Methods, systems, and header structures for tooling fixture and post-cure fixture calibration
Systems and methods provide for the determination and correction of tooling deviation by comparing two different three-dimensional surface scans of a composite panel after curing. Such methods and systems may allow for less accurate post-cure fixturing (e.g., holding the panel in a less constrained state, as compared to prior art techniques), while still maintaining a sufficient amount of precision for predictive shimming and shimless techniques. Methods include performing a first three-dimensional surface scan, performing a second three-dimensional surface scan, and comparing the two to determine a deformation function corresponding to tooling deviation. In some systems, a header structure is used to hold the composite panel in a nominal configuration for the second three-dimensional surface scan. In some systems, scanning devices perform mirrored scanning on either side of the composite panel, using a common reference frame.
1. A method of mirrored scanning for determining deviation introduced into a panel during manufacturing, wherein the panel comprises an outer surface and an inner surface, the method comprising:
fixturing the panel by holding it at at least two locations via a fixture;
performing a first metrology scan on the outer surface of the panel, with respect to a reference frame, thereby producing a first 3D surface scan of the outer surface of the panel;
performing a second metrology scan on the inner surface of the panel, with respect to the reference frame, thereby producing a second 3D surface scan of the inner surface of the panel, wherein the inner surface is opposite the outer surface; and
determining an inner mold line (IML) surface relative to an outer mold line (OML) surface, using the first 3D surface scan and the second 3D surface scan, thereby characterizing tooling deviation of a tooling fixture used to form the panel.
2. The method according to claim 1 , further comprising machining a portion of the panel, after the determining the IML surface relative to the OML surface.
3. The method according to claim 1 , further comprising analytically deforming the OML surface to a virtual nominal configuration.
4. The method according to claim 1 , wherein the performing the first metrology scan and the performing the second metrology scan are performed substantially simultaneously.
5. The method according to claim 1 , further comprising creating the reference frame to align the first 3D surface scan and the second 3D surface scan, using known fiducials from the inner surface and the outer surface.
6. The method according to claim 1 , wherein the performing the second metrology scan is performed while the panel is positioned on a mandrel used in manufacturing the panel.
7. The method according to claim 1 , wherein the determining the IML surface relative to the OML surface is performed by at least one processing unit.
8. The method according to claim 1 , further comprising identifying a set of reference geometry using the first 3D surface scan.
9. The method according to claim 1 , further comprising using the first 3D surface scan and the second 3D surface scan in conjunction with known data analytics to correct for tooling deviation seen in production.
10. The method according to claim 1 , further comprising using the first 3D surface scan and the second 3D surface scan in conjunction with known data analytics to create a data set representing an offset distance between the IML surface and the OML surface.
11. The method according to claim 1 , wherein the fixturing the panel comprises holding the panel such that the inner surface and the outer surface are configured to have 3D surface scans performed thereon while the panel is held by the fixture.
12. The method according to claim 1 , wherein the first metrology scan is performed by a first scanning device, and wherein the second metrology scan is a tooling deviation scan performed by a second scanning device.
13. The method according to claim 12 , wherein one or both of the first scanning device and the second scanning device comprises a non-contact scanning device spaced apart from the panel.
14. The method according to claim 12 , wherein one or both of the first scanning device and the second scanning device comprises a contact scanning device configured to physically contact the panel during scanning.
15. The method according to claim 12 , wherein one or both of the first scanning device and the second scanning device comprises at least one selected from the group consisting of a coordinate measuring machine (CMM), an articulated arm suspended from a traveling carriage, and a touch probe.
16. The method according to claim 12 , wherein the first scanning device and/or the second scanning device comprises at least one selected from the group consisting of a time-of-flight 3D laser scanner, a triangulation-based 3D laser scanner, a hand-held laser scanner, a structured-light 3D scanner, a modulated light 3D scanner, a stereoscopic video camera system, a photometric camera system, a laser-pulse-based 3D scanner, a laser phase-shift 3D scanner, and a lidar system.
17. The method according to claim 12 , wherein the first scanning device is positioned facing the outer surface of the panel, and wherein the second scanning device is positioned facing the inner surface of the panel, such that the first scanning device and the second scanning device are positioned on opposite sides of the panel.
18. The method according to claim 1 , further comprising determining a deformation function of the tooling deviation determined in the tooling fixture, and compensating for the tooling deviation.
19. The method according to claim 1 , wherein the first metrology scan is performed by a first scanning device, wherein the second metrology scan is performed by the first scanning device, and wherein the method further comprises moving the panel with respect to the first scanning device in between the performing the first metrology scan and the performing the second metrology scan, such that the panel is oriented in a first orientation during the performing the first metrology scan and such that the panel is oriented in a second orientation during the performing the second metrology scan.
20. The method according to claim 1 , wherein the first metrology scan is performed by a first scanning device, wherein the second metrology scan is performed by the first scanning device, and wherein the method further comprises moving the first scanning device with respect to the panel in between the performing the first metrology scan and the performing the second metrology scan, such that the first scanning device is positioned to scan the outer surface of the panel during the performing the first metrology scan and such that the first scanning device is positioned to scan the inner surface of the panel during the performing the second metrology scan.