non-planar waveguide with at least one corresponding electric port.

9. The scanning probe microscope of claim 8 , wherein said waveguide is a transmission line, such as a microstrip, a coplanar waveguide or a slotline.

10. The scanning probe microscope of claim 9 , wherein said transmission line comprises a substrate and at least one stripes or one or more patterns, the stripes or patterns being on or in the substrate.

11. The scanning probe microscope of claim 10 , wherein said substrate is made of an electrically insulating material selected from the group consisting of glass, quartz, alumina, FR4, PTFE, ceramic and epoxy.

12. The scanning probe microscope of claim 10 , wherein any of said stripes or patterns is made of an electrically conductive material, selected from the group consisting of copper, aluminum, silver and gold.

13. The scanning probe microscope of claim 12 , wherein any of said stripes or patterns has a coating made of gold.

14. The scanning probe microscope of claim 12 , wherein any of said stripes or patterns has a sheath of electrically insulating material.

15. The scanning probe microscope of claim 10 , wherein said substrate has a first side and a second side, said first side being arranged to be in contact with said sample.

16. The scanning probe microscope of claim 10 , wherein any of said stripes or patterns is located on a same side of the substrate.

17. The scanning probe microscope of claim 8 , wherein said waveguide is a hollow or dielectric-filled conductive pipe, a dielectric pipe or rod, or an electromagnetic wave fiber.

18. The scanning probe microscope of claim 17 , wherein said holder is a resonant tank, a directional coupler, a power combiner, a power splitter, an electromagnetic wave circulator, or an electromagnetic wave transformer.

19. The scanning probe microscope of claim 1 , wherein said holder comprises a lumped passive circuit with or without at least one excitation active circuit.