Method and system for advanced autofocusing spectroscopy
A spectroscopic autofocusing method and a system for such a method are disclosed. According to one embodiment, a spectroscopic autofocusing method includes applying a plurality of electrical signals to a shape changing lens of a spectroscopy system. The method includes emitting, by an optical source coupled to the spectroscopy system, one or more optical signals directed to a target. The method includes determining, by a detector, one or more power measurements of one or more returned optical signals corresponding to an illuminated area of the target. The method includes aggregating, from the detector, the one or more power measurements, wherein each power measurement corresponds to a respective electrical signal of the plurality of electrical signals applied to the shape changing lens. The method includes determining an optimized electrical signal corresponding to a maximum power measurement indicated by the one or more power measurements.
1. A spectroscopic autofocusing method comprising:
applying a plurality of electrical signals to a shape changing lens of a spectroscopy system;
emitting, by an optical source coupled to the spectroscopy system, one or more optical signals directed to a target;
determining, by a detector, one or more power measurements of one or more returned optical signals corresponding to an illuminated area of the target;
aggregating, from the detector, the one or more power measurements, wherein each power measurement is a function of a respective electrical signal of the plurality of electrical signals applied to the shape changing lens; and
determining an optimized electrical signal corresponding to a maximum power measurement based on a curve fit between the one or more power measurements and current values of the electrical signals applied to the shape changing lens.
2. The method of claim 1 , wherein a shape of the shape changing lens changes as a function of the electrical signal applied to the shape changing lens.
3. The method of claim 2 , wherein the shape comprises a curvature.
4. The method of claim 2 , wherein a focal length of the spectroscopy system changes as a function of the shape of the shape changing lens.
5. The method of claim 1 , wherein the optical source comprises a laser.
6. The method of claim 1 , wherein the spectroscopy system comprises the optical source.
7. The method of claim 1 , wherein the optical source is externally coupled to the spectroscopy system.
8. The method of claim 1 , wherein the optical signals comprise pulsed light.
9. The method of claim 1 , wherein the optical signals comprise continuous light.
10. The method of claim 1 , wherein the spectroscopy system comprises the detector.
11. The method of claim 1 , wherein the detector is externally coupled to the spectroscopy system.
12. The method of claim 1 , wherein the detector comprises a photodiode or a spectrometer.
13. The method of claim 1 , further comprising:
capturing one or more images of the target using one or more cameras subject to the one or more optical signals directed to the target;
processing the one or more images to determine three-dimensional topographical information and distance information; and
determining an optimized configuration of the shape changing lens for focusing the spectroscopy system on the target.
14. The method of claim 1 , wherein the one or more returned optical signals are at least one of emitted, scattered, and luminesced from the target.
15. The method of claim 1 , wherein determining an optimized electrical signal corresponding to a maximum power measurement further comprises:
determining the curve fit for the one or more power measurements as the function of the plurality of electrical signals applied to the shape changing lens;
determining the maximum power measurement indicated by the curve fit within a range of electrical signals corresponding to the plurality of electrical signals; and
determining the optimized electrical signal corresponding to the maximum power measurement indicated by the curve fit.
16. The method of claim 15 , wherein the curve fit comprises a Gaussian fit or a polynomial fit.
17. The method of claim 1 , further comprising:
applying the optimized electrical signal to the shape changing lens to focus the spectroscopy system on the target.
18. The method of claim 1 , further comprising:
measuring, by a spectrometer, the one or more returned signals; and
analyzing one or more spectral properties of the target based on the one or more returned signals.
19. The method of claim 18 , wherein the spectrometer is externally coupled to the spectroscopy system.
20. A spectroscopy system comprising:
an optical source configured to emit one or more optical signals directed to a target;
a shape changing lens coupled to a controller, wherein the shape changing lens is configured to optically couple to the optical source and the target; and
a detector coupled to the controller, wherein the detector is configured to optically couple to the shape changing lens and determine one or more power measurements of one or more returned optical signals corresponding to an illuminated area of the target,
wherein the controller is configured to:
apply a plurality of electrical signals to the shape changing lens,
aggregate the one or more power measurements, wherein each power measurement is a function of a respective electrical signal of the plurality of electrical signals applied to the shape changing lens, and
determine an optimized electrical signal corresponding to a maximum power measurement based on a curve fit between the one or more power measurements and current values of the electrical signals applied to the shape changing lens.
21. The system of claim 20 , wherein a shape of the shape changing lens changes as a function of the electrical signal applied to the shape changing lens.
22. The system of claim 21 , wherein the shape comprises a curvature.
23. The system of claim 21 , wherein a working distance relative to the target changes as a function of the shape of the shape changing lens.
24. The system of claim 20 , wherein the optical source comprises a laser.
25. The system of claim 20 , wherein the optical source is configured to removably couple to the spectroscopy system.
26. The system of claim 20 , wherein the optical signals comprise pulsed light.
27. The system of claim 20 , wherein the optical signals comprise continuous light.
28. The system of claim 20 , wherein the detector is configured to removably couple to the spectroscopy system.
29. The system of claim 20 , wherein the detector comprises a photodiode or a spectrometer.
30. The system of claim 20 , wherein the controller configured to:
receive one or more images of the target captured by one or more cameras subject to the one or more optical signals directed to the target;
process the one or more images to determine three-dimensional topographical information and distance information; and
determine an optimized configuration of the shape changing lens for focusing the spectroscopy system on the target.
31. The system of claim 20 , wherein the one or more returned optical signals are at least one of emitted, scattered, and luminesced from the target.
32. The system of claim 20 , wherein the controller being configured to determine an optimized electrical signal corresponding to a maximum power measurement further comprises the controller being configured to:
determine the curve fit for the one or more power measurements as the function of the plurality of electrical signals applied to the shape changing lens;
determine the maximum power measurement indicated by the curve fit within a range of electrical signals corresponding to the plurality of electrical signals; and
determine the optimized electrical signal corresponding to the maximum power measurement indicated by the curve fit.
33. The system of claim 32 , wherein the curve fit comprises a Gaussian fit or a polynomial fit.
34. The system of claim 20 , wherein the controller is configured to apply the optimized electrical signal to the shape changing lens to focus the spectroscopy system on the target.
35. The system of claim 20 , further comprising a spectrometer, wherein the spectrometer is coupled to the controller and is configured to:
measure the one or more returned signals, and
analyze one or more spectral properties of the target based on the one or more returned signals.
36. The system of claim 35 , wherein the spectrometer is configured to removably couple to the spectroscopy system.