Cutting instrument with improved surface topography
Various embodiments for an improved cutting instrument defining one or more angularly-oriented cutting fasciae having uniform cutting surfaces with reduced surface topography are disclosed.
1. A cutting instrument, comprising:
a blade body having two opposing faces and a cutting wedge comprising:
a leading edge; and
one or more cutting fasciae extending from at least one of the two opposing faces and defining at least a portion of the leading edge, wherein the one or more cutting fasciae have a surface roughness comprising:
a measured arithmetic mean height (S a ) of 150 nm or less with a standard deviation of 30 nm or less across a measurement area of 16,641 square microns on at least a portion of the one or more cutting fasciae; and
one or more of: (1) a measured maximum height (S t ) of 1.5 μm or less with a standard deviation of 0.4 μm or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae; or (2) a measured arithmetic mean peak curvature (S pc ) of 150 mm −1 or less with a standard deviation of 30 mm −1 or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae.
2. The cutting instrument of claim 1 , wherein the surface roughness is formed into the one or more cutting fasciae using a process that removes material.
3. The cutting instrument of claim 2 , wherein the process that removes the material comprises a chemical-mechanical polishing (CMP) process.
4. The cutting instrument of claim 2 , wherein the process that removes the material uses a polishing pad that does not extend from one of the two opposing faces to beyond the leading edge.
5. The cutting instrument of claim 1 , wherein the at least the portion of the one or more cutting fasciae comprises at least 50% of the one or more cutting fasciae.
6. The cutting instrument of claim 1 , wherein:
the surface roughness is formed into the one or more cutting fasciae using a process that removes material;
the process that removes the material comprises a chemical-mechanical polishing (CMP) process;
the process that removes the material uses a polishing pad that does not extend from one of the two opposing faces to beyond the leading edge; and
the at least the portion of the one or more cutting fasciae comprises at least 50% of the one or more cutting fasciae.
7. A cutting instrument, comprising:
a blade body having two opposing faces and a cutting wedge comprising:
a leading edge; and
one or more cutting fasciae extending from at least one of the two opposing faces and defining at least a portion of the leading edge, wherein the one or more cutting fasciae have a surface roughness comprising:
a measured dale void volume (V vv ) of 0.02 μm 3 /μm 2 or less with a standard deviation of 0.005 μm 3 /μm 2 or less across a measurement area of 16,641 square microns on at least a portion of the one or more cutting fasciae; and
one or more of: (1) a measured maximum height (S t ) of 1.5 μm or less with a standard deviation of 0.4 μm or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae; or (2) a measured arithmetic mean peak curvature (S pc ) of 150 mm −1 or less with a standard deviation of 30 mm −1 or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae.
8. The cutting instrument of claim 7 , wherein the surface roughness is formed into the one or more cutting fasciae using a process that removes material.
9. The cutting instrument of claim 8 , wherein the process that removes the material comprises a chemical-mechanical polishing (CMP) process.
10. The cutting instrument of claim 8 , wherein the process that removes the material uses a polishing pad that does not extend from one of the two opposing faces to beyond the leading edge.
11. The cutting instrument of claim 7 , wherein the at least the portion of the one or more cutting fasciae comprises at least 50% of the one or more cutting fasciae.
12. The cutting instrument of claim 7 , wherein:
the surface roughness is formed into the one or more cutting fasciae using a process that removes material;
the process that removes the material comprises a chemical-mechanical polishing (CMP) process;
the process that removes the material uses a polishing pad that does not extend from one of the two opposing faces to beyond the leading edge; and
the at least the portion of the one or more cutting fasciae comprises at least 50% of the one or more cutting fasciae.
13. A cutting instrument, comprising:
a blade body having two opposing faces and a cutting wedge comprising:
a leading edge; and
one or more cutting fasciae extending from at least one of the two opposing faces and defining at least a portion of the leading edge, wherein the one or more cutting fasciae have a surface roughness comprising:
a measured arithmetic mean height (S a ) of 150 nm or less with a standard deviation of 30 nm or less across a measurement area of 16,641 square microns on at least a portion of the one or more cutting fasciae; and
a measured dale void volume (V vv ) of 0.02 μm 3 /μm 2 or less with a standard deviation of 0.005 μm 3 /μm 2 or less across the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae.
14. The cutting instrument of claim 13 , wherein the one or more cutting fasciae have the surface roughness further comprising:
one or more of: (1) a measured maximum height (S t ) of 1.5 μm or less with a standard deviation of 0.4 μm or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae; or (2) a measured arithmetic mean peak curvature (S pc ) of 150 mm −1 or less with a standard deviation of 30 mm −1 or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae.
15. The cutting instrument of claim 13 , wherein the one or more cutting fasciae have the surface roughness further comprising:
a measured maximum height (S t ) of 1.5 μm or less with a standard deviation of 0.4 μm or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae; and
a measured arithmetic mean peak curvature (S pc ) of 150 mm −1 or less with a standard deviation of 30 mm −1 or less within the measurement area of 16,641 square microns on the at least the portion of the one or more cutting fasciae.
16. The cutting instrument of claim 13 , wherein the surface roughness is formed into the one or more cutting fasciae using a process that removes material.
17. The cutting instrument of claim 16 , wherein the process that removes the material comprises a chemical-mechanical polishing (CMP) process.
18. The cutting instrument of claim 16 , wherein the process that removes the material uses a polishing pad that does not extend from one of the two opposing faces to beyond the leading edge.
19. The cutting instrument of claim 13 , wherein the at least the portion of the one or more cutting fasciae comprises at least 50% of the one or more cutting fasciae.
20. The cutting instrument of claim 13 , wherein:
the surface roughness is formed into the one or more cutting fasciae using a process that removes material;
the process that removes the material comprises a chemical-mechanical polishing (CMP) process;
the process that removes the material uses a polishing pad that does not extend from one of the two opposing faces to beyond the leading edge; and
the at least the portion of the one or more cutting fasciae comprises at least 50% of the one or more cutting fasciae.