A microscope includes: an electronic optical column configured to emit scanning electron beams; a specimen stage configured to place a specimen; a target movably disposed between the electronic optical column and the specimen stage; and a driving mechanism for driving the target to move between a first position and a second position, wherein the first position is a position at which the electron beams act on the specimen, and the second position is a position at which the electron beams act on the target to generate X-rays irradiating the specimen. In the present disclosure, through one time mounting of the specimen, the microscope enables the dual-function detection of the specimen, i.e., detection of the specimen by an SEM and detection of the specimen by a Nano-CT.
1. A microscope, comprising:
an electronic optical column, configured to emit scanning electron beams;
a specimen stage, configured to place a specimen;
a target, movably disposed between the electronic optical column and the specimen stage;
a driving mechanism, configured to drive the target to move between a first position and a second position, wherein the first position is a position at which the electron beams act on the specimen, and the second position is a position at which the electron beams act on the target to generate X-rays irradiating the specimen;
a first deflection device, wherein the first deflection device is disposed between the electronic optical column and the target, and is configured to change a direction of movement of the electron beams before the electron beams are incident on the target; and
a mounting base, wherein the mounting base is provided with at least one mounting position, and each mounting position is configured to mount different targets;
wherein the first deflection device is connected to the mounting base, and the mounting base is connected to the driving mechanism.
2. The microscope of claim 1 , wherein the mounting base is provided with a cooling pipeline configured to cool the target.
3. The microscope of claim 1 , wherein an X-ray detector is disposed below the specimen stage.
4. The microscope of claim 1 , wherein a lower end of the electronic optical column is connected with a vacuum chamber, the specimen stage is located in the vacuum chamber, and the specimen stage is disposed below the electronic optical column.
5. The microscope of claim 4 , wherein the vacuum chamber is provided with a vacuum window corresponding to a lower side of the specimen stage.
6. The microscope of claim 5 , wherein an X-ray detector is disposed below the vacuum window.
7. The microscope of claim 4 , wherein the specimen stage is connected to the vacuum chamber through a lifting mechanism, so as to drive the specimen stage to move up and down in the vacuum chamber.