Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events
In some examples, a method of operating a circuit is described. The method may include performing a circuit function and estimating a probability of failure of the circuit based on one or more stress origination metrics, one or more stress victim events, and one or more initial state conditions.
1. A circuit comprising:
a function unit configured to perform a circuit function;
a memory configured to store stress data associated with use of the circuit, wherein the stress data includes one or more stress origination metrics measured during use of the circuit, one or more stress victim events identified during use of the circuit, and one or more initial state conditions associated with manufacturing the circuit; and
a failure prediction unit configured to estimate a probability of failure of the circuit based on the one or more stress origination metrics, the one or more stress victim events, and the one or more initial state conditions.
2. The circuit of claim 1 , further comprising one or more sensors configured to determine the one or more stress origination metrics.
3. The circuit of claim 1 , further comprising one or more elements configured to identify the one or more stress victim events.
4. The circuit of claim 3 , wherein the one or more elements configured to identify the one or more stress victim events comprise one or more counters configured to count a number of stress victim events.
5. The circuit of claim 1 , wherein the one or more stress origination metrics comprise one or more measurements selected from a group consisting of:
a measured temperature associated with the circuit,
a measured humidity associated with the circuit,
a measured current associated with the circuit,
a measured voltage associated with the circuit,
a measured switching frequency associated with a switch within the circuit,
a measured clock frequency associated with the circuit, and
a measured operating time associated with the circuit.
6. The circuit of claim 1 ,
wherein the one or more stress victim events comprise one or more measured events selected from a group consisting of:
a frequency change associated with a ring oscillation circuit;
a failure event associated with the circuit; and
a timing drift associated with the circuit.
7. The circuit of claim 1 , wherein the initial state conditions include initial state conditions measured for the circuit during a manufacturing process.
8. The circuit of claim 7 , wherein the initial state conditions include acceptability statistics associated with manufacturing of a batch of circuits, wherein the circuit is part of the batch of circuits.
9. The circuit of claim 7 , wherein the initial state conditions include distribution information of the circuit relative to a batch of circuits, wherein the circuit is part of the batch of circuits.
10. The circuit of claim 1 , wherein the failure prediction unit is further configured to output an alert in response to identifying that the probability of failure is greater than a threshold.
11. The circuit of claim 1 , wherein the failure prediction unit is further configured to disable at least a portion of the circuit in response to identifying that the probability of failure is greater than a threshold.
12. The circuit of claim 1 , wherein function unit comprises one or more circuit units selected from a group consisting of:
a driver circuit;
a logic circuit;
a motor driver;
a driver circuit for driving a load;
an oscillator circuit;
a level shifter circuit;
a phase shift circuit;
a phase locked loop circuit;
an analog-to-digital converter circuit;
a digital-to-analog converter circuit;
an arithmetic logic unit (ALU);
a processor;
a microcontroller;
a digital signal processor (DSP);
a communication interface circuit;
a digital logic circuit;
a state machine;
a signal processing circuit;
a control circuit;
an analog circuit; or
a memory circuit.
13. A method of operating a circuit, the method comprising:
performing a circuit function; and
estimating a probability of failure of the circuit based on one or more stress origination metrics, one or more stress victim events, and one or more initial state conditions.
14. The method of claim 13 , further comprising:
storing the one or more stress origination metrics, the one or more stress victim events, and the one or more initial state conditions in a memory associated with the circuit.
15. The method of claim 14 , further comprising:
determining the one or more stress origination metrics based on sensor data from one or more sensors associated with the circuit.
16. The method of claim 14 , further comprising:
identifying the stress victim events via one or more circuit elements associated with the circuit.
17. The method of claim 16 , wherein identifying the stress victim events comprising counting the stress victim events via one or more counters associated with the circuit.
18. The method of claim 13 , wherein the one or more stress origination metrics comprise one or more measurements selected from a group consisting of:
a measured temperature associated with the circuit,
a measured humidity associated with the circuit,
a measured current associated with the circuit,
a measured voltage associated with the circuit,
a measured switching frequency associated with a switch within the circuit,
a measured clock frequency associated with the circuit, and
a measured operating time associated with the circuit.
19. The method of claim 13 ,
wherein the one or more stress victim events comprise one or more measured events selected from a group consisting of:
a frequency change associated with a ring oscillation circuit;
a failure event associated with the circuit; and
a timing drift associated with the circuit.
20. The method of claim 13 , wherein the initial state conditions include initial state conditions measured for the circuit during a manufacturing process.
21. The method of claim 20 , wherein the initial state conditions include acceptability statistics associated with manufacturing of a batch of circuits and distribution information of the circuit relative to the batch of circuits, wherein the circuit is part of the batch of circuits.
22. The method of claim 13 , further comprising outputting an alert in response to identifying that the probability of failure is greater than a threshold.