IP Library Granted Patent US 11,867,736
Granted Patent B1
US 11,867,736 · App. 17/514,558 · Granted Jan 9, 2024

Load pull system using waveguide tuner

Inventor: Christos Tsironis (Kirkland, CA)
G01R27/32G01R31/2822G01R35/005
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Quick Facts
Patent No.
US 11,867,736
App. No.
17/514,558
Granted
Jan 9, 2024
Kind
B1
Abstract

A load-pull measurement system uses a PC controller, interface, calibration method and at least one new two-probe, waveguide slide screw impedance tuner; the tuner probes share the same waveguide section; they are inserted diametrically at fixed depth into facing each other slots on opposite broad walls of the waveguide. The tuner does not have cumbersome adjustable vertical axes controlling the penetration of the probes and its low profile is optimized for on-wafer operations. The carriages holding the probes are moved along the waveguide using electric stepper motors or linear actuators.

Claims (73)

1. An automated load pull tuner comprising:

a slotted rectangular waveguide transmission line, having an input port and an output port,

two conductive broad walls and two conductive narrow sidewalls,

two remotely controlled mobile carriages C # 1 and C # 2 sliding along the waveguide transmission line,

wherein

each carriage controls a tuning probe inserted into longitudinal slots into the waveguide transmission line,

and wherein

the slots are placed diametral across the opposite broad walls of the waveguide transmission line,

and wherein

the mobile carriage C # 1 controls a tuning probe P # 1 and the mobile carriage C # 2 controls a tuning probe P # 2 .

2. The automated load pull tuner of claim 1 ,

wherein

the tuning probes are at least partially conductive rods, have a diameter D and fit contactless into the slots,

and wherein

the slots are positioned symmetrically offset of a center line along the waveguide transmission line by at least one half of the diameter D of the tuning probes, which are inserted diametral into the slots from the opposite broad walls and are kept at a fixed penetration into the slots during movement along the waveguide transmission line.

3. The automated load pull tuner of claim 2 ,

wherein

the carriage C # 1 moves the tuning probe P # 1 to a position X 1 along the waveguide transmission line from the input port and the carriage C # 2 moves the tuning probe P # 2 to a position X 2 along the waveguide transmission line from the input port,

and wherein

the tuning probes P # 1 and P # 2 have a common initial position at a distance X 1 =X 2 =X 0 from the input port along the waveguide transmission line.

4. The automated load pull tuner of claim 2 ,

wherein

the slots are at least one half of a wavelength (λ/2) long at a minimum frequency of operation (Fmin) of the automated load pull tuner.

5. A calibration method for the automated load pull tuner of claim 1 comprising the following steps:

a) connect the automated load pull tuner to a vector network analyzer, calibrated at a frequency F;

b) initialize both tuning probes by moving them to positions X 1 =X 2 =X 0 along the waveguide transmission line relative to the input port;

c) measure s-parameters of the automated load pull tuner and save in a zero matrix [S 0 ];

d) in a movement-measurement loop:

move the tuning probe P # 1 to a multitude M>1 of positions X 1 ,

whereby X 0 ≤X 1 ≤X 0 +λ(F)/2,

measure s-parameters Sij(X 1 ), whereby {i,j}={1,2},

save (X 1 ,Sij(X 1 )) in a data file S 1 ;

e) move the probe P # 1 to the position X 1 =X 0 ;

f) in a movement-measurement loop:

move the tuning probe P # 2 to a multitude N>1 of positions X 2 ,

whereby X 0 ≤X 2 ≤X 0 +λ(F)/2,

measure s-parameters Sij(X 2 ), whereby {i,j}={1,2},

save (X 2 ,Sij(X 2 )) in a data file S 2 ;

g) retrieve data (X 1 ,Sij(X 1 )) from the data file S 1 and (X 2 ,Sij(X 2 )) from the data file S 2 ;

h) in a scanning loop through the data (X 1 ,Sij(X 1 )) for the multitude M of positions X 1 :

for each position X 1 execute a nested scanning loop through the data (X 2 ,Sij(X 2 )) for the multitude N of positions X 2 , and:

if (X 1 ≤X 2 ) then

h1) cascade (convert s-parameters to transfer parameters, multiply and convert back to s-parameters) the invers zero matrix [S 0 ] −1 with the s-parameters Sij(X 2 ) of the data file S 2 and replace in the data file S 2 ;

else if (X 1 >X 2 ) then

h2) cascade the invers s-parameter zero matrix [S 0 ] −1 with the s-parameters Sij(X 1 ) of the data file S 1 and replace in the data file S 1 ;

i) retrieve the s-parameters Sij(X 1 ) from the data file S 1 and Sij(X 2 ) from the data file S 2 , and:

if (X 1 ≤X 2 ) then

cascade the s-parameters of the file S 1 with the s-parameters of the data file S 2 to create Sij(X 1 ,X 2 ),

else if (X 1 >X 2 ) then

cascade the s-parameters of the data file S 2 with the s-parameters of the data file S 1 to create Sij(X 1 ,X 2 ), and

j) save calibration data points in a format (X 1 , X 2 , Sij(X 1 ,X 2 )) in a data file TUNER-CAL(F) for later use.

6. An interpolation method between calibrated data points for the automated load pull tuner as in claim 5 at a frequency F, comprising:

a) retrieve s-parameters Sij(X 1 ,X 2 ) of the calibrated data points from the tuner calibration data file TUNER-CAL(F);

b) define a target position with tuning probe coordinates (X 1 . t ,X 2 . t );

c) identify, using a numeric search through the s-parameters retrieved in step (a), two pairs of successive calibration data points, one pair of successive X 1 positions (X 1 . 1 and X 1 . 2 ) with X 1 . 1 ≤X 1 . t ≤X 1 . 2 , and one pair of successive X 2 positions, (X 2 . 1 and X 2 . 2 ) with X 2 . 1 ≤X 2 . t ≤X 2 . 2 , which are closest to X 1 . t and X 2 . t correspondingly;

d) execute a first set of linear interpolations of s-parameters Sij including one interpolation of X 1 . t between the X 1 successive positions (X 1 . 1 and X 1 . 2 ) and one interpolation of X 2 . t between the X 2 successive positions (X 2 . 1 and X 2 . 2 ) yielding interpolated s-parameters Sij(A) and Sij(B);

e) execute a second set of linear interpolations of s-parameters Sij(X 1 ,X 2 ) including one interpolation of X 1 . t and X 2 . t between the positions X 1 . 1 and X 2 . 1 and one interpolation of X 1 . t and X 2 . t between the positions (X 1 . 2 and X 2 . 2 ) yielding interpolated s-parameters Sij(C) and Sij(D);

f) calculate Sij parameters at target point (X 1 . t ,X 2 . t ) as an average of a third set of linear interpolations of X 1 . t and X 2 . t between the s-parameters Sij(A) and Sij(B) and linear interpolations of X 1 . t and X 2 . t between the s-parameters Sij(C) and Sij(D).

7. An impedance synthesis (tuning) method for the automated two-probe waveguide load pull tuner of claim 6 comprising:

a) for a frequency F, define a tuning tolerance TOL and a tuner calibration data file and retrieve s-parameters Sij(X 1 ,X 2 ) from the calibration data file;

b) define a tuning target reflection factor Γ=|Γ|*exp(jΦ) and a maximum number of iterations NMAX;

c) search in s-parameter Sij(X 1 ,X 2 ) for a calibration point Sij(X 1 o ,X 2 o ), for which an error function EF=|S 11 (X 1 o ,X 2 o )−Γ| 2 , defined as the square of the absolute vector difference between the reflection factor S 11 (X 1 o ,X 2 o ) and the target Γ, is minimum;

d) if EF≤TOL, define X 1 .final=X 1 o , X 2 .final=X 2 o and move to step (f);

e) set N=1 and search interpolated s-parameter data S 11 (X 1 ,X 2 ) in the area (X 1 ,X 2 ) close to the calibrated point (X 1 o ,X 2 o ) for a final setting (X 1 .final,X 2 .final) as follows:

e1) from starting point (X 1 o ,X 2 o ), in a search loop of position X 1 of the tuning probe P # 1 :

set N=N+1 and change X 1 o by a small amount δX 1 to X 1 o +δX 1 , calculate the Error Function EF=|S 11 (X 1 o +δX 1 ,X 2 o )−Γ| 2 ,

make δX 1 proportional to the change of EF, increase N and iterate until EF reaches a minimum, and then set X 1 o ′=X 1 o +δX 1 ;

e2) from a new point (X 1 o ′,X 2 o ), in a search loop of position X 2 of the tuning probe P # 2 :

set N=N+1 and change X 2 o by a small amount δX 2 to X 2 o +δX 2 , calculate the Error Function EF=|S 11 (X 1 o ′,X 2 o +δX 2 )−Γ| 2 ,

make δX 2 proportional to the change of EF, increase N and iterate until EF reaches a minimum, and then set X 2 o ′=X 2 o +δX 2 ;

e3) set X 1 o =X 1 o ′, X 2 o =X 2 o ′ and repeat steps e1) and e2) until there is no further reduction of EF occurs or if N>NMAX;

e4) define X 1 .final=X 1 o ′, X 2 .final=X 2 o′;

f) move the tuning probe P # 1 to X 1 .final and tuning probe P # 2 to X 2 .final.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 10, 2026
From: FOCUSMW IP INC
To: FOCUS MICROWAVES INC.
Reel/Frame 075742/0030 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2025
From: TSIRONIS, CHRISTOS
To: FOCUSMW IP. INC.
Reel/Frame 073588/0660 →
Cited By (3)
US 12,259,409 US 12,347,916 US 12,379,397