Method and apparatus for mitigating tin debris
Microwave heating of debris collecting vanes within the source vessel of a lithography apparatus is used to accomplish uniform temperature distribution in order to reduce fall-on contamination and formation of clogs on the inner and outer surfaces of the vanes.
1. An extreme ultra violet (EUV) lithography apparatus, comprising:
a plasma chamber;
a vane configured to collect debris generated in the plasma chamber; and
a microwave generator configured to heat the vane with microwave radiation,
wherein the microwave generator is at least one of a klystron, a magnetron and a solid-state microwave power generator (SSPG).
2. The apparatus of claim 1 , further comprising a temperature sensor configured to monitor a surface temperature of the vane.
3. The apparatus of claim 2 , wherein the temperature sensor is disposed within the plasma chamber.
4. The apparatus of claim 3 , wherein the temperature sensor is a contact temperature sensor comprising at least one of: a thermocouple, a resistance temperature detector, a thermistor and a semiconductor temperature sensor.
5. The apparatus of claim 2 , wherein the temperature sensor is disposed outside plasma chamber.
6. The apparatus of claim 5 , wherein the temperature sensor is a non-contact temperature sensor comprising at least one of: a thermometer, a thermal imager, an optical pyrometer and a fiber optic temperature sensor.
7. The apparatus of claim 2 , further comprising a controller configured to monitor the temperature of the vane with the temperature sensor and activating the microwave generator in accordance with the temperature.
8. The apparatus of claim 1 , further comprising a conduit configured to direct microwaves from the microwave generator into the plasma chamber.
9. The apparatus of claim 8 , wherein the vane is metallic and an exterior of the vane is coated with an absorption material for absorbing the microwaves from the microwave generator.
10. The apparatus of claim 1 , further comprising a conduit configured to direct the microwaves to an interior of the vane.
11. The apparatus of claim 1 , further comprising a plurality of vanes aligned so that their longitudinal axes surround an optical axis of the plasma chamber.
12. The apparatus of claim 1 , further comprising a container configured to collect debris from the vane.
13. The apparatus of claim 1 , further comprising a metal mesh configured to shield an opening of the plasma chamber to prevent leakage of the microwaves.
14. An extreme ultra violet (EUV) lithography method, comprising:
generating EUV light in a chamber having an optical axis in a direction towards a reticle stage and a plurality of vanes disposed on an inner surface of the chamber surrounding the optical axis;
generating microwaves to heat the plurality of vanes using a microwave generator; and
directing the microwaves to an interior of the plurality of vanes using a conduit.
15. The method of claim 14 , further comprising
coating an interior surface of at least one of the vanes with an absorption material configured to absorb the microwaves from the microwave generator and heat the external surface of the vane.
16. The method of claim 14 , further comprising supporting the vanes on a support frame that is removable from the chamber.
17. The method of claim 14 , wherein the microwave generator is at least one of a klystron, a magnetron and a solid-state microwave power generator (SSPG).
18. An extreme ultra violet (EUV) lithography method, comprising:
activating a droplet generator and a laser generator configured to produce a plasma and EUV light within a source vessel;
monitoring a surface temperature of a vane disposed within the source vessel for collecting debris from the plasma;
activating a microwave generator for heating the vane to a temperature to melt the debris, and
maintaining the surface temperature of the vane substantially between 150 degrees Celsius and 400 degrees Celsius.
19. The method of claim 18 , further comprising maintaining the surface temperature by at least one of: continuously activating the microwave generator, intermittently activating the microwave generator, and adjusting a power level of the microwave generator in response to the surface temperature.
20. The method of claim 18 , wherein the microwave generator is at least one of a klystron, a magnetron and a solid-state microwave power generator (SSPG).